EN 60664-4-2006 en Insulation coordination for equipment within low-voltage systems Part 4 Consideration of high-frequency voltage stress (Incorporating Corrigendum October 2006)《低.pdf

《EN 60664-4-2006 en Insulation coordination for equipment within low-voltage systems Part 4 Consideration of high-frequency voltage stress (Incorporating Corrigendum October 2006)《低.pdf》由会员分享，可在线阅读，更多相关《EN 60664-4-2006 en Insulation coordination for equipment within low-voltage systems Part 4 Consideration of high-frequency voltage stress (Incorporating Corrigendum October 2006)《低.pdf（72页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARDBS EN 60664-4:2006Incorporating corrigendum no. 1Insulation coordination for equipment within low-voltage systems Part 4: Consideration of high-frequency voltage stressThe European Standard EN 60664-4:2006 has the status of a British StandardICS 29.080.30g49g50g3g38g50g51g60g44g49g42

2、g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS EN 60664-4:2006This British Standard was published under the authority of the Standards Policy and Strategy Committee on 28 Ap

3、ril 2006 BSI 2006ISBN 0 580 47169 1National forewordThis British Standard was published by BSI. It is the UK implementation of EN 60664-4:2006, incorporating Corrigendum October 2006. It is identical with IEC 60664-4:2005. The UK participation in its preparation was entrusted to Technical Committee

4、GEL/109, Insulation co-ordination for low voltage equipment.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Co

5、mpliance with a British Standard cannot of itself confer immunity from legal obligations.Amendments issued since publicationAmd. No. Date Comments16804 Corrigendum No. 129 December 2006 Addition of Annex ZAEUROPEAN STANDARD EN 60664-4 NORME EUROPENNE EUROPISCHE NORM January 2006 CENELEC European Com

6、mittee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELE

7、C members. Ref. No. EN 60664-4:2006 E ICS 29.080.30 English version Insulation coordination for equipment within low-voltage systems Part 4: Consideration of high-frequency voltage stress (IEC 60664-4:2005) Coordination de lisolement des matriels dans les systmes (rseaux) basse tension Partie 4: Con

8、sidrations sur les contraintes de tension haute frquence (CEI 60664-4:2005) Isolationskoordination fr elektrische Betriebsmittel in NiederspannungsanlagenTeil 4: Bercksichtigung von hochfrequenten Spannungsbeanspruchungen (IEC 60664-4:2005) This European Standard was approved by CENELEC on 2005-10-0

9、1. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtain

10、ed on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Centra

11、l Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherland

12、s, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. Incorporating Corrigendum October 2006Foreword The text of document 109/51/FDIS, future edition 2 of IEC 60664-4, prepared by IEC TC 109, Insulation co-ordination for low-voltage equipment, was submitted

13、to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60664-4 on 2005-10-01. This European Standard is to be used in conjunction with EN 60664-1 or EN 60664-5. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identi

14、cal national standard or by endorsement (dop) 2006-08-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2008-10-01 _ Endorsement notice The text of the International Standard IEC 60664-4:2005 was approved by CENELEC as a European Standard without any m

15、odification. _ EN 60664-4:2006 2 Annex ZA has been added by CENELEC. 3 EN 60664-4:2006 CONTENTS INTRODUCTION.7 1 Scope and object8 2 Normative references .9 3 Terms and definitions .9 4 Clearances.10 4.1 General conditions.10 4.2 Basic information.10 4.3 Homogeneous and approximately homogeneous fie

16、lds .10 4.3.1 Conditions for approximately homogeneous field 10 4.3.2 Experimental data of breakdown characteristics10 4.3.3 Dimensioning of clearances for homogeneous and approximately homogeneous field conditions 10 4.4 Inhomogeneous fields11 4.4.1 Conditions for inhomogeneous field11 4.4.2 Experi

17、mental data of partial discharge and breakdown characteristics.12 4.4.3 Dimensioning of clearances for inhomogeneous field conditions12 5 Creepage distances14 5.1 Experimental data14 5.2 Dimensioning of creepage distances 14 6 Solid insulation.17 6.1 General consideration17 6.2 Influencing factors .

18、17 6.3 Dimensioning of solid insulation .18 7 High-frequency testing19 7.1 Basic requirements19 7.2 Test voltage source .20 7.3 Conditioning 20 7.4 High-frequency breakdown test20 7.4.1 Test method.20 7.4.2 Test result .20 7.5 High-frequency partial discharge test .20 7.5.1 General considerations 20

19、 7.5.2 Test method.21 7.5.3 Test equipment 21 7.5.4 Test circuit.21 7.5.5 Required bandwidth of the test circuit.22 7.5.6 Dimensioning of the test circuit.22 7.6 Examples of test results.23 8 Non sinusoidal voltages23 8.1 General considerations 23 8.2 Periodic impulse voltage 24 8.3 Harmonic analysi

20、s .24 8.4 Dimensioning procedure and testing 24 Annex A (informative) Insulation characteristics of clearances at high-frequency voltages .26 A.1 Basic information about the breakdown of clearances.26 EN 60664-4:2006 4 A.2 Experimental data26 A.2.1 Homogeneous and approximately homogeneous field dis

21、tribution .26 A.2.2 Inhomogeneous field distribution 29 Annex B (informative) Insulation characteristics of creepage distances at high-frequency voltages .33 B.1 Withstand characteristics of creepage distances.33 B.2 Experimental conditions.33 B.3 Experimental data34 Annex C (informative) Insulation

22、 characteristics of solid insulation at high-frequency voltages .36 C.1 Degradation mechanism of solid insulation.36 C.2 Experimental results 39 Annex D (normative) Testing of insulation at high-frequency voltages .46 D.1 Test voltage source .46 D.2 High-frequency partial discharge test .48 D.2.1 Te

23、st equipment 48 D.2.2 Test circuit.50 D.3 Examples of test results.57 Annex E (informative) Insulation stressed with non-sinusoidal high-frequency voltages .60 E.1 Objective.60 E.2 Harmonic analysis .60 Annex F (informative) Dimensioning diagrams 65 Annex ZA (normative) Normative references to inter

24、national publications with theircorresponding European publications.69 5 EN 60664-4:2006 Figure 1 Dimensioning of inhomogeneous clearances in air at atmospheric pressure (point-plane-electrodes, 5 m radius) to avoid PD (clearance 1 mm) or breakdown (clearance d d2Equation (3) shall be used for inter

25、polation for a certain thickness d (see also Figure 3): mmkV667,125,0+=dE (3) NOTE In this context, the electric field is considered to be approximately uniform if the deviations are less than 20 % from the average value of the field strength. 19 EN 60664-4:2006 0,01 0,1 1 10 d/mm0,1 1 10 E/kV/mm IE

26、C 1347/05 Key E field strength Figure 3 Permissible field strength for dimensioning of solid insulation according to Equation (3) The use of the field strength for dimensioning of solid insulation requires an approximately uniform field distribution with no voids or air gaps in between. If the field

27、 strength cannot be calculated (because the field is not uniform) or if the peak value is higher than given from Equation (3) or Figure 3 respectively or if the presence of voids or air gaps cannot be excluded or for higher frequencies than 10 MHz, a withstand test or a PD-test with high-frequency v

28、oltage is required. The first applies to short time stresses the second applies to long time stresses according to 3.3.3.2.2 of Part 1. 7 High-frequency testing 7.1 Basic requirements The following tests are conducted at the frequency of the applied voltage: verification of the short-time dielectric

29、 strength for clearances and for solid insulation through use of a high-frequency a.c. voltage test; verification that no partial discharges occur under steady-state conditions of high-frequency voltage application. EN 60664-4:2006 20 Due to the large capacitive load at high-frequency, high-frequenc

30、y testing is primarily applicable to components and subassemblies. If an additional high-voltage test on complete equipment is required, this test can be performed according to 4.1.2 of Part 1 with power-frequency voltage. 7.2 Test voltage source Test voltage sources are given in Clause D.1. 7.3 Con

31、ditioning If not otherwise specified by technical committees, the test shall be performed with a new test specimen. Conditioning of the specimen by temperature and humidity treatment is intended to represent the most severe normal service conditions, expose possible weaknesses that are not present i

32、n the new condition. The conditioning methods described in 4.1.2.1 of Part 1 also apply for high-frequency testing. 7.4 High-frequency breakdown test This test is similar to the high-voltage test at power-frequency (see 4.1.2.3 of Part 1). 7.4.1 Test method High-frequency withstand capability is inf

33、luenced by equipment temperature and environmental conditions. Therefore the test shall be performed under the most severe conditions that can be encountered in service, including the temperature rise caused by normal operation of the equipment. The test duration is 1 min. 7.4.2 Test result No break

34、down shall occur during the test duration. After the test, no visible damage (burning, melting etc.) shall occur. 7.5 High-frequency partial discharge test 7.5.1 General considerations The general methods for partial discharge testing are described in IEC 60270. For PD-testing of low-voltage equipme

35、nt 4.1.2.4 of Part 1 and Annex C of Part 1 are applicable, but for a test with high-frequency voltage changes are required in the test equipment and methods that are specified in this standard. In order to minimize the risk of test sample degradation, a PD-testing should be performed with precise pr

36、ocedures and measurements and with test voltages in the range of the PD-inception voltage. For the failure criterion, low PD-levels have to be specified, normally below 10 pC. As the specified PD-extinction voltage can be determined with limited accuracy and is influenced by additional parameters su

37、ch as temperature and humidity which are not usually 21 EN 60664-4:2006 taken into account during testing, the PD-extinction voltage must include a safety factor of F1= 1,2 times the highest periodic peak voltages (see 4.1.2.4 of Part 1). For reinforced insulation a more stringent risk assessment is

38、 necessary and an additional safety factor of F3= 1,25 is required for the PD-extinction voltage (see 4.1.2.4 of Part 1). The PD-test is primarily a component test, but testing of equipment is also possible. In that case localizing the PD-source can be difficult and the measured PD-magnitude will be

39、 a function of position within the apparatus. During type testing, the PD-test will verify the proper design of the insulation system, the appropriate selection of the insulation materials, and proper manufacturing processes. Such tests are also very useful during equipment design. By performing sam

40、pling and routine testing, the entire manufacturing process can be verified, which is of fundamental importance for quality insurance. Due to the high-frequency test voltage, careful screening of the test system by conductive enclosures is required to avoid interfering with other electronics in the

41、vicinity. Such screening measures are generally sufficient to meet the required interference level during PD-measurements. 7.5.2 Test method Due to the high risk of deterioration of the test specimen at high-frequency voltage, the rate of voltage rise should be as high as possible without causing ov

42、ershoot of the test voltage. In general, the noise level during high-frequency partial discharge testing will be significantly higher than during power frequency testing. 7.5.3 Test equipment The measurement of partial discharges at high-frequency voltage is more difficult because the test voltage a

43、nd the partial discharge signal can have overlapping frequency spectra which require appropriate methods of separation (filtering). As the frequency of the test voltage can vary over a wide range, tuned notch filters will be necessary. The centre frequency of these filters shall be tuned to the freq

44、uency of the test voltage. It is much more difficult to separate the signal of non-sinusoidal test voltage sources from the PD-signal; therefore such tests are not recommended within the scope of this standard. For measuring the PD-intensity, a digital storage oscilloscope is used in combination wit

45、h a band-stop filter in order to suppress the high-frequency test voltage. Examples of partial discharge test circuits with high-frequency voltage are shown in Clause D.2. The partial discharge detection is performed by digital integration with a digital storage oscilloscope of high sampling rate. 7

46、.5.4 Test circuit The PD-measurement is performed through detection of the PD-current. For this purpose, a measuring impedance Rmis connected in series with the test specimen. The voltage drop across this impedance is applied across a band-stop filter to one channel of a digital storage oscilloscope

47、 with high bandwidth (at least 100 MHz) so that together with the test circuit consisting of lumped elements, a total bandwidth of 60 MHz can be obtained. The band-stop filter removes the voltage drop caused by the capacitive current feeding the test specimen. By this technique a PD-sensitivity of 5

48、 pC can be obtained. EN 60664-4:2006 22 The high-frequency test voltage is measured with a high-frequency voltmeter and the waveshape is monitored on the second channel of the digital storage oscilloscope. For further details of the test circuit see D.2.2. 7.5.5 Required bandwidth of the test circui

49、t In the following evaluation, the test circuit has a 1st order low-pass transfer characteristic (PT1-characteristic) resulting in a lower cut-off frequency of zero and an upper cut-off frequency (3 dB) fcthat is equal to the bandwidth. Considerations with respect to the effect of possible resonance points or the lower cut-off frequency of the test circuit are described in D.2.2. 7.5.5.1 Minimum bandwidth for PD-impulse resolution For high-frequency test voltages, a high pulse repetition frequency