IEC TS 62492-2-2013 Industrial process control devices - Radiation thermometers - Part 2 Determination of the technical data for radiation thermometers《工业过程控制装置.辐射温度计.第2部分 辐射温度计技术数据的测定》.pdf

《IEC TS 62492-2-2013 Industrial process control devices - Radiation thermometers - Part 2 Determination of the technical data for radiation thermometers《工业过程控制装置.辐射温度计.第2部分 辐射温度计技术数据的测定》.pdf》由会员分享，可在线阅读，更多相关《IEC TS 62492-2-2013 Industrial process control devices - Radiation thermometers - Part 2 Determination of the technical data for radiation thermometers《工业过程控制装置.辐射温度计.第2部分 辐射温度计技术数据的测定》.pdf（34页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC/TS 62492-2 Edition 1.0 2013-04 TECHNICAL SPECIFICATION Industrial process control devices Radiation thermometers Part 2: Determination of the technical data for radiation thermometers IEC/TS 62492-2:2013(E) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Switze

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9、PECIFICATION Industrial process control devices Radiation thermometers Part 2: Determination of the technical data for radiation thermometers INTERNATIONAL ELECTROTECHNICAL COMMISSION U ICS 17.200.20; 25.040.40 PRICE CODE ISBN 978-2-83220-737-6 Registered trademark of the International Electrotechni

10、cal Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 TS 62492-2 IEC:2013(E) CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 Terms, definitions and abbreviations 6 3.1 Terms and definitions 6 3.2 Abbreviations 9 4 Measurem

11、ent conditions . 9 5 Determination of technical data 9 5.1 Measuring temperature range 9 5.1.1 General . 9 5.1.2 Test method 10 5.2 Measurement uncertainty 10 5.2.1 General . 10 5.2.2 Test method 10 5.3 Noise equivalent temperature difference (NETD) . 11 5.3.1 General . 11 5.3.2 Test method 11 5.4 M

12、easuring distance . 12 5.5 Field-of-view (target size) 12 5.5.1 General . 12 5.5.2 Test method 13 5.6 Distance ratio 14 5.7 Size-of-source effect (SSE) . 14 5.7.1 General . 14 5.7.2 Test method 14 5.8 Emissivity setting 15 5.9 Spectral range . 15 5.10 Influence of the internal instrument or ambient

13、temperature (temperature parameter) 15 5.10.1 General . 15 5.10.2 Test method 16 5.11 Influence of air humidity (humidity parameter) . 17 5.12 Long-term stability . 17 5.12.1 General . 17 5.12.2 Test method 17 5.13 Short-term stability 18 5.13.1 General . 18 5.13.2 Test method 18 5.14 Repeatability

14、. 18 5.14.1 General . 18 5.14.2 Test method 19 5.15 Interchangeability 19 5.15.1 General . 19 5.15.2 Test method 19 5.16 Response time 20 5.16.1 General . 20 5.16.2 Test method 21 TS 62492-2 IEC:2013(E) 3 5.17 Exposure time . 22 5.17.1 General . 22 5.17.2 Test method 23 5.18 Warm-up time 24 5.18.1 G

15、eneral . 24 5.18.2 Test method 24 5.19 Operating temperature and air humidity range . 25 5.19.1 General . 25 5.19.2 Test method 25 5.20 Storage and transport temperature and air humidity range 26 5.20.1 General . 26 5.20.2 Test method 26 6 Safety requirement . 27 Annex A (informative) Change in indi

16、cated temperature of a radiation thermometer corresponding to a change in the radiation exchange 28 Bibliography 29 Figure 1 Relative signal to a signal at a defined aperture size (source size) of 100 mm in diameter for two infrared radiation thermometers A and B versus the source diameter . 12 Figu

17、re 2 Demonstration of the response time to a rising temperature step . 20 Figure 3 Possible arrangement for determining the response time with two reference sources . 22 Figure 4 Demonstration of the exposure time . 22 Figure 5 Example of warm-up time . 25 Table A.1 The change in indicated temperatu

18、re corresponding to a 1 % change in the radiation exchange with a radiation thermometer at 23 C (Example) 28 4 TS 62492-2 IEC:2013(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INDUSTRIAL PROCESS CONTROL DEVICES RADIATION THERMOMETERS Part 2: Determination of the technical data for radiation thermo

19、meters FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization

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28、e publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the

29、possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare International Standards. In exceptional circumstances, a technic

30、al committee may propose the publication of a technical specification when the required support cannot be obtained for the publication of an International Standard, despite repeated efforts, or the subject is still under technical development or where, for any other reason, there is the future but n

31、o immediate possibility of an agreement on an International Standard. Technical specifications are subject to review within three years of publication to decide whether they can be transformed into International Standards. IEC 62492-2, which is a technical specification, has been prepared by subcomm

32、ittee 65B: Measurement and control devices, of IEC technical committee 65: Industrial-process measurement, control and automation. TS 62492-2 IEC:2013(E) 5 The text of this technical specification is based on the following documents: Enquiry draft Report on voting 65B/844/DTS 65B/859/RVC Full inform

33、ation on the voting for the approval of this technical specification can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 62492 series, published under the general title

34、Industrial process control devices Radiation thermometers, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific p

35、ublication. At this date, the publication will be transformed into an International Standard, reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this publicati

36、on indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 TS 62492-2 IEC:2013(E) INDUSTRIAL PROCESS CONTROL DEVICES RADIATION THERMOMETERS Part 2: Determination of the te

37、chnical data for radiation thermometers 1 Scope This part of IEC 62492, which is a Technical Specification, applies to radiation thermometry and addresses all technical data specified in IEC/TS 62492-1. It defines standard test methods which can be used by the end user of radiation thermometers to d

38、etermine or confirm the fundamental metrological data of radiation thermometers with one wavelength range and one measurement field. The purpose of this specification is to facilitate comparability and testability. Therefore, unambiguous test methods are stipulated for determining technical data, un

39、der standardised measuring conditions that can be performed by a sufficiently skilled end user to serve as standard performance criteria for instrument evaluation or selection. It is not compulsory for manufacturers and sellers of radiation thermometers to include all technical data given in this do

40、cument in the data sheets for a specific type of radiation thermometer. Only the relevant data should be stated and should comply with this specification and IEC/TS 62492-1. NOTE Infrared ear thermometers are excluded from this Technical Specification. 2 Normative references The following documents,

41、 in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC/TS 62492-1:2008, Industrial

42、 process control devices Radiation thermometers Part 1: Technical data for radiation thermometers 3 Terms, definitions and abbreviations 3.1 Terms and definitions For the purposes of this document the following terms and definitions apply. NOTE The terms and definitions listed below comply with IEC/

43、TS 62492-1. 3.1.1 measuring temperature range temperature range for which the radiation thermometer is designed 3.1.2 measurement uncertainty parameter, associated with the result of a measurement, that characterises the dispersion of the values that could reasonably be attributed to the measurand T

44、S 62492-2 IEC:2013(E) 7 3.1.3 noise equivalent temperature difference parameter which indicates the contribution of the measurement uncertainty in C, which is due to instrument noise 3.1.4 measuring distance distance or distance range between the radiation thermometer and the target (measured object

45、) for which the radiation thermometer is designed 3.1.5 field-of-view a usually circular, flat surface of a measured object from which the radiation thermometer receives radiation 3.1.6 distance ratio the ratio of the measuring distance to the diameter of the field-of-view, when the target is in foc

46、us 3.1.7 size-of-source effect the difference in the radiance or temperature reading of the radiation thermometer when changing the size of the radiating area of the observed source 3.1.8 emissivity setting ratio between the radiation emitted from this surface and the radiation from a blackbody at t

47、he same temperature Note 1 to entry: In most measuring situations a radiation thermometer is used on a surface with an emissivity significantly lower than 1. For this purpose most thermometers have the possibility of adjusting the emissivity setting. The temperature reading is then automatically cor

48、rected. 3.1.9 spectral range parameter which gives the lower and upper limits of the wavelength range over which the radiation thermometer collects radiation from a source 3.1.10 influence of the internal instrument temperature influence of the ambient temperature temperature parameter parameter whi

49、ch gives the additional uncertainty of the measured temperature value depending on the deviation of the temperature of the radiation thermometer from the value for which the technical data is valid after warm-up time and under stable ambient conditions 3.1.11 influence of air humidity humidity parameter parameter which gives the additional uncertainty of the measured temperature value depending on the relative air humidity at a defined ambient temperature 3.1.12 long-term stabili