IEEE 325-1996 en Standard Test Procedures for Germanium Gamma-Ray Detectors《锗γ射线探测器的试验规程》.pdf

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1、 Recognized as anAmerican National Standard (ANSI)The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1997 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1997. Printed in the United State

2、s of AmericaISBN 1-55937-885-9No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 325-1996(R2002)(Revision of IEEE Std 325-1986)IEEE Standard Test Procedures for Germanium Gamma-Ray

3、DetectorsSponsorNuclear Instruments and Detectors Committeeof theIEEE Nuclear and Plasma Sciences SocietyReaffirmed 11 September 2002Approved 18 October 2002IEEE Standards BoardApproved 6 January 1997American National Standards InstituteAbstract: Terminology and standard test procedures for germaniu

4、m radiation detectors that areused for the detection and high-resolution spectrometry of gamma rays, X rays, and charged parti-cles that produce hole-electron pairs in the crystal lattice are established so they have the samemeaning to both manufacturers and users. Keywords: gamma rays, germanium ra

5、diation detectors, X raysIEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinat-ing Committees of the IEEE Standards Board. Members of the committees serve voluntarily andwithout compensation. They are not necessarily members of the Institute. The standards devel

6、opedwithin IEEE represent a consensus of the broad expertise on the subject within the Institute as wellas those activities outside of IEEE that have expressed an interest in participating in the develop-ment of the standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Stand

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8、opments inthe state of the art and comments received from users of the standard. Every IEEE Standard is sub-jected to review at least every five years for revision or reaffirmation. When a document is morethan five years old and has not been reaffirmed, it is reasonable to conclude that its contents

9、,although still of some value, do not wholly reflect the present state of the art. Users are cautioned tocheck to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless ofmembership affiliation with I

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11、retations is brought to the attention ofIEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards rep-resent a consensus of all concerned interests, it is important to ensure that any interpretation hasalso received the concurrence of a balance of interests. For

12、 this reason, IEEE and the members of itssocieties and Standards Coordinating Committees are not able to provide an instant response tointerpretation requests except in those cases where the matter has previously received formalconsideration. Comments on standards and requests for interpretations sh

13、ould be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual standard for internal or personal use isgranted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appropriat

14、efee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contactCopyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA;(508) 750-8400. Permission to photocopy portions of any individual standard for educational class-room use can al

15、so be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any pat

16、ent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.iiiIntroduction(This introduction is not

17、part of IEEE Std 325-1996, IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors.)IEEE Std 325-1996 provides standard test procedures for germanium gamma-ray detectors for ionizing radi-ation. It is a revision of IEEE Std 325-1986, updated to bring it into line with current practices and t

18、echnol-ogy. The revision was approved by the Nuclear Instruments and Detectors Committee (NIDC) of the IEEENuclear and Plasma Sciences Society and by the Accredited Standards Committee on Nuclear Instrumenta-tion of the American National Standards Institute. The previous revision of this standard, p

19、ublished as ANSI/IEEE 325-1986, combined and updated ANSI/IEEE Std 325-1971, ANSI/IEEE Std 645-1987, and ANSI/IEEE Std 680-1980.Companion documents are IEEE Std 300-1988 (Reaff 1993), IEEE Standard Test Procedures for Semicon-ductor Charged-Particle Detectors (ANSI); IEEE Std 301-1988 (Reaff 1993),

20、IEEE Standard Test Proce-dures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation (ANSI); and IEEE Std759-1984 (Reaff 1990), IEEE Test Procedures for Semiconductor X-Ray Energy Spectrometers (ANSI).At the time it approved this standard, the NIDC had the following membership:S

21、anford Wagner,ChairLouis Costrell,SecretaryEdward Fairstein and Sanford Wagner served as project leaders for the development of this standard.David J. AllardMartin L. BauerJoseph G. BellianWilliam M. BuggChristopher CoxLarry DarkenW. Kenneth DawsonJohn DetkoEdward FairsteinRonald M. KeyserFrederick

22、A. KirstenGlenn F. KnollHobard W. KranerG. Laurie MillerDennis E. PersykPaul L. PhelpsDonald E. StilwellKenneth L. SwinthJames H. TrainorMichael UnterwegerJohn WalterivThe Accredited Standards Committee on Radiation Instrumentation, N42, which reviewed and approved thisdocument, had the following me

23、mbership at the time of approval:Louis Costrell, ChairLuigi Napoli,SecretaryOrganization Represented Name of RepresentativeAmerican Conference of Governmental Industrial Hygienists.Jesse LiebermanHealth Physics Society George CampbellJoseph Stencel (Alt.)Institute of Electrical and Electronics Engin

24、eersLouis CostrellJulian Forster (Alt.)Anthony J. Spurgin (Alt.)Lawrence Berkeley Laboratory. Edward J. LampoLawrence Livermore National Laboratory. Paul L. PhelpsMassachusetts Institute of Technology, Bates Linear Accelerator Center . Frank X. MasseOak Ridge National LaboratoryCharles L. BrittonPac

25、ific Northwest Laboratories. Kenneth L. SwinthU.S. Department of the Army . Edward GroeberU.S. Department of Commerce, National Institute of Standards and Technology .Louis CostrellMichael Unterweger (Alt.)U.S. Department of Energy, OHER/PCSRD . Gerald GoldsteinU.S. Federal Emergency Management Agen

26、cy . Carl R. SiebentrittIndividual Members Joseph G. BellianErnesto A. CorteMorgan CoxJohn M. GallagherJack M. SelbyAl N. TschaecheEdward J. VallarioLee J. WagnerSanford WagnerWhen the IEEE Standards Board approved this standard on 18 October 1996, it had the followingmembership:Donald C. Loughry,Ch

27、airRichard J. Holleman,Vice ChairAndrew G. Salem,Secretary*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. AggarwalAlan H. CooksonChester C. TaylorKristin M. DittmannIEEE Standards Project EditorGilles A. BarilClyde R. CampJoseph A. CannatelliStephen

28、L. DiamondHarold E. EpsteinDonald C. FleckensteinJay Forster*Donald N. HeirmanBen C. JohnsonE. G. “Al” KienerJoseph L. Koepfinger*Stephen R. LambertLawrence V. McCallL. Bruce McClungMarco W. MigliaroMary Lou PadgettJohn W. PopeJose R. RamosArthur K. ReillyRonald H. ReimerGary S. RobinsonIngo RschJoh

29、n S. RyanChee Kiow TanLeonard L. TrippHoward L. WolfmanvContentsCLAUSE PAGE1. Overview 11.1 Scope. 11.2 Purpose 12. References 13. Definitions, symbols, and abbreviations and acronyms. 23.1 Definitions. 23.2 Symbols. 83.3 Abbreviations and acronyms. 94. General. 104.1 The interaction of gamma rays w

30、ith matter 104.2 Germanium gamma-ray detector element. 134.3 Detector operating and storage temperatures 144.4 Operating bias and variations in charge collection time . 144.5 Detector element classification . 154.6 Figure of merit 194.7 Preamplifiers . 195. Detector tests 215.1 General test requirem

31、ents 215.2 Test setup for resolution and efficiency measurements 215.3 Temperature sensitivity. 215.4 Amplifier pulse shaping 235.5 Electromagnetic interference 246. Energy resolution measurements . 276.1 Introduction. 276.2 Resolution specifications and other requirements. 276.3 Errors in determini

32、ng resolution . 317. Test procedures and computations. 327.1 Recording a spectrum 327.2 Sample spectrum, 1332.5 photopeak of 60Co . 337.3 Noise resolution near 1.2 MeV . 347.4 Computations 358. Energy rate limit 409. Peak-to-Compton ratio. 40viCLAUSE PAGE10. Counting efficiency 4210.1 Absolute count

33、ing efficiency for a full-energy peak. 4210.2 Background correction 4210.3 Relative full-energy peak counting efficiency 4410.4 Well-Type coaxial detector efficiency 4410.5 Summing of coincident gamma rays. 4410.6 Detector gamma-ray efficiency with a Marinelli reentrant beaker . 4410.7 Marinelli bea

34、ker standard source (MBSS) 4610.8 Measurement, absolute efficiency, full-energy peak 4710.9 MBSS documentation . 5111. Window thickness index 5212. Timing 5212.1 Setup for timing measurements. 5212.2 Timing measurements . 5313. Temperature-Cyclable detectors 5414. Annealable detectors 5415. Low-Back

35、ground detectors 5516. Bibliography 56ANNEXAnnex A (informative) Representative Marinelli beakers. 581IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors1. Overview1.1 ScopeThis standard applies to germanium radiation detectors that are used for the detection and high-resolutionspectrome

36、try of gamma rays, X rays, and charged particles that produce hole-electron pairs in the crystal lat-tice. Included are detector endcap and reentrant (Marinelli) beaker standards.Measurements that depend upon phonon production are outside the scope of this standard.1.2 PurposeThe purpose of this sta

37、ndard is to establish terminology and standard test procedures so they have the samemeaning to both manufacturers and users.Not all tests described in this standard are mandatory, but tests that are used to specify performance shall beperformed in accordance with the procedures described herein.2. R

38、eferencesThis standard shall be used in conjunction with the following publications:IEEE Std 194-1977, IEEE Standard Pulse Terms and Definitions.1IEEE Std 300-1988 (Reaff 1993), IEEE Standard Test Procedures for Semiconductor Charged-ParticleDetectors (ANSI).IEEE Std 301-1988 (Reaff 1993), IEEE Stan

39、dard Test Procedures for Amplifiers and Preamplifiers Usedwith Detectors of Ionizing Radiation (ANSI).IEEE Std 759-1984 (Reaff 1990), IEEE Test Procedures for Semiconductor X-ray Energy Spectrometers(ANSI).1IEEE Std 194-1977 has been withdrawn; however, copies can be obtained from Global Engineering

40、, 15 Inverness Way East, Engle-wood, CO 80112-5704, USA, tel. (303) 792-2181. Other IEEE publications are available from the Institute of Electrical and ElectronicsEngineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA.IEEEStd 325-1996 IEEE STANDARD TEST PROCEDURES FOR2IEEE Std 1160

41、-1993, IEEE Standard Test Procedures for High-Purity Germanium Crystals for RadiationDetectors (ANSI).DOE Report DOE/ER-0457T, Standard NIM Instrumentation System (May 1990).23. Definitions, symbols, and abbreviations and acronyms3.1 DefinitionsOf the following definitions, several are “distributed”

42、; that is, terms are used that are themselves defined inother definitions in this clause.3.1.1 active region: A region of a detector in which charge created by ionizing radiation contributes signifi-cantly to the output signal.3.1.2 amplifier noise: See:noise referred to the input.3.1.3 amplifier sh

43、aping time: A nonspecific indication of the shaped-pulse width issuing from a linear pulseamplifier.See: shaping index.3.1.4 amplifier time constant: A misnomer for the width of the shaped pulse issuing from a linear pulseamplifier. See:shaping index.3.1.5 avalanche breakdown: A breakdown caused by

44、the cumulative multiplication of charge carriersthrough electric-field-induced impact ionization.3.1.6 background (ambient): The spectrum of X or gamma rays originating from materials other than theradionuclide being measured.3.1.7 background (under a peak): The background from all sources under a p

45、eak being measured, includ-ing Compton and degraded-energy counts from higher energy and ambient background events.3.1.8 ballistic deficit: The loss in signal amplitude that occurs when the charge collection time in a detectoris a significant fraction of the amplifiers differentiating time constant.

46、3.1.9 band gap: The energy difference between the bottom of the conduction band and the top of thevalence band.3.1.10 baseline (of an electrical pulse): The average of the levels from which a pulse departs and to whichit returns in the absence of an overlapping pulse (IEEE Std 194-19773).3.1.11 base

47、line restorer (BLR): A circuit that rapidly restores the baseline following an amplifiers outputpulse (or train of pulses) to the level that existed before the pulse.3.1.12 bias, detector:The voltage applied to a detector to produce the electric field that sweeps out the signalcharge.3.1.13 bias res

48、istor:The resistor through which the bias voltage is applied to a detector.2Available from Louis Costrell, NIM Committee Chairman, National Institute of Standards and Technology, Radiation Physics Divi-sion, or from the National Technical Information Service, U.S. Dept. of Commerce, Springfield, VA

49、22161.3Information on references can be found in Clause 2.IEEEGERMANIUM GAMMA-RAY DETECTORS Std 325-199633.1.14 bipolar pulse:A signal pulse having two lobes, one above and the other below the baseline (IEEEStd 194-1977). When produced by a linear filter network, the two lobes have the same area but not necessar-ily the same peak amplitude.3.1.15 breakdown:A phenomenon occurring in a reverse-biased semiconductor diode that appears as anincrease in noise, reverse current, or both when the bias is increased beyond a certain value. 3.1.16 breakdown voltage:The voltage measured at a specified