IEC 60904-7-2008 Photovoltaic devices - Part 7 Computation of the spectral mismatch correction for measurements of photovoltaic devices《光电器件.第7部分 光电器件的测量用光谱错配修正的计算》.pdf

《IEC 60904-7-2008 Photovoltaic devices - Part 7 Computation of the spectral mismatch correction for measurements of photovoltaic devices《光电器件.第7部分 光电器件的测量用光谱错配修正的计算》.pdf》由会员分享，可在线阅读，更多相关《IEC 60904-7-2008 Photovoltaic devices - Part 7 Computation of the spectral mismatch correction for measurements of photovoltaic devices《光电器件.第7部分 光电器件的测量用光谱错配修正的计算》.pdf（24页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 60904-7Edition 3.0 2008-11INTERNATIONAL STANDARD NORME INTERNATIONALEPhotovoltaic devices Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devices Dispositifs photovoltaques Partie 7: Calcul de la correction de dsadaptation des rponses spectrales dans les

2、 mesures de dispositifs photovoltaques IEC60904-7:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, inc

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16、s avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.chTl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60904-7Edition 3.0 2008-11INTERNATIONAL STANDARD NORME INTERNATIONALEPhotovoltaic devices Part 7: Computation of the spectral mismatch correction for measurement

17、s of photovoltaic devices Dispositifs photovoltaques Partie 7: Calcul de la correction de dsadaptation des rponses spectrales dans les mesures de dispositifs photovoltaques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE KICS 27.160 PRICE CODECODE PRIXISBN 2-8318

18、-1017-5 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60904-7 IEC:2008 CONTENTS FOREWORD.3 1 Scope and object5 2 Normative references .5 3 Description of method.6 4 Apparatus.7 5 Determination of spectral respons

19、e 7 6 Determination of test spectrum .7 7 Determination of the spectral mismatch factor 8 8 Report 9 Bibliography10 60904-7 IEC:2008 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PHOTOVOLTAIC DEVICES Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devices FOR

20、EWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the el

21、ectrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to t

22、echnical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Or

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26、nal and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be

27、 in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committe

28、es for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to th

29、e Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held

30、 responsible for identifying any or all such patent rights. International Standard IEC 60904-7 has been prepared by IEC technical committee 82: Solar photovoltaic energy systems. The text of this standard is based on the following documents: FDIS Report on voting 82/540/FDIS 82/547/RVD Full informat

31、ion on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This third edition cancels and replaces the second edition published in 1998. It constitutes a technical revision. The main changes with respect to the previous edition are listed b

32、elow: the title has been modified in order to better reflect the purpose of the standard (changed from “mismatch error” to “mismatch correction”); 4 60904-7 IEC:2008 formulae are now accompanied by explanatory text; Clause 3 “Description of method” now describes when it is necessary to use the metho

33、d and when it may not be needed. It describes what data must be collected before the mismatch correction can be calculated; Clauses 4, 5 and 6 have added; the formula for the mismatch correction has been corrected. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

34、A list of all parts of IEC 60904 series, published under the general title Photovoltaic devices, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstor

35、e.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 60904-7 IEC:2008 5 PHOTOVOLTAIC DEVICES Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devices

36、 1 Scope and object This part of IEC 60904 describes the procedure for correcting the bias error introduced in the testing of a photovoltaic device, caused by the mismatch between the test spectrum and the reference spectrum and by the mismatch between the spectral responses (SR) of the reference ce

37、ll and of the test specimen. The procedure applies only to photovoltaic devices linear in SR as defined in IEC 60904-10. This procedure is valid for single junction devices but the principle may be extended to cover multijunction devices. The purpose of this standard is to give guidelines for the co

38、rrection of measurement bias, should there be a mismatch between both the test spectrum and the reference spectrum and between the reference device SR and the test specimen SR. Since a PV device has a wavelength-dependent response, its performance is significantly affected by the spectral distributi

39、on of the incident radiation, which in natural sunlight varies with several factors such as location, weather, time of year, time of day, orientation of the receiving surface, etc., and with a simulator varies with its type and conditions. If the irradiance is measured with a thermopile-type radiome

40、ter (that is not spectrally selective) or with a reference solar cell, the spectral irradiance distribution of the incoming light must be known to make the necessary corrections to obtain the performance of the PV device under the reference solar spectral distribution defined in IEC 60904-3. If a re

41、ference PV device or a thermopile type detector is used to measure the irradiance then, following the procedure given in this standard, it is possible to calculate the spectral mismatch correction necessary to obtain the short-circuit current of the test PV device under the reference solar spectral

42、irradiance distribution included in Table 1 of IEC 60904-3 or any other reference spectrum. If the reference PV device has the same relative spectral response as the test PV device then the reference device automatically takes into account deviations of the real light spectral distribution from the

43、standard spectral distribution, and no further correction of spectral bias errors is necessary. In this case, location and weather conditions are not critical when the reference device method is used for outdoor performance measurements provided both reference cell and test PV device have the same r

44、elative spectral response. Also, for identical relative SRs, the spectral classification of the simulator is not critical for indoor measurements. If the performance of a PV device is measured using a known spectral irradiance distribution, its short-circuit current at any other spectral irradiance

45、distribution can be computed using the spectral response of the PV test device. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the re

46、ferenced document (including any amendments) applies. IEC 60891, Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices 6 60904-7 IEC:2008 IEC 60904-1, Photovoltaic devices Part 1: Measurement of photovoltaic current-voltage

47、characteristics IEC 60904-2, Photovoltaic devices Part 2: Requirements for reference solar devices IEC 60904-3, Photovoltaic devices Part 3: Measurement principles for terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data IEC 60904-8, Photovoltaic devices Part 8: Measur

48、ement of spectral response of a photovoltaic (PV) device IEC 60904-9, Photovoltaic devices Part 9: Solar simulator performance requirements IEC 60904-10, Photovoltaic devices Part 10 Methods of linearity measurement IEC 61215, Crystalline silicon terrestrial photovoltaic (PV) modules Design qualific

49、ation and type approval IEC 61646, Thin film terrestrial photovoltaic (PV) modules Design qualification and type approval 3 Description of method For many PV devices, the shape of the I-V characteristic depends on the short-circuit current and the device temperature, but not on the spectrum used to generate the short-circuit current. For these devices, the correction of spectrum mismatch or spectral respon