EN 62132-5-2006 en Integrated circuits C Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 5 Workbench Faraday cage method《集成电路 150kHz至1GHz电磁抗扰度的测量 第5部分 工作台法拉第筒法 IEC 62.pdf

《EN 62132-5-2006 en Integrated circuits C Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 5 Workbench Faraday cage method《集成电路 150kHz至1GHz电磁抗扰度的测量 第5部分 工作台法拉第筒法 IEC 62.pdf》由会员分享，可在线阅读，更多相关《EN 62132-5-2006 en Integrated circuits C Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 5 Workbench Faraday cage method《集成电路 150kHz至1GHz电磁抗扰度的测量 第5部分 工作台法拉第筒法 IEC 62.pdf（26页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARDBS EN 62132-5:2006Integrated circuits Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 5: Workbench Faraday cage methodThe European Standard EN 62132-5:2006 has the status of a British StandardICS 31.200g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g5

2、1g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS EN 62132-5:2006This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 March 2006 BSI ISBN 0 580 47976 5Nationa

3、l forewordThis British Standard is the official English language version of EN 62132-5:2006. It is identical with IEC 62132-5:2006.The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented

4、 on this committee can be obtained on request to its secretary.Cross-referencesThe British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by

5、using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity

6、 from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep UK interests informed; monitor related international and European developments and promulgate them in the

7、UK.Summary of pagesThis document comprises a front cover, an inside front cover, the EN title page, pages 2 to 22, an inside back cover and a back cover.The BSI copyright notice displayed in this document indicates when the document was last issued.Amendments issued since publicationAmd. No. Date Co

8、mmentsEUROPEAN STANDARD EN 62132-5 NORME EUROPENNE EUROPISCHE NORM January 2006 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels

9、2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62132-5:2006 E ICS 31.200 English version Integrated circuits Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 5: Workbench Faraday cage method (IEC 62132-5:2005)

10、Circuits intgrs Mesure de limmunit lectromagntique, 150 kHz 1 GHz Partie 5: Mthode de la cage de Faraday sur banc de travail (CEI 62132-5:2005) Integrierte Schaltungen Messung der elektromagnetischen Strfestigkeit im Frequenzbereich von 150 kHz bis 1 GHz Teil 5: Verfahren mit Faradayschem Arbeitskfi

11、g (IEC 62132-5:2005) This European Standard was approved by CENELEC on 2005-12-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists

12、 and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the res

13、ponsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hu

14、ngary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. 2 Foreword The text of document 47A/721/FDIS, future edition 1 of IEC 62132-5, prepared by SC 47A, Integrated circuits, of I

15、EC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62132-5 on 2005-12-01. This standard is to be read in conjunction with EN 62132-1. The following dates were fixed: latest date by which the EN has to be implemented at national level by

16、publication of an identical national standard or by endorsement (dop) 2006-09-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2008-12-01 This European Standard makes reference to International Standards. Where the International Standard referred to h

17、as been endorsed as a European Standard or a home-grown European Standard exists, this European Standard shall be applied instead. Pertinent information can be found on the CENELEC web site. _ Endorsement notice The text of the International Standard IEC 62132-5:2005 was approved by CENELEC as a Eur

18、opean Standard without any modification. _ EN 62132-5:2006 3 CONTENTS 1 Scope 5 2 Normative references .5 3 Terms and definitions .5 4 General6 4.1 Applicability.6 4.2 Measurement philosophy.6 4.3 Basic test set-up7 4.4 Workbench concept.7 5 Test conditions.7 6 Test equipment 8 7 Test set-up.8 7.1 G

19、eneral.8 7.2 Shielding and ambient fields 9 7.3 Workbench set-up .9 7.4 Connections to the test board 9 7.5 Common-mode points10 7.6 Workbench Faraday cage Practical implementation.11 7.7 Test board.12 8 Test procedure.12 8.1 General.12 8.2 Requirements for the workbench Faraday cage test .13 9 Test

20、 report .13 Annex A (normative) Detailed specification of workbench Faraday cage (WBFC)14 Annex B (informative) Theory of workbench Faraday cage method .18 Annex C (informative) Common-mode impedances 19 Annex D (informative) RF immunity levels 20 Bibliography .22 EN 62132-5:2006 4 Figure 1 Conducte

21、d immunity measurement method General set-up 7 Figure 2 Set-up for RF immunity testing using the workbench Faraday cage.9 Figure 3 Influence of selected number of common-mode points 10 Figure 4 Position of common-mode points11 Figure A.1 Mechanical drawing of workbench Faraday cage .15 Figure A.2 Me

22、chanical drawing of workbench Cover15 Figure A.3 Low-pass feed-through filter16 Figure A.4 Example of a construction of the 150 network 16 Figure A.5 Example of the measured impedance of the 150 network .16 Figure A.6 Metallic calibration jig for common mode impedance measurements17 Figure B.1 Workb

23、ench Faraday cage lumped elements model 18 Table C.1 Statistical values of radiation resistances measured on long cables19 Table C.2 CDN common-mode impedance parameters.19 Table D.1 Test levels for immunity .20 EN 62132-5:2006 5 INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 kHz T

24、O 1 GHz Part 5: Workbench Faraday cage method 1 Scope This measurement procedure describes a measurement method to quantify the RF immunity of integrated circuits (ICs) mounted on a standardized test board or on their final application board (PCB), to electromagnetic conductive disturbances. 2 Norma

25、tive references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050(131): International Ele

26、ctrotechnical Vocabulary (IEV) Chapter 131: Electric and magnetic circuits IEC 60050(161): International Electrotechnical Vocabulary (IEV) Chapter 161: Electro-magnetic compatibility IEC 62132-1: Integrated circuits Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 1: General conditions

27、 and definitions 1IEC 61000-4-6: Electromagnetic compatibility (EMC) Part 4: Testing and measurement techniques Section 6: Immunity to conducted disturbances, induced by radio-frequency fields 3 Terms and definitions For the purposes of this document, the definitions of IEC 62132-1, IEC 60050(131) a

28、nd IEC 60050(161), as well as the following, apply. 3.1 common-mode point node in a circuit or at a PCB at which a single point is taken as signal terminal, the second terminal being the signals reference (forming a 2-terminal port). As an example of a common-mode point, the ground reference plane (

29、Vss-plane) at an edge of a PCB is considered with respect to an external reference, e.g. the bottom of the workbench Faraday cage. _ 1To be published. EN 62132-5:2006 6 3.2 common-mode port virtual node of a circuit or at a connector port at which the signal follows the vector sum of all signals (in

30、cluding ground) at that port in relation to a reference port. As an example, the bottom of the Workbench Faraday cage is considered an external reference. At a common-mode port with multiple wires, this node can be established by using a passive summation network. NOTE For a shielded (multi-wire) ca

31、ble, the screen of that cable is used as common-mode port terminal. In this case, the common-mode point is the screen of that cable. 4 General 4.1 Applicability This standard applies to ICs that can perform “stand-alone“ functions when used on a physically small test board. The RF immunity of these

32、ICs can be measured under pre-defined conditions. In addition, the method allows measurements on application boards. This gives the user an indication of the expected immunity once the IC(s) is implemented. This method makes it possible to classify ICs for dedicated functions where EMC constraints a

33、re applicable. This might apply to ICs used with cordless telephones, other communication devices and applications where EMC properties are important to obtain optimal operation e.g. automotive, process measurement and control equipment and all other products that control critical functions. 4.2 Mea

34、surement philosophy The workbench method is derived from the IEC 61000-4-6. The method described in that publication assumes that supply and signal cable(s) are attached to an electrically small test board, with dimensions /2, i.e. 0,15 m at 1 GHz, see note. These connected cables become the dominan

35、t antennas; the induced RF disturbance is injected to the test board via these “antennas”. NOTE The test board and its connected cables thereto should be partly supported by material with low dielectric constant, as such r= 1 is assumed, see also 7.7. The connected cables will have functions such as

36、 supply, communication and other signal interfaces and these cables are commonly not geometrically oriented in the same plane as the other cables. The antenna (common-mode) impedance per port has been normalised to 150 with tolerances in the various frequency bands. By injecting either a voltage in

37、series or a current through these common-mode impedances, the RF immunity test is established. Direct injection of RF disturbance to the IC package is very small, see also IEC 62132-2 as an additional measurement method, and often negligible compared to the disturbance injected through the connected

38、 cable(s). Due to the fact that induced currents will flow through the reference of the test board, indirect coupling between the voltages and currents through the package are also established. Because of the concept chosen, the workbench method shows the effect of the test board layout, the IC supp

39、ly decoupling, the RF performance of the used discrete components (capacitors, inductors) as well as the measures taken on the IC (e.g. on-chip decoupling, filtered inputs and Schmitt-triggers used, etc.). Similar modes of operation (by software or function) shall be used for the various ICs to be t

40、ested to allow comparison. In addition, various modes of operation with one IC allow comparison i.e. determination of contribution of individual blocks within the IC. EN 62132-5:2006 7 4.3 Basic test set-up The RF immunity measurements shall take place above a metallic reference plane, see Figure 1

41、for an open set-up (according to IEC 61000-4-6). With common-mode impedances defined by using the coupling and decoupling networks (CDNs), relations between the applied disturbance voltage, while testing against RF immunity, and the locally created E/H fields can be calculated. 4.4 Workbench concept

42、 In principle coupling and decoupling is similar to the method given in IEC 61000-4-6; see Figure 1. With this workbench method, a small Faraday cage is used. Discrete resistors, connected to several common-mode points (to the PCB ground) or ports (as referred to the signals) of the test board are i

43、mplemented to represent the coupling. Equipmentunder test(EUT) Auxillary equipment Non-metal support Reference plane50 termination resistor Measuringheight RF signal generator RF power amplifier Coupling/ decoupling network Coupling/ decoupling network IEC 1310/05 RF source (generator and power amp)

44、 connected to one of the CDNs in turn. All other coupling and decoupling networks CDNs need to be terminated with 50 . Figure 1 Conducted immunity measurement method General set-up The decoupling of supply and/or other I/O lines takes place via inductances built on ferrite cores representing impedan

45、ces 150 at the frequencies of interest and feed-through filters installed on the wall of the cage. The workbench basic set-up is shown in Subclause 7.3. 5 Test conditions The test conditions shall be as described in IEC 62132-1. The workbench method can be used for either absolute or comparative tes

46、ting of ICs, either on the predefined, standardised test board, or for the measurement of definitive application boards. When measurements are carried out using a test board other than defined in IEC 62132-1, that test board shall be described such that repetition of the measurement remains possible

47、. When necessary, a copy of the layout and circuit diagram shall be added to the test report. EN 62132-5:2006 8 6 Test equipment The test equipment shall meet the requirements as described in IEC 62132-1. For the purpose of the RF immunity test, the open-circuit test generator voltage is defined. Ad

48、ding series resistance (100 with the coupling network) does not affect this open-circuit test generator voltage. As such no compensation shall be applied during the immunity test. The test generator used shall meet the following requirements: RF generator capable of covering the whole frequency rang

49、e of interest, and or being amplitude-modulated by a 1 kHz sine wave with a modulation depth of 80 %. The RF generator shall have an automatic sweep capability and /or manual control. NOTE 1 The 80 % modulation depth can also be applied while maintaining the peak RF level, see IEC 62132-1. Attenuator T1 (typically 0 dB 40 dB) of adequate frequency rating, to control the disturbing test source level. T1 may be, and often is, includ