ITU-T O 151-1992 ERROR PERFORMANCE MEASURING EQUIPMENT OPERATING AT THE PRIMARY RATE AND ABOVE《工作在一次群速率和更高速率的差错性能测量设备-测试设备规范 第IV研究组 第8页》.pdf
《ITU-T O 151-1992 ERROR PERFORMANCE MEASURING EQUIPMENT OPERATING AT THE PRIMARY RATE AND ABOVE《工作在一次群速率和更高速率的差错性能测量设备-测试设备规范 第IV研究组 第8页》.pdf》由会员分享,可在线阅读,更多相关《ITU-T O 151-1992 ERROR PERFORMANCE MEASURING EQUIPMENT OPERATING AT THE PRIMARY RATE AND ABOVE《工作在一次群速率和更高速率的差错性能测量设备-测试设备规范 第IV研究组 第8页》.pdf(8页珍藏版)》请在麦多课文档分享上搜索。
1、CCITT RECMN*Oo353 92 4862593 0579208 Ob3 7 INTERNATIONAL TELECOMMUN KATION UN ION CCITT THE INTERNATIONAL TELEGRAPH AND TELEPHONE CONSULTATIVE COMMITTEE 0.151 (1 0/92) SPECIFICATIONS OF MEASURING EQUIPMENT ERROR PERFORMANCE MEASURING EQUIPMENT OPERATING AT THE PRIMARY RATE AND ABOVE Recommendation 0
2、.151 CCITT RECMN*O-LSL 92 48b2591 0579209 TTT N FOREWORD The CCITT (the Intemational Telegraph and Telephone Consultative Committee) is a permanent organ of the International Telecommunication Union (ITU). CCiT is responsible for studying technical, operating and tariff questions and issuing Recomme
3、ndations on them with a view to standardizing telecommunications on a worldwide basis. The Plenary Assembly of CCIT which meets every four years, establishes the topics for study and approves Recommendations prepared by its Study Groups. The approval of Recommendations by the members of CCIT between
4、 Plenary Assemblies is covered by the procedure laid down in CCITT Resolution No. 2 (Melbourne, 1988). Recommendation 0.151 was revised by Study Group IV and was approved under the Resolution No. 2 procedure on the 5th of October 1992. CCIT NOTE In this Recommendation, the expression “Administration
5、” is used for conciseness to indicate both a telecommunication administration and a recognized private operating agency. o ITU 1993 Ail rights reserved. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfi
6、lm, without permission in writing from the ITU. CCITT RECMN*O.151 92 48b2591 0579210 711 = Recommendation 0.151 ERROR PERFORMANCE MEASURING EQUIPMENT OPERATING AT THE PRIMARY RATE AND AB OVE) (Published 1976; revised 1980, 1984,1988 and 1992) Abstract Defines the requirements for an equipment to mea
7、sure error performance of digital systems at the Keywords - digital error detector; - digital pattern generator; - error performance measurement; - measurement; - tester. hierarchical bit rates between 1.5 and 140 Mbit/s. PREAMBLE The requirements for the characteristics of bit-error performance mea
8、suring equipment which are described below must be adhered to in order to ensure compatibility between equipment produced by different manufacturers. 1 General The equipment is designed to measure the bit-error performance of digital systems2) by the direct comparison of a received pseudo-random tes
9、t pattern with a locally generated test pattern identical to the transmitted test pattern. In addition, the capability to measure errored time intervals is provided. 2 Test patterns The following patterns are recommended (see Recommendation 0.150 for further details). 2.1 Pseudo-random pattern for s
10、ystems using a 215 - 1 (32 767 bit) pattern length This pattern is primarily intended for error and jitter measurements at bit rates of 1544, 2048, 6312, 8448, This pattern may be generated in a fifteen-stage shift register whose 14th and 15th stage outputs are added in 32 O64 and 44 736 kbits. a mo
11、dulo-two addition stage, and the result is fed back to the input of the first stage. This Recommendation is the joint responsibility of Study Groups IV, XW and XWI. 2, “Digital system” is used as a generic term for paths, links, transmission systems, etc. Recommendation 0.151 (10B2) 1 CCITT RECflN*O
12、=353 92 +862593 0579233 b58 Number of shift register stages 15 Length of pseudo-random sequence 215 - 1 = 32 767 bits Longest sequence of ZEROS 15 (inverted signal) 2.2 Pseudo-random pattern for systems using a 223 - I (8 388 607 bit) pattern length This pattern is primarily intended for error and j
13、itter measurements at bit rates of 34 368 and 139 264 kbit/s. The pattern may be generated in a twenty-three-stage shift register whose 18th and 23rd stage outputs are added in a modulo-two addition stage, and the result is fed back to the input of the first stage. Number of shift register stages Le
14、ngth of pseudo-random sequence 23 223 - 1 = 8 388 607 bits Longest sequence of ZEROS 23 (inverted signal) 2.3 Pseudo-random pattern for systems using a 220 - 1 (I 048 575 bit) pattern length This pattern is primarily intended for error and jitter measurements at bit rates of 1544, 6312, 32064 and 44
15、 736 kbit/s. The pattern may be generated in a twenty-stage shift register whose 17th and 20th stage outputs are added in a modulo-two addition stage, and the result is fed back to the input of the first stage. An output bit is forced to be a ONE whenever the previous 14 bits are ail ZERO. Number of
16、 shift register stages 20 220 - 1 = 1 048 575 bits Length of pseudo-random sequence Longest sequence of ZEROS 15 (see note) Note - This test pattern is not identical with the pattern specified in Recommendation 0.153 because different feedback mechanisms are used when the patterns are produced by me
17、ans of shift registers. The pattern specified in this section suppresses consecutive sequences of more than 14 ZEROS, 2.4 Fixed patterns (optional) Fixed patterns of all ONEs (. 11 11 .) and alternating ONEs and ZEROS (. 1010 .) may be provided. 2.5 “Framed” measurements Certain measurements require
18、 that the test pattern is transmitted as “payload” within a valid frame. In this case, the transmission of the test pattern shall be stopped while framing bits are transmitted. When using pseudo-random test patterns for framed measurements, the beginning of the test pattern has no fixed relationship
19、 with the beginning of a frame. 2.6 Loss of sequence synchronization Sequence synchronization shall be considered to be lost and resynchronization shall be statted if a) b) the bit error ratio is 2 0.2 during an integration interval of 1 second; or it can be unambigously identified that the test pat
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