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国际标准,IEC,ISO,IEEE,JIS,ANSI,AS,EU,BS,GOST,IEC,IEEE,ISA,JASO,JIS,NASM资源 (共492217 份)

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IEC 60763-2-2007 Specification for laminated pressboard - Part 2 Methods of test《层压纸板的规范.第2部分试验方法》.pdf

下载积分： 10000 积分

IEC 60763-2-2007 Specification for laminated pressboard - Part 2 Methods of test《层压纸板的规范.第2部分试验方法》.pdf

IEC 60763-1-2010 Laminated pressbord for electrical purposes - Part 1 Definitions classification and general requirements《电气用途的层压板.第1部分定义分类和一般要求》.pdf

下载积分： 10000 积分

IEC 60763-1-2010 Laminated pressbord for electrical purposes - Part 1 Definitions classification and general requirements《电气用途的层压板.第1部分定义分类和一般要求》.pdf

IEC 60761-3-2002 Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 3 Specific requirements for radioactive noble gas monitors《气态排出流放射性连续监视设备.第3部分惰性气体排出流监视仪的特殊要求》.pdf

下载积分： 10000 积分

IEC 60761-3-2002 Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 3 Specific requirements for radioactive noble gas monitors《气态排出流放射性连续监视设备.第3部分惰性气体排出流监视仪的特殊要求》.pdf

IEC 60759-1983 Standard test procedures for semiconductor X-ray energy spectrometers《半导体X射线能谱仪的标准试验程序》.pdf

下载积分： 10000 积分

IEC 60759-1983 Standard test procedures for semiconductor X-ray energy spectrometers《半导体X射线能谱仪的标准试验程序》.pdf

IEC 60757-1983 Code for designation of colours《颜色标志的代号》.pdf

下载积分： 10000 积分

IEC 60757-1983 Code for designation of colours《颜色标志的代号》.pdf

IEC 60756-1991 Non-broadcast video tape recorders time based stability《非广播用磁带录像机时基稳定性》.pdf

下载积分： 10000 积分

IEC 60756-1991 Non-broadcast video tape recorders time based stability《非广播用磁带录像机时基稳定性》.pdf

IEC 60754-2-2011 Test on gases evolved during combustion of materials from cables - Part 2 Determination of acidity (by pH measurement) and conductibity《电缆材质燃烧产生气体检测.第2部分酸度(通过测量pH值)和导电性的测定》.pdf

下载积分： 10000 积分

IEC 60754-2-2011 Test on gases evolved during combustion of materials from cables - Part 2 Determination of acidity (by pH measurement) and conductibity《电缆材质燃烧产生气体检测.第2部分酸度(通过测量pH值)和导电性的测定》.pdf

IEC 60754-1-2011 Test on gases evolved during combustion of materials from cables - Part 1 Determination of the halogen acid gas content《电缆材质燃烧产生气体检测.第1部分氢卤酸气体含量测定》.pdf

下载积分： 10000 积分

IEC 60754-1-2011 Test on gases evolved during combustion of materials from cables - Part 1 Determination of the halogen acid gas content《电缆材质燃烧产生气体检测.第1部分氢卤酸气体含量测定》.pdf

IEC 60754-1 CORR 1-2013 Test on gases evolved during combustion of materials from cables - Part 1 Determination of the halogen acid gas content Corrigendum 1《电缆材质燃烧产生气体检测.第1部分氢卤酸气体含量测定.勘误表1》.pdf

下载积分： 10000 积分

IEC 60754-1 CORR 1-2013 Test on gases evolved during combustion of materials from cables - Part 1 Determination of the halogen acid gas content Corrigendum 1《电缆材质燃烧产生气体检测.第1部分氢卤酸气体含量测定.勘误表1》.pdf

IEC 60751-2008 Industrial platinium resistance thermometer and platinum temperature sensors《工业铂电阻温度计和铂温度敏感器》.pdf

下载积分： 10000 积分

IEC 60751-2008 Industrial platinium resistance thermometer and platinum temperature sensors《工业铂电阻温度计和铂温度敏感器》.pdf

IEC 60749-9-2017 Semiconductor devices - Mechanical and climatic test methods - Part 9 Permanence of marking《半导体器件.机械和气候试验方法.第9部分标记的永久性》.pdf

下载积分： 10000 积分

IEC 60749-9-2017 Semiconductor devices - Mechanical and climatic test methods - Part 9 Permanence of marking《半导体器件.机械和气候试验方法.第9部分标记的永久性》.pdf

IEC 60749-6-2017 Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature《半导体器件.机械和气候试验方法.第6部分高温下储存》.pdf

下载积分： 10000 积分

IEC 60749-6-2017 Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature《半导体器件.机械和气候试验方法.第6部分高温下储存》.pdf

IEC 60749-5-2017 Semiconductor devices - Mechanical and climatic test methods - Part 5 Steady-state temperature humidity bias life test《半导体器件.机械和气候试验方法.第5部分稳态温度湿度偏差耐久性试验》.pdf

下载积分： 10000 积分

IEC 60749-5-2017 Semiconductor devices - Mechanical and climatic test methods - Part 5 Steady-state temperature humidity bias life test《半导体器件.机械和气候试验方法.第5部分稳态温度湿度偏差耐久性试验》.pdf

IEC 60749-43-2017 Semiconductor devices - Mechanical and climatic test methods - Part 43 Guidelines for IC reliability qualification plans《半导体器件机械和气候试验方法第43部分集成电路可靠性资格计划指南》.pdf

下载积分： 10000 积分

IEC 60749-43-2017 Semiconductor devices - Mechanical and climatic test methods - Part 43 Guidelines for IC reliability qualification plans《半导体器件机械和气候试验方法第43部分集成电路可靠性资格计划指南》.pdf

IEC 60749-42-2014 Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage《半导体器件机械和气候试验方法第42部分温度和湿度存储》.pdf

下载积分： 10000 积分

IEC 60749-42-2014 Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage《半导体器件机械和气候试验方法第42部分温度和湿度存储》.pdf

IEC 60749-40-2011 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge《半导体器件.机械和气候试验方法.第40部分使用应变计的板级跌落试验方法》.pdf

下载积分： 10000 积分

IEC 60749-40-2011 Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge《半导体器件.机械和气候试验方法.第40部分使用应变计的板级跌落试验方法》.pdf

IEC 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST)《半导体器件.机械和气候试验方法.第4部分湿热稳态高加速应力试验》.pdf

下载积分： 10000 积分

IEC 60749-4-2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST)《半导体器件.机械和气候试验方法.第4部分湿热稳态高加速应力试验》.pdf

IEC 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件.机械和气候试验方法.第38部分带存储器的半导体器件用软错误试验法》.pdf

下载积分： 10000 积分

IEC 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件.机械和气候试验方法.第38部分带存储器的半导体器件用软错误试验法》.pdf

IEC 60749-37-2008 Semiconductor devices - Mechanical and climatic test methods - Part 37 Board level drop test method using an accelerometer《半导体装置.机械和气候试验方法.第37部分用加速计的电路板级落锤试验方法》.pdf

下载积分： 10000 积分

IEC 60749-37-2008 Semiconductor devices - Mechanical and climatic test methods - Part 37 Board level drop test method using an accelerometer《半导体装置.机械和气候试验方法.第37部分用加速计的电路板级落锤试验方法》.pdf

IEC 60749-35-2006 Semiconductor devices - Mechanical and climatic test methods - Part 35 Acoustic microscopy for plastic encapsulated electronic components《半导体器件.机械和气候试验方法.第35部分塑封电子器件的超声显微检测方法》.pdf

下载积分： 10000 积分

IEC 60749-35-2006 Semiconductor devices - Mechanical and climatic test methods - Part 35 Acoustic microscopy for plastic encapsulated electronic components《半导体器件.机械和气候试验方法.第35部分塑封电子器件的超声显微检测方法》.pdf

IEC 60749-34-2010 Semiconductor devices - Mechanical and climatic test methods - Part 34 Power cycling《半导体器件.机械和环境测试方法.第34部分电力循环》.pdf

下载积分： 10000 积分

IEC 60749-34-2010 Semiconductor devices - Mechanical and climatic test methods - Part 34 Power cycling《半导体器件.机械和环境测试方法.第34部分电力循环》.pdf

IEC 60749-33-2005 Semiconductor devices - Mechanical and climatic test methods - Part 33 Accelerated moisture resistance - Unbiased autoclave《半导体器件.机械和气候试验方法.第33部分加速抗湿.无偏压热器》.pdf

下载积分： 10000 积分

IEC 60749-33-2005 Semiconductor devices - Mechanical and climatic test methods - Part 33 Accelerated moisture resistance - Unbiased autoclave《半导体器件.机械和气候试验方法.第33部分加速抗湿.无偏压热器》.pdf

IEC 60749-32-2002 Semiconductor devices - Mechanical and climatic test methods - Part 32 Flammability of plastic-encapsulated devices (externally induced)《半导体器件.机械和气候试验方法.第32部分塑料密封器件的易燃性(外部感应)》.pdf

下载积分： 10000 积分

IEC 60749-32-2002 Semiconductor devices - Mechanical and climatic test methods - Part 32 Flammability of plastic-encapsulated devices (externally induced)《半导体器件.机械和气候试验方法.第32部分塑料密封器件的易燃性(外部感应)》.pdf

IEC 60749-31-2002 Semiconductor devices - Mechanical and climatic test methods - Part 31 Flammability of plastic-encapsulated devices (internally induced)《半导体器件.机械和气候试验方法.第31部分塑料密封器件的易燃性(内部感应)》.pdf

下载积分： 10000 积分

IEC 60749-31-2002 Semiconductor devices - Mechanical and climatic test methods - Part 31 Flammability of plastic-encapsulated devices (internally induced)《半导体器件.机械和气候试验方法.第31部分塑料密封器件的易燃性(内部感应)》.pdf

IEC 60749-29-2011 Semiconductor devices - Mechanical and climatic test methods - Part 29 Latch-up test《半导体器件.机械和气候试验方法.第29部分闭锁试验》.pdf

下载积分： 10000 积分

IEC 60749-29-2011 Semiconductor devices - Mechanical and climatic test methods - Part 29 Latch-up test《半导体器件.机械和气候试验方法.第29部分闭锁试验》.pdf

IEC 60749-24-2005 Semiconductor devices - Mechanical and climatic test methods - Part 24 Accelerated moisture resistance - Unbiased HAST《半导体器件.机械和气候试验方法.第24部分加速抗湿性.无偏HAST》.pdf

下载积分： 10000 积分

IEC 60749-24-2005 Semiconductor devices - Mechanical and climatic test methods - Part 24 Accelerated moisture resistance - Unbiased HAST《半导体器件.机械和气候试验方法.第24部分加速抗湿性.无偏HAST》.pdf

IEC 60749-23-2004 Semiconductor devices - Mechanical and climatic test methods - Part 23 High temperature operating life《半导体器件.机械和气候试验方法.第23部分高温操作寿命》.pdf

下载积分： 10000 积分

IEC 60749-23-2004 Semiconductor devices - Mechanical and climatic test methods - Part 23 High temperature operating life《半导体器件.机械和气候试验方法.第23部分高温操作寿命》.pdf

IEC 60749-21-2011 Semiconductor devices - Mechanical and climatic test methods - Part 21 Solderability《半导体器件.机械和气候试验方法.第21部分可焊性》.pdf

下载积分： 10000 积分

IEC 60749-21-2011 Semiconductor devices - Mechanical and climatic test methods - Part 21 Solderability《半导体器件.机械和气候试验方法.第21部分可焊性》.pdf

IEC 60749-20-1-2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the combi.pdf

下载积分： 10000 积分

IEC 60749-20-1-2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the combi.pdf

IEC 60749-19-2003 Semiconductor devices - Mechanical and climatic test methods - Part 19 Die shear strength test《半导体器件.机械和气候试验方法.第19部分模剪切强度试验》.pdf

下载积分： 10000 积分

IEC 60749-19-2003 Semiconductor devices - Mechanical and climatic test methods - Part 19 Die shear strength test《半导体器件.机械和气候试验方法.第19部分模剪切强度试验》.pdf

IEC 60749-15-2010 Semiconductor devices - Mechanical and climatic test methods - Part 15 Resistance to soldering temperature for through-hole mounted devices《半导体器件.机械和气候试验方法.第15部分透孔安装设备对焊接温度的抗性》.pdf

下载积分： 10000 积分

IEC 60749-15-2010 Semiconductor devices - Mechanical and climatic test methods - Part 15 Resistance to soldering temperature for through-hole mounted devices《半导体器件.机械和气候试验方法.第15部分透孔安装设备对焊接温度的抗性》.pdf

IEC 60749-14-2003 Semiconductor devices - Mechanical and climatic test methods - Part 14 Robustness of terminations (lead integrity)《半导体器件.机械和气候试验方法.第14部分终端装置的坚固性(引线牢固性)》.pdf

下载积分： 10000 积分

IEC 60749-14-2003 Semiconductor devices - Mechanical and climatic test methods - Part 14 Robustness of terminations (lead integrity)《半导体器件.机械和气候试验方法.第14部分终端装置的坚固性(引线牢固性)》.pdf

IEC 60749-11-2002 Semiconductor devices - Mechanical and climatic test methods - Part 11 Rapid change of temperature Two-fluid-bath method《半导体器件.机械和气候试验方法.第11部分温度的急速变化.双液电镀槽法》.pdf

下载积分： 10000 积分

IEC 60749-11-2002 Semiconductor devices - Mechanical and climatic test methods - Part 11 Rapid change of temperature Two-fluid-bath method《半导体器件.机械和气候试验方法.第11部分温度的急速变化.双液电镀槽法》.pdf

IEC 60749-10-2002 Semiconductor devices - Mechanical and climatic test methods - Part 10 Mechanical shock《半导体器件.机械和气候试验方法.第10部分机械振动》.pdf

下载积分： 10000 积分

IEC 60749-10-2002 Semiconductor devices - Mechanical and climatic test methods - Part 10 Mechanical shock《半导体器件.机械和气候试验方法.第10部分机械振动》.pdf

IEC 60748-3-1986 Semiconductor devices Integrated circuits. Part 3 Analogue integrated circuits《半导体器件集成电路第3部分模拟集成电路》.pdf

下载积分： 10000 积分

IEC 60748-3-1986 Semiconductor devices Integrated circuits. Part 3 Analogue integrated circuits《半导体器件集成电路第3部分模拟集成电路》.pdf

IEC 60748-22-1-1997 Semiconductor devices - Integrated circuits - Part 22-1 Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis.pdf

下载积分： 10000 积分

IEC 60748-22-1-1997 Semiconductor devices - Integrated circuits - Part 22-1 Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis.pdf

IEC 60748-21-1-1997 Semiconductor devices - Integrated circuits - Part 21-1 Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis.pdf

下载积分： 10000 积分

IEC 60748-21-1-1997 Semiconductor devices - Integrated circuits - Part 21-1 Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis.pdf

IEC 60748-20-1988 Semiconductor devices - Intergrated circuits Part 20 Generic specification for film integrated circuits and hybrid film intergrated circuits《半导体器件集成电路第20部分膜集成电路和混合膜集成电路总规范》.pdf

下载积分： 10000 积分

IEC 60748-20-1988 Semiconductor devices - Intergrated circuits Part 20 Generic specification for film integrated circuits and hybrid film intergrated circuits《半导体器件集成电路第20部分膜集成电路和混合膜集成电路总规范》.pdf

IEC 60748-2-1997 Semiconductor devices - Integrated circuits - Part 2 Digital integrated circuits《半导体器件集成电路第2部分数字集成电路》.pdf

下载积分： 10000 积分

IEC 60748-2-1997 Semiconductor devices - Integrated circuits - Part 2 Digital integrated circuits《半导体器件集成电路第2部分数字集成电路》.pdf

IEC 60748-2-1-1991 Semiconductor devices integrated circuits part 2 digital integrated circuits section 1 blank detail specification for bipolar monolithic digital integrated circu.pdf

下载积分： 10000 积分

IEC 60748-2-1-1991 Semiconductor devices integrated circuits part 2 digital integrated circuits section 1 blank detail specification for bipolar monolithic digital integrated circu.pdf

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