ECA TEB 25-1985 Survey of Data-Display CRT Resolution Measurement Techniques《数据显示CRT清晰度测量技术调查》.pdf

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1、I EIA TEB25 85 3234b00 000721b 3 June 1985“ TEPAC ENOINEEWINO BULLETIN NO. 25 . A Survey of Data-Display CRT RO8OlUtiOn Measurement Techniques FORMULATED BY LIA TUBE ENQINEERING PANEL ADVISORY COUNCIL .- EIA TEB25 85 W 3234600 0007237 5 .1 -NOTICE EIA Engineering Standards and Publications are desig

2、ned to serve the public purchasers, feciliteting intemhangeabiiity and improvement of products, and assisting the purchaser in wlecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Pub- lications shall not in any respect preclude any me

3、mber or non-member of EIA from manufacturing or selling pcfucts not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those otfrer than EiA members, whether the standard is . to be used either domsstically or mte

4、rnatitmally. c interest t.hrwgh eliminating misunderstandings between manufacturers and Recommended Standards and.Publications are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or procegses. By such action, EIA does not assmy any liability

5、 to any patent owner, nor does it assume any obligation whatever to parties adopting the Recom- mended Standard or Publication. Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, N.W. Washington, D.C. 20006 Published in U.S.A. ;- 7- -I-, 2 .- EIA TEB25 85 m 323460

6、0 0007243 b m TEB25 Page 25 Bibliography 1. G. Slocum, et al, “Airborne Sensor Display Requirements and Approaches,” Informa- tion Dkplay, pp. 44-51, November/December 1%7. 2. Tektronix, Inc., Crmt Concepts - Cathode-Ray h, pp. 55-59, October 1968 (out of print). 3. Sherr, S., Funamentais of Display

7、 System Design, Wiley, 1970. 4. Bryden, J.B., “Some Notes of Measuring Performance of Phosphors Used in CRT Displays,” Society of Information Display, Proceedings of 7th National Con ference, pp. 89-97, October 1976. 5. Sherr, S., Electronic Displayss, Wiley, pp. 600-608, 1979. 6. Oess, F.G., “Spot-

8、size, Line-width and Resolution Evaluations with Emphasis on Raster Dot Display CRTs,” Application Note No. 37, Clinton Electronics Corp., March 24, 1982. 7. Barten, P., “Spot Size and Current Density Distribution of CRTs,” Proceedings of 3rd International Display Research Conference, October 1983,

9、pp. 280-283. 8. Syntronic Instruments, Inc., “CRT Resolution Basics,” Application Note No. 3, no publication date. * 9. Electron Tbe Corporation, “Facts About Spot Size,” no publication date. 10. International Electrotechnical Commission, “Measurements of the Electrical Properties of Electronic Tbes

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12、., “Measure CRT Spot Size,” Electronic Design, pp. 58-60, July 19, 1975. 16. Say, D.L., “Picture-bbe Spot Analysis Using Direct Photography,” IEEE Trans. on Consumer Electronics, February 1977, pp. 32. 17. Say, D.L., “Pulsed Spot Photography,” Compilation of Seminar Notes, Phillips ECG, pp. 7-2-1 to

13、 7-2-4, June 1982. 18. G. Algebra and P. Xouben, “Analyze Von Elektronenspot-Intensitatsprofilen Mit Milfe Einer Fernsehkamera,” NTC-Fachberchte, Vol, 85, pp. 150-154, May 1983. 19. TektroNx, Inc., “Measuring Television Picture Monitor Resolution,” Tele;ision Products Application Note No. 27, Januar

14、y 1981. e EIA TEB25 85 m 3234b00 0007244 m I TEB2 5 Page 26 20. Visual Information Institute, “The Reality of TV Resolution Specifications,” 1982. 21. Harshbarger, J.H., “Test Procedures for Raster Scan Displays,” Electronic Imaging, Oct. 22. White, L.E., “Measuring Spot Size of High Resolution Cath

15、ode-Ray Tbes,” Electronic Equipment Engineering, pp. 46-50, August 1959. 23. Constantine, J.M., “ho Slit Spot Analyzer,” Proceedings of 7th National Symposium, Society for Information Display, pp. %-97, October, 1966. 1983, pp. 66-71. 24. Hall, R.E., “Measurement Techniques for Cathode Ray nibes,” l

16、?ze Electronic Engineer, pp. 86-87, January 1967. 25. &Welle, E.M., Dynamic CRT Spot Measurement Techniques,” Proceedings of 9th Na- tional Symposium, Society for Information Display, pp. 183-192, 1968. 26. Snyder, J.S., “Analysis of Resolution Measurements of a Cathode-Ray nibe Spot,” Pro- ceedings

17、 of 10th National Symposium, Society for Information Display, pp. 13-26, 1969. 27. Gamma Scientific, Inc., V“ Slit Techniques of CRT Spot Size Measurement, Engineering Application Note III. 1971. 28. Griffis, P.D. and Schefer, J., Kinescope Spot Size as it Relates to Picture Quality,” ZEEE ll-ansact

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21、MTF Measurement,” ITT Aerospace/Optical Division Application Note 121 o no publication date. 35. Microvision Co., Specification Sheet and Operation Manual for Spotchek 3450. 36. P. Burr and B.D. Chase, “Spot-Size Measurements on Shadow-Mask Color CRTs,” 5ID Proceedings of First European Display Rese

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23、erica, June 1954, pp. 468-471. 0 .- .- EIA TEB25 85 m 3234b00 0007245 T m TEB25 Page 27 39. Schade, O.H., “A Method of Meburing the Optical Sine-Wave Spatial Spectrum of Television Image Display Devices,” SMPTE Journal, 1958, pp. 561 -566. 40. Constantine Engineering Laboratories, “Modulation lansfe

24、r Function,” (Application Note), No publication date. 41. Ferranti Ltd., “CRT Resolution and Its M&urement,” Lancashire, England, no publica- tion date. 42. Limansky, I., “A New Resolution Chart for imaging Systems,” 77ze ElectronicEngineer, June 1%8. 43, Gamma Scientific, hc., “Measurement of the M

25、odulation lkansfer Characteristics of a TV System, Engineering Application Note III, 1971. 44. Donofrio. R.L., “Image Sharpness of a Color Picture be by Modulation Transfer Func- tion Techniques,” IEEE Dans. on Broadcat and Tlevision Receivern, February 1972, pp. 1-6. 45. Johnson, C.B., “MTFs: A Sim

26、plified Approach,” Electro-Optical Systems Design, November 1972, pp. 22-26. 46. Slaymaker, F.H., “Noise in MTF Measurements,” Applied Optics, November 1973, pp. 47. Bedeli, R.J., “Modulation kamfer Function of Very High Resolution Miniature Cathode Ray nibes,” IEEE Transactions on Electron Devices,

27、 Vol. ED-22, No. 9, pp. 793-796, September 1975. 48. R. Verona et al, “A Direct Measure of CRT Image Quality,” US Army Aeromedical Research Laboratory Report 79-14, September 1979. 2709-2715, 49. Abbott, F., “The Theory of MTF,” Optical Industry and Systems Directory, pp. 50. Banbury, J.R. and Whitf

28、ield, F.B., “Measurement of Modulation Tkansfer Function for Tathode-Ray Tbes,” Displays, January 1981. 51 Donofrio, R.L., “Line Profile and Modulation lansfer Ftnction (MTF),” Compilation of Seminar Notes, Phillips ECG, pp. 7-3-1 to 7-34 June 1982. 52. Jansen, L.A. “Display Image Measurement and Ch

29、aracterization,” Society for Infor- mation Display Seminar Notes, 1983. 53, Barten, P., “Resolution of Data Display Tbes,” SID Digest, Society of Information Display, 1983. 541 Abbott, R., “Modulation kansfer Function,” Optical Industry and Systems Purchas- ing DireCtOfY, Vol. 2, pp. E-126 to E-132, 1983. 55. Barbarasch, J. and Buhler, F.TI, “Characterization of CRT Resolution,” IEEE, 1983. 56. Donofrio, R.L., “A New Approach to Determining the Image Response of a Color Pic- ture nibe,” IEEE Dansactions on Broadcast and l2levkion Receivers, August 1973, pp. B639-B651,1980. 143-148.