EN 60679-5-1998 en Quartz Crystal Controlled Oscillators of Assessed Quality Part 5 Sectional Specification - Qualification Approval《经质量评定的石英晶体振荡器 第5部分 分规范 合格鉴定 IEC 60679-5-1998》.pdf

《EN 60679-5-1998 en Quartz Crystal Controlled Oscillators of Assessed Quality Part 5 Sectional Specification - Qualification Approval《经质量评定的石英晶体振荡器 第5部分 分规范 合格鉴定 IEC 60679-5-1998》.pdf》由会员分享，可在线阅读，更多相关《EN 60679-5-1998 en Quartz Crystal Controlled Oscillators of Assessed Quality Part 5 Sectional Specification - Qualification Approval《经质量评定的石英晶体振荡器 第5部分 分规范 合格鉴定 IEC 60679-5-1998》.pdf（19页珍藏版）》请在麦多课文档分享上搜索。

1、STDmBSI BS EN bOb79-5-ENGL 1778 E LbZVbb9 0730887 TLi3 BRITISH STANDARD Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval The European Standard EN 606795:1!398 has the status of a British Standard ICs 31.140 NO COPYING WITHOUT BSI PE

2、RMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW BS EN 60679-5: 1998 IEC 60679-5: 1998 STD-BSI BS EN bUb77-5-ENGL 1778 E 1bZLibbS 0730888 78T M Amd. No. BS EN 60679-61998 Date Text affected National foreword This British Standard is the English language version of EN 606745: 1998. It is identical with

3、IEC 60679451998. It supedes BS EN 169200:1996 which will be withdrawn on 2001-05-l. The UK participaiion in its prepdon was entrusted to Technical Committee EPU49, Piezoelectric devices for frequency control and selection, which has the responsibility to: - aid enquirers to understand the text; - pr

4、esent to the responsible intedonaUEumpean committee any enquiries on the interpretaion, or proposals for change, and keep the UK interests iI-LfOed; - monitor reW intemationai and European developments and promulgate them in the UK. A list of organizations represented on this committee can be obtain

5、ed on request to its secretary. Rom 1 January 1997, al IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiem fr

6、om both systems. Cross-references Attention is drawn to the fact that CEN and CENELEC standards normally include an annex which lists normative references to intemationai publications with their corresponding European publications. The British Standards which implement these international or Europea

7、n publications may be found in the BSI Standards Catalogue under the section entite “Internationai Standmis Correspondence Index“, or by using the “Fnd“ faciity of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users

8、 of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. This British Standard, having been prepared under the direction of the Electrotechnicai Sector Board, was published under the authority o

9、f the Standards Board and comes into effect on 16 November 1998 Q BSI 1998 Summary of pages This document comprises a knt cover, an inside b) detail specification number, issue number and date; and where applicable; c) nominal frequency expressed in kilohertz (kHz) or megahertz (MHz); d) enclosure t

10、ype; e) frequency tolerance(s) and operating temperature range; f) full description of any additional requirement. 2.2.6 The detail specification may include information which is not normally required to be verified by the inspection procedure, such as circuit diagrams, cuwes, drawings and notes nee

11、ded for clarif ication. Additional information (not for inspection purposes) STD-BSI BS EN bOb79-5-ENGL 1798 Lb24bb7 0730899 183 Page 6 EN 60679-6:1998 3 Quality assessment procedures 3.1 Eligibility for qualification approval Prior to making an application for qualification approval a manufacturer

12、shall first obtain manufacturers inspection approval in accordance with 11.1 of IEC QC 001002. The primary stage of manufacture shall be as defined in 3.1 of IEC 60679-1. 3.2 Structurally similar components Structural similarity exists where a range of quartz crystal controlled oscillators covered b

13、y a single detail specification and having similar electrical characteristics, incorporate the same materials and method of sealing the enclosure. 3.3 Certified test records Certified test records shall comply with 3.12 of IEC 60679-1. They shall be made available when prescribed in the detail speci

14、fication and when requested by the customer. 3.4 Qualification approval The procedures for qualification approval testing are defined in 3.8 of IEC 60679-1. Qualification approval can be obtained either by using a fixed sample drawn from current production (see 3.4.1), or on the basis of lot-by-lot

15、tests on three inspection lots with periodic tests on a sample taken from at least one of these lots (see 3.4.2). 3.4.1 The manufacturer shall produce test evidence to show conformance to the requirements of the test schedule given in table 1 of this specification. Fixed sample size procedure for in

16、itial approval Table 1 gives the number of samples to be tested in each group or subgroup together with the permissible number of defectives for qualification approval tests. If additional groups are introduced into the test schedule the number of specimens required for Group “O“ shall be increased

17、by the same number as that required for the additional groups. The complete series of tests given in table 1 and annex A, which together form the fixed sample size test schedule, are required for the qualification approval of quartz crystal controlled oscillators covered by one detail specification.

18、 The tests in each group shall be carried out in the order given. The whole sample shall be subjected to the tests of Group “O“ and then divided for the other groups. “One defective“ is counted when a quartz crystal controlled oscillator has not satisfied the whole or a part of the tests of a group.

19、 3.4.2 The manufacturer shall produce test evidence to show conformance to the requirements of tables 2 and 3 and the detail specification. Tests in each group shall be carried out in the given order. Lot-by-lot procedure for initial approval STD-BSI BS EN bOb77-5-ENGL 1998 Lb24bbS 0730895 OLT M Pag

20、e 7 EN 60679-5:1998 A minimum of three inspection lots, taken in the shortest possible period, shall be subjected to the tests given in table 2 and at least one sample taken from one of these lots shall be subjected to the periodic tests given in table 3. When additional groups are introduced into t

21、he test schedule the number of specimens shall be increased by the same number as that required for the additional groups. “One defective“ is counted when a quartz crystal controlled oscillator has not satisfied the whole or a part of the tests of a group. 3.4.3 Approval For both procedures 3.4.1 an

22、d 3.4.2 approval may be granted when the number of defectives does not exceed the specified number of permitted defectives for each group or the total number of defectives allowed. The maintenance of approval shall be in accordance with 11.5 of IEC QC 001002. 3.5 Quality conformance inspection Quali

23、ty conformance inspection shall be carried out in accordance with clause 12 of IEC QC O01 002. The blank detail specification shall prescribe the minimum test schedule which shall be included in each detail specification for quality conformance inspection. 3.5.1 Formation of inspection lots a) Group

24、s A and B inspection These tests shall be carried out on a lot-by-lot basis according to table 2 of this specification. The inspection lot shall consist of structurally similar quartz crystal controlled oscillators formed from current production. b) Group C inspection These tests shall be carried ou

25、t periodically according to table 3 of this specification. The samples shall be representative of the current production over the specified periods. Page 8 EN 60679-6:1998 O Table 1 - Sampling plan together with numl qualification appro 4.3.1 Visual test A 4.6.2 Sealing 4.5.4 Output frequency at ref

26、erence 4.5.5.1 Frequency at specified temperature 4.5.1 1 Frequency adjustment range 4.5.23 Frequency modulation characteristics temperature (as applicable) Ias aoDlicable) ers of permissible defectives for ral tests 1 2 3 4 Group number 4.4.2 Dimensions, test B 4.5.13 or 4.5.14 Oscillator output vo

27、ltage 4.5.15 or 4.5.16 Oscillator output waveform 4.5.3.1 Oscillator input power 4.5.3.3 Oven input power (OCXO only) or 4.5.3.2 Oven and oscillator input power (OCXO only) 4.5.6 Frequencyiload coefficient 4.5.7 Frequencylvoltage coefficient 4.5.10 Stabilization time 4.5.5.2 Total frequency excursio

28、n 4.5.13 or 4.5.14 Oscillator output voltage at temperature extremes 4.5.3.3 Oven input power at temperature extremes (OCXO only) (OCXO only) 4.7.1 Ageing 4.6.5 Rapid change of temperature 4.6.3.1 Solderability 4.6.3.2 Resistance to soldering heat Clause number of IEC 60679.1 and test 5 4.6.21 Immer

29、sion in cleaning solvents 4.6.1 Robustness of terminations 6 7 _ 4.6.6 Bump 4.6.7 Vibration 4.6.8 Shock 4.6.17 Climatic sequence 8 I 4.6.18 Damp heat, steady state * * m STD-BSI BS EN bOb77-5-ENGL 1998 m Lb24bb9 0730897 992 W Page 9 EN 60679-6:1998 Table 2 - Lot-by-lot tests Group AO A1 A2 A3 B1 82

30、Claus. number of IEC 6MlQ-1 and test 4.3.1 Visual test A 4.6.2.1 Gross leak test 4.5.4 Output frequency at reference or 4.5.5.1 Frequency at specified temperatures 4.5.1 1 Frequency adjustment range 4.5.23 Frequency modulation characteristics temperature (as applicable) (es appiicabie) 4.5.13 or 4.5

31、.14 Oscillator output voltage 4.5.15 or 4.5.1 6 Oscillator output waveform 4.5.3.1 Oscillator input power 4.5.3.3 Oven input power (OCXO only) or 4.5.3.2 Oven and oscillator input power (OCXO only) 4.5.5.1 Frequency at specified temperature (if not tested 100 %) Annex B of this specification Ageing

32、(OCXO only) 4.4.1 Dimensions test A Temperature 4.6.2 Sealing Inspection level 100 % II I I s4 s4 AQL % 1.5 4.0 44 STD-BSI BS EN bOb79-5-ENGL 1798 a 1b24bb9 0730878 827 4.5.6 Frequencylload coefficient 4.6.21 Immersion in cleaning solvents 4.5.7 Frequencylvoltage coefficient 4.6.5 Rapid change of te

33、mperature 4.6.3.2 Resistance to soldering heat 4.7.1 Ageing 4.6.6 Bump 4.6.7 Vibration 4.6.8 Shock Page 10 EN 60679-6:1998 3 3 3 24 Table 3 - Periodic tests 8 Group c1 c2 c3 c4 C5 a) C5 b) c5 c) C6 O Clause number of Perlodlclty IEC 80619-1 and test (months) 4.6.3.1 Solderability 4.6.1 Robustness of

34、 terminations 8 Simple slze O 8 _ 4.6.17 Climatic sequence 4.6.18 Damp heat, steady state 4.5.10 Stabilization time 4.5.5.2 Total frequency excursion (OCXO only) Permlttod defectives - _ 24 8 O 24 8 O 24 8 O O O I 8 I 8 O I 4.5.13 or 4.5.14 Oscillator output voltage at temperature extremes I I 4.5.3

35、.3 Oven input power at temperature extremes (OCXO only) STD-BSI BS EN bUb79-5-ENGL 1798 Lb2Libb7 0730897 7b5 Page 11 EN 60679-5:1998 Annex A (normative) Test schedule for qualification approval Clause numbers of tests and performance requirements refer to IEC 60679-1. In this table: D = destructive,

36、 ND = non-destructive. Clauae numbers, testa and test sequence GROUP O 4.3.1 Visual, test A 4.6.2.2 Fine leak test 4.6.2.1 Gross leak test 4.5.4 Output frequency at reference (hermeically sealed endosures only) (hermetically sealed endosures only) temperature 4.5.5.1 Frequency at specified temperatu

37、res 4.5.1 1 Frequency adjustment range (as applicable) 4.5.23 Frequency modulation characteristics Tests 1 to 5, as applicable GROUP 1 4.4.2 Dimensions - Test 6 4.5.13 or 4.5.14 Oscillator output voltage 4.5.15 or 4.5.1 6 Oscillator output waveform 4.5.3.1 Oscillator input power 4.5.3.3 Oven input p

38、ower (OCXO only) 3r 4.5.3.2 Oven and oscillator input power (OCXO only) BROUP 2 1.5.6 Frequencyload coefficient 1.5.7 Frequencyvoitage coefficient 1.5.10 Stabilization time 1.5.5.2 Total frequency excursion (OCXO only) - D or ND ND ND - ND Teat conditions 4.3.1 4.6.2.2 4.6.2.1 4.5.4 4.5.5.1 4.5.1 1

39、4.5.23 Tests 1 to 5, as applicable 4.4.2 4.5.13 or 4.5.14 4.5.15 or 4.5.1 6 4.5.3.1 4.5.3.3 4.5.3.2 4.5.6 4.5.7 4.5.10 4.5.5.2 Sample site and permissible defectives See table 1 - See table 1 See table 1 Performance requirements 4.3.1 4.6.2.2 4.6.2.1 =requency tolerances is specified in the jetail s

40、pecification 3equency tolerance(s) Vequency change as ipecified in the detail rpecification 1.5.23 and IS specified in the detail rpecification 4.4.2 .imits as specified in he detail specification Waveform as specified in he detail specification daximum power as ;pecified in the detail ;pecification

41、 daximum power as ipecified in the detail ;pecification daximum power as ipecified in the detail ipecification daximum frequency :hange as specified in he detail specification Jlaximum frequency :hange as specified in he detail specification Aaximum time as specified n the detail specification Veque

42、ncy tolerance(s) IS specified in the detail mecification STD-BSI BS EN bOb79-5-ENGL 1998 = Lb2LibbS 0730900 207 = Page 12 EN 60679-5:1998 Test schedule for qualification approval (continued) Ciruse numbers, tests and test requence GROUP 2 (continued) 4.5.13 or 4.5.14 Oscillator output voltage at tem

43、perature extremes 4.5.3.3 Oven input power at temperature extremes (OCXO only) CIROUP 3 4.7.1 Ageing QROUP 4 Inltial inrpectlon 4.5.4 Output frequency at reference temperature 4.6.5 Rapid change of temperature; thermal shock in air 4.6.3.1 Solderability Test A (for wire terminations) Test B (for sur

44、face mounted devices) 4.6.3.2 Resistance to soldering heat Test A (for wire terminations) Test 6 (for surface mounted devices) Flnal lnipoctlon 4.3.2 Visual test B 4.6.2.2 Fine leak test 4.6.2.1 Gmss leak test 4.5.4 Output frequency at reference 4.5.13 or 4.5.14 Oscillator output voltage (hermetical

45、ly sealed enclosures only) (hermetically sealed enclosures only) temperature GROUP 5 Inltlrl lnspoctlon 4.5.4 Output frequency at reference 4.6.21 Immersion in cleaning solvents 4.6.1.1 temperature Tensile and thrust test on terminations 4.6.1.2 Flexibillty of wire terminations 4.6.1.3 Toque test on

46、 mounting studs I D or ND ND - ND D D - Test condltlons 4.5.13 or 4.5.14 4.53.3 4.7.1 4.5.4 4.6.5 4.6.3.1 test A 4.6.3.1 test 6 4.6.3.2 test A 4.6.3.2 test B 4.3.2 4.6.2.2 4.6.2.1 4.5.4 4.5.13 or 4.5.14 4.5.4 4.6.21 4.6.1.1, table 2 (tensile) and table 3 (thrust) table 4 (bend) 4.6.1.3, table 5 (tor

47、que) 4.6.1.2, Sample size and permlssible defectlves See table 1 See table 1 See table 1 See table 1 Performance requirements Limits as specified in the detail specification Maximum power as specified in the detail specification Maximum frequency change as specified in the detail specification Recor

48、d measurements 4.6.3.1 test A 4.6.3.1 test B 4.6.3.2 test A 4.6.3.2 test B 4.3.2 4.6.2.2 4.6.2.1 Haximum frequency :hange as specified in the detail specification Limits as specified in the jetail specification Record measurements Marking shall be legible 4.6.1.1, table 2 (tensile) and table 3 (thru

49、st) 4.6.1.2, table 4 (bend) 4.6.1.3, table 5 (torque) STD.BSI BS EN bOb79-5-ENGL 1998 H lb24bb 0730903 143 M Page 13 EN 60679-ki.998 Test schedule for qualification approval (continued) Clause numbers, tests and test sequence GROUP 5 (continued) Final inspection 4.3.2 Visual test B 4.6.2.2 Fine leak test 4.6.2.1 Gross leak test 4.5.4 Output frequency at reference (hermetically sealed enclosures only) (hermetically sealed enclosures only) temperature 4.5.13 or 4.5.14 Oscillator output voltage GROUP 6 Initial inspection 4.5.4 Output