IEC 61280-2-8-2003 Fibre optic communication subsystem test procedures - Digital systems - Part 2-8 Determination of low BER using Q-factor measurements《光纤通信子系统基本试验过程.数字系统.第2-8部分 用品质因数测量法测定低位错率》.pdf
《IEC 61280-2-8-2003 Fibre optic communication subsystem test procedures - Digital systems - Part 2-8 Determination of low BER using Q-factor measurements《光纤通信子系统基本试验过程.数字系统.第2-8部分 用品质因数测量法测定低位错率》.pdf》由会员分享,可在线阅读,更多相关《IEC 61280-2-8-2003 Fibre optic communication subsystem test procedures - Digital systems - Part 2-8 Determination of low BER using Q-factor measurements《光纤通信子系统基本试验过程.数字系统.第2-8部分 用品质因数测量法测定低位错率》.pdf(66页珍藏版)》请在麦多课文档分享上搜索。
1、 IEC 61280-2-8 Edition 1.0 2003-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic communication subsystem test procedures Digital systems Part 2-8: Determination of low BER using Q-factor measurements Procdures dessai des sous-systmes de tlcommunication fibres optiques Systmes numriques Par
2、tie 2-8: Dtermination de faible Taux dErreur Binaire (TEB) en utilisant des mesures du facteur Q IEC 61280-2-8:2003 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2003 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reprod
3、uced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtain
4、ing additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce so
5、it et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication,
6、 utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC)
7、is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition
8、, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and
9、 withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of
10、 electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us you
11、r feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llect
12、ricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publicati
13、ons CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/jus
14、tpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. I
15、l contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur c
16、ette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61280-2-8 Edition 1.0 2003-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic communication subsystem test procedures Digital systems Part 2-8: Determination of low BER using Q-factor measurements Procdures dessai
17、des sous-systmes de tlcommunication fibres optiques Systmes numriques Partie 2-8: Dtermination de faible Taux dErreur Binaire (TEB) en utilisant des mesures du facteur Q INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE U ICS 33.180.10 PRICE CODE CODE PRIX ISBN 978
18、-2-83220-354-5 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publica
19、tion via un distributeur agr. colour inside 2 61280-2-8 IEC:2003 CONTENTS FOREWORD . 4 1 Scope . 6 2 Definitions and abbreviated terms . 6 2.1 Definitions . 6 2.2 Abbreviations . 6 3 Measurement of low bit-error ratios . 7 3.1 General considerations 7 3.2 Background to Q-factor 8 4 Variable decision
20、 threshold method . 10 4.1 Overview . 10 4.2 Apparatus 13 4.3 Sampling and specimens . 13 4.4 Procedure 13 4.5 Calculations and interpretation of results 14 4.6 Test documentation . 18 4.7 Specification information 18 5 Variable optical threshold method . 18 5.1 Overview . 18 5.2 Apparatus 19 5.3 It
21、ems under test. 19 5.4 Procedure for basic optical link 19 5.5 Procedure for self-contained system 20 5.6 Evaluation of results 21 Annex A (normative) Calculation of error bound in the value of Q 23 Annex B (informative) Sinusoidal interference method 25 Bibliography 31 Figure 1 A sample eye diagram
22、 showing patterning effects . 9 Figure 2 A more accurate measurement technique using a DSO that samples the noise statistics between the eye centres 9 Figure 3 Bit error ratio as a function of decision threshold level . 11 Figure 4 Plot of Q-factor as a function of threshold voltage . 11 Figure 5 Se
23、t-up for the variable decision threshold method . 13 Figure 6 Set-up of initial threshold level (approximately at the centre of the eye) . 13 Figure 7 Effect of optical bias . 18 Figure 8 Set-up for optical link or device test 20 Figure 9 Set-up for system test . 20 Figure 10 Extrapolation of log BE
24、R as function of bias 22 Figure B.1 Set-up for the sinusoidal interference method by optical injection . 26 Figure B.2 Set-up for the sinusoidal interference method by electrical injection . 28 Figure B.3 BER Result from the sinusoidal interference method (data points and extrapolated line) . 29 Fig
- 1.请仔细阅读文档,确保文档完整性,对于不预览、不比对内容而直接下载带来的问题本站不予受理。
- 2.下载的文档,不会出现我们的网址水印。
- 3、该文档所得收入(下载+内容+预览)归上传者、原创作者;如果您是本文档原作者,请点此认领!既往收益都归您。
下载文档到电脑,查找使用更方便
10000 积分 0人已下载
下载 | 加入VIP,交流精品资源 |
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- IEC61280282003FIBREOPTICCOMMUNICATIONSUBSYSTEMTESTPROCEDURESDIGITALSYSTEMSPART28DETERMINATIONOFLOWBERUSINGQFACTORMEASUREMENTS

链接地址:http://www.mydoc123.com/p-1236267.html