IEC 61000-4-21-2011 Electromagnetic compatibility (EMC) - Part 4-21 Testing and measurement techniques - Reverberation chamber test methods《电磁兼容性(EMC).第4-21部分 试验和测量技术.混响室试验方法》.pdf

《IEC 61000-4-21-2011 Electromagnetic compatibility (EMC) - Part 4-21 Testing and measurement techniques - Reverberation chamber test methods《电磁兼容性(EMC).第4-21部分 试验和测量技术.混响室试验方法》.pdf》由会员分享，可在线阅读，更多相关《IEC 61000-4-21-2011 Electromagnetic compatibility (EMC) - Part 4-21 Testing and measurement techniques - Reverberation chamber test methods《电磁兼容性(EMC).第4-21部分 试验和测量技术.混响室试验方法》.pdf（228页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 61000-4-21 Edition 2.0 2011-01 INTERNATIONAL STANDARD NORME INTERNATIONALE BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM IEC 61000-4-21:2011 Electromagnetic compatibility (EMC) Part 4-21: Testing and measurement techniques Reverberation chamber test methods Compatibilit lectromagntique

2、(CEM) Partie 4-21: Techniques dessai et de mesure Mthodes dessai en chambre rverbrante colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

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16、 des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61000-4-21 Edition 2.0 2011-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC)

17、Part 4-21: Testing and measurement techniques Reverberation chamber test methods Compatibilit lectromagntique (CEM) Partie 4-21: Techniques dessai et de mesure Mthodes dessai en chambre rverbrante INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XE ICS 33.100.10;

18、33.100.20 PRICE CODE CODE PRIX ISBN 978-2-88912-324-7 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale colour inside 2 61000-4-21 IEC:2011 CONTENTS FOREWORD . 4 IN

19、TRODUCTION . 7 1 Scope . 8 2 Normative references . 8 3 Terms, definitions and abbreviations 9 3.1 Terms and definitions 9 3.2 Abbreviations 12 4 General 13 5 Test environments and limitations 13 6 Applications 14 6.1 Radiated immunity . 14 6.2 Radiated emissions . 14 6.3 Shielding (screening) effec

20、tiveness . 14 7 Test equipment . 14 8 Chamber validation. 15 9 Testing . 16 10 Test results, test report and test conditions 16 Annex A (informative) Reverberation chamber overview 17 Annex B (normative) Chamber validation for mode-tuned operation . 41 Annex C (normative) Chamber validation and test

21、ing for mode-stirred operation 50 Annex D (normative) Radiated immunity tests 56 Annex E (normative) Radiated emissions measurements . 61 Annex F (informative) Shielding effectiveness measurements of cable assemblies, cables, connectors, waveguides and passive microwave components . 68 Annex G (info

22、rmative) Shielding effectiveness measurements of gaskets and materials . 72 Annex H (informative) Shielding effectiveness measurements of enclosures 82 Annex I (informative) Antenna efficiency measurements 89 Annex J (informative) Direct evaluation of reverberation performance using field anisotropy

23、 and field inhomogeneity coefficients 91 Annex K (informative) Measurement uncertainty for chamber validation Emission and immunity testing . 100 Bibliography 107 Figure A.1 Typical field uniformity for 200 independent tuner steps 32 Figure A.2 Theoretical modal structure for a 10,8 m 5,2 m 3,9 m ch

24、amber . 32 Figure A.3 Theoretical modal structure with small Q-bandwidth (high Q) superimposed on 60 thmode 33 Figure A.4 Theoretical modal structure with greater Q-bandwidth (lower Q) superimposed on 60 thmode 33 Figure A.5 Typical reverberation chamber facility . 34 Figure A.6 Theoretical sampling

25、 requirements for 95 % confidence 34 Figure A.7 Normalized PDF of an electric field component at a fixed location for a measurement with a single sample . 35 61000-4-21 IEC:2011 3 Figure A.8 Normalised PDF of the mean of an electric field component at one fixed location for a measurement with N inde

26、pendent samples 35 Figure A.9 Normalised PDF of the maximum of an electric field component at a fixed location for a measurement with N independent samples 36 Figure A.10 Chamber working volume 37 Figure A.11 Typical probe data 37 Figure A.12 Mean-normalized data for x-component of 8 probes 38 Figur

27、e A.13 Standard deviation of data for E-field components of 8 probes 38 Figure A.14 Distribution of absorbers for loading effects test . 39 Figure A.15 Magnitude of loading from loading effects test 39 Figure A.16 Standard deviation data of electric field components for eight probes in the loaded ch

28、amber 40 Figure B.1 Probe locations for chamber validation . 49 Figure C.1 Received power (dBm) as a function of tuner rotation (s) at 500 MHz . 55 Figure C.2 Received power (dBm) as a function of tuner rotation (s) at 1 000 MHz 55 Figure D.1 Example of suitable test facility. 60 Figure E.1 Example

29、of suitable test facility . 66 Figure E.2 Relating to the calculation of the geometry factor for radiated emissions 67 Figure F.1 Typical test set-up 71 Figure G.1 Typical test set-up 80 Figure G.2 Typical test fixture installation for gasket and/or material testing 80 Figure G.3 Test fixture config

30、ured for validation . 81 Figure H.1 Typical test enclosure installation for floor mounted enclosure testing 88 Figure H.2 Typical test enclosure installation for bench mounted enclosure testing 88 Figure J.1 Theoretical and typical measured distributions for field anisotropy coefficients in a well-s

31、tirred chamber 97 Figure J.2 Theoretical and typical measured distributions for field anisotropy coefficients in a poorly stirred chamber . 98 Figure J.3 Typical measured values for field anisotropy coefficients as a function of N in a well-stirred chamber . 99 Figure K.1 Average emitted power as a

32、function of frequency for a typical unintentional radiator 105 Figure K.2 Estimated standard uncertainty . 105 Figure K.3 Mean normalized width (in dB) of a %-confidence interval 106 Figure K.4 Individual mean-normalized interval boundaries (in linear units) for maximum field strength as a function

33、of the number of independent stirrer positions N . 106 Table B.1 Sampling requirements 48 Table B.2 Field uniformity tolerance requirements 48 Table J.1 Typical values for total field anisotropy coefficients for medium and good reverberation quality . 96 4 61000-4-21 IEC:2011 INTERNATIONAL ELECTROTE

34、CHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-21: Testing and measurement techniques Reverberation chamber test methods FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committee

35、s (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Rep

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39、re accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote int

40、ernational uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

41、 the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All us

42、ers should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or ot

43、her damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication.

44、 Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such pate

45、nt rights. International Standard IEC 61000-4-21 has been prepared by subcommittee 77B: High frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility, in co- operation with CISPR subcommittee A: Radio-interference measurements and statistical methods. It forms Part 4-21 of I

46、EC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the

47、first edition. In Clause 8, the use and specifications of E-field probes for application to reverberation chambers has been added. Additional Notes refer to general aspects and procedures of 61000-4-21 IEC:2011 5 probe calibrations. The specified range for linearity of the probe response is larger a

48、nd covers an asymmetric interval compared to that for use in anechoic chambers (see Annex I of IEC 61000-4-3), because the fluctuations of power and fields in reverberation chambers exhibit a larger dynamic range, and the chamber validation procedure is based on using maximum field values, as oppose

49、d to the field itself or its average value, respectively. In Annex A, additional guidance and clarifications on the use of reverberation chambers at relatively low frequencies of operation (i.e., close to the lowest usable frequency of a given chamber) are given, and its implications on the estimation of field uncertainty are outlined. Guide