ECA EIA-364-49-2013 TP-49 Ultraviolet Radiation Test Procedure for Electrical Connectors and Sockets.pdf

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1、 EIA STANDARD TP-49 Ultraviolet Radiation Test Procedure for Electrical Connectors and Sockets EIA-364-49 September 2013 ANSI/EIA-364-49-2013 Approved: September 29, 2013 EIA-364-49NOTICE EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunde

2、rstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect pr

3、eclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether the standard is to be used either domesti

4、cally or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Stand

5、ard or Publication. This EIA Standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC document can be made. This Standard does no

6、t purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From St

7、andards Proposal No. 5218-A, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2013 EIA Standards therefore the percentages of UVA, UVB and UVC, must be specified for the testing. 1.4 Defi

8、nitions 1.4.1 Actinic Of or relating to the chemically active rays of the electromagnetic spectrum as related to, resulting from, or exhibiting chemical changes produced by radiant energy especially in the visible and ultraviolet parts of the spectrum. 1.4.2 DUT Device under test EIA-364-49 Page 3 1

9、.4.3 Insolation The quantity of solar radiation falling upon a body or device, per unit area watts per meter squared (W/m2). 1.4.4 Ultraviolet Those wavelengths of light between 100 nanometers and 400 nanometers. 1.4.4.1 UVA Radiation in the bandwidth 320 nanometers to 400 nanometers. 1.4.4.2 UVB Ra

10、diation in the bandwidth 280 nanometers to 320 nanometers. 1.4.4.3 UVC Radiation in the bandwidth 100 nanometers to 280 nanometers. CAUTION Ultraviolet radiation in the UVC bandwidths can be detrimental to personnel conducting tests. Protective procedures need to be in place for safety. 2 Test resou

11、rces 2.1 Equipment 2.1.1 Test chamber A chamber with a bank of solar lamps that will produce solar radiation of the required spectra over the exposed area of the DUT. The facility shall have the capability of maintaining and monitoring required air flow conditions of temperature, within 3 C airflow,

12、 within 0.28 cubic meter (10 cubic feet) per minute; and insolation 5% of specified Watts/meter2. The DUT will be tested by direct exposure to the solar radiation of the specified spectra. 2.1.2 Cooling equipment Cooling equipment shall be provided to insure that heating effects are mitigated in ord

13、er to measure the actinic effects. EIA-364-49 Page 4 2.1.3 Light source(s) The following list is not intended to exclude new lamps made available by advanced technology. It may be necessary to use filters to make the spectrum comply with the requirements of the spectrum needs: Metal halide lamps (de

14、signed for full spectrum application), Xenon arc or mercury xenon arc lamps (used singularly) with suitable reflector, Combination of high pressure sodium vapor and mercury vapor with suitable reflectors, High-intensity multi-vapor, mercury vapor (with suitable reflectors), and incandescent spot lam

15、ps. 2.2 Fixture Holder for DUT should be semi-matte finish to minimize reflected energy; but also not act as a heat absorber that might transfer undo heat via conduction. 3 Test Specimen 3.1 Description DUT should have a finish indicative of the normal production unit. Higher or lower surface reflec

16、tivity may adversely affect the test results. 3.2 Preparation Holder should be semi-matte finish to minimize reflected energy; but also not act as a heat absorber that might transfer undo heat via conduction. 4 Test Procedure 4.1 Measure the ambient air temperature prior to starting the test. 4.2 Ex

17、pose DUT to UV radiation with the spectra required for 10 minutes. 4.3 Measure the thermal rise of the DUT to ensure that it has not exceeded material limits. 4.4 The air temperature, air flow magnitude, or the air flow direction may be adjusted, as needed in any combination, so that the DUT maximum

18、 temperature rating is not exceeded for the duration of the test 4.5 Expose DUT to full duration time as specified. 4.6 At conclusion of exposure time, remove UV radiation source and allow air flow to continue until DUT reaches temperature in first step. EIA-364-49 Page 5 5 Details to be specified T

19、he following details shall be specified in the referencing document: 5.1 Location of temperature sensors on the test item. 5.2 Minimum air flow cubic meters per minute (cubic feet per minute) details, if required 5.3 Spectral power distribution of the source lighting and the percentage of each UV sp

20、ectra for DUT exposure. 5.4 Specimen description 5.5 Number of specimens to be tested 5.6 Other items as required 5.7 Altitude, as applicable 5.8 Any deviations from the original test plan 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and th

21、e following: 6.1 Title of test 6.2 Test equipment used, and date of last and next calibration 6.3 Test procedure 6.4 Values and observations 6.5 DUT response temperatures 6.6 Name of operator and start/finish date(s) of test ECIA Document Improvement Proposal If in the review or use of this document

22、, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 170 Herndon, VA 20170 FAX: (571-323-0245) Docu

23、ment No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY R

24、esponsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Additions, changes and deletions SP-5218 Initial release Electronic Components Industry Association 2214 Rock Hill Road, Suite 170 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org