IEC 62567-2013 Overhead lines - Methods for testing self-damping characteristics of conductors《架空线路 导体自阻尼特性的试验方法》.pdf
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1、 IEC 62567 Edition 1.0 2013-09 INTERNATIONAL STANDARD NORME INTERNATIONALE Overhead lines Methods for testing self-damping characteristics of conductors Lignes lectriques ariennes Mthodes dessai des caractristiques dauto-amortissement des conducteurs IEC62567:2013 colourinsideTHIS PUBLICATION IS COP
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16、ead lines Methods for testing self-damping characteristics of conductors Lignes lectriques ariennes Mthodes dessai des caractristiques dauto-amortissement des conducteurs INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE W ICS 29.060; 29.240.20 PRICE CODE CODE PRIX
17、 ISBN 978-2-8322-1056-7 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cett
18、e publication via un distributeur agr. colourinside 2 62567 IEC:2013 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope . 7 2 Normative references . 7 3 Terms and definitions . 7 4 Symbols and units 8 5 Test span arrangements . 8 5.1 General . 8 5.2 Span terminations . 9 5.3 Shaker and vibration control
19、 system 10 5.4 Location of the shaker . 12 5.5 Connection between the shaker and the conductor under test . 12 5.5.1 General . 12 5.5.2 Rigid connection 13 5.5.3 Flexible connection 14 5.6 Transducers and measuring devices . 14 5.6.1 Type of transducers . 14 5.6.2 Transducer accuracy . 15 6 Conducto
20、r conditioning . 16 6.1 General . 16 6.2 Clamping . 16 6.3 Creep 16 6.4 Running-in . 16 7 Extraneous loss sources . 16 8 Test procedures . 17 8.1 Determination of span resonance 17 8.2 Power Method . 18 8.3 ISWR Method 20 8.4 Decay method . 22 8.5 Comparison between the test methods 24 8.6 Data pres
21、entation 25 Annex A (normative) Recommended test parameters . 27 Annex B (informative) Reporting recommendations 28 Annex C (informative) Correction for aerodynamic damping . 31 Annex D (informative) Correction of phase shift between transducers 33 Bibliography 34 Figure 1 Test span for conductor se
22、lf-damping measurements . 9 Figure 2 Rigid clamp 10 Figure 3 Electro-dynamic shaker 11 Figure 4 Layout of a test stand for conductor self-damping measurements . 12 Figure 5 Example of rigid connection . 13 Figure 6 Example of flexible connection . 14 Figure 7 Miniature accelerometer . 15 62567 IEC:2
23、013 3 Figure 8 Resonant condition detected by the acceleration and force signals . 18 Figure 9 Fuse wire system disconnecting a shaker from a test span; this double exposure shows the mechanism both closed and open. 23 Figure 10 A decay trace . 24 Figure B.1 Example of conductor power dissipation ch
24、aracteristics 29 Figure B.2 Example of conductor power dissipation characteristics 30 Table 1 Comparison of laboratory methods 25 Table 2 Comparison of Conductor Self-damping Empirical Parameters 26 Table C.1 Coefficients to be used with equation C-3 32 4 62567 IEC:2013 INTERNATIONAL ELECTROTECHNICA
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