DLA SMD-5962-96869 REV C-2008 MICROCIRCUIT DIGITAL ADVANCED HIGHSPEED CMOS QUADRUPLE BUS BUFFER GATE WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change in accordance with the notice of revision 5962-R352-97. - jak 97-06-27 Monica L. Poelking B Change in accordance with the notice of revision 5962-R450-97. - cfs 97-09-03 Monica L. Poelking C Redrawn with changes. Update the boilerplate to

2、current requirements as specified in MIL-PRF-38535. - jak 08-11-05 Thomas M. Hess REV SHET REV C C SHET 15 16 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen DEFE

3、NSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-09-09 MICROCIRCUIT, DIGITAL, ADVANCED HIGH-SPEED CMOS, QUADRUPLE BUS BUFF

4、ER GATE WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-96869 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E034-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR

5、CUIT DRAWING SIZE A 5962-96869 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device c

6、lass V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96869 01 Q C A Fe

7、deral stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are ma

8、rked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as fol

9、lows: Device type Generic number Circuit function 01 54AHCT125 Quadruple bus buffer gate with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements

10、documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-18

11、35 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V o

12、r MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96869 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.

13、3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to +7.0 V dc 4/ DC input clamp current (IIK) (VINVCC) 20 mA Continuous output current (IO) (VOUT= 0 V to VCC) . 2

14、5 mA Continuous current through VCCor GND 50 mA Maximum power dissipation at TA= +55C (instill air) (PD) . 500 mW Storage temperature range (TSTG) -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) . +17

15、5C 1.4 Recommended operating conditions. 2/ 3/ 5/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) +2.0 V Maximum low level input voltage (VIL). +0.8 V Input voltage range (VIN) . +0.0 V dc to +5.5 V dc Output voltage range (VOUT) +0.0 V dc to VCCMaximum hig

16、h level output current (IOH) . -8 mA Maximum low level output current (IOL) . +8 mA Minimum input rise or fall rate (t/V). 20 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device, Extended operation at the max

17、imum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage ratin

18、gs may be exceeded providing that the input and output current ratings are observed. 5/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96

19、869 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein

20、. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcirc

21、uits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/

22、or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, h

23、owever, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufact

24、urers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.

25、2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance wi

26、th 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The

27、 ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND

28、ARD MICROCIRCUIT DRAWING SIZE A 5962-96869 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteri

29、stics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined i

30、n table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on t

31、he device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certificati

32、on mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML

33、-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of com

34、pliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

35、3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For devic

36、e class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the optio

37、n to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group num

38、ber 37 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96869 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. E

39、lectrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min MaxIOH= -50 A 1, 2, 3 4.4 1 3.94 High level output voltage 3006 VOHFor all inputs affecting outputs

40、under test, VIN= 2.0 V or 0.8 V For all other inputs, VIN= VCCor GND IOH= -8 mA 4.5 V 2, 3 3.8 V IOL= 50 A 1, 2, 3 0.1 1 0.36 Low level output voltage 3007 VOLFor all inputs affecting outputs under test, VIN= 2.0 V or 0.8 V For all other inputs, VIN= VCCor GND IOL= 8 mA 4.5 V 2, 3 0.44 V 1 +0.1 Inpu

41、t current high 3010 IIHFor input under test, VIN= VCCFor all other inputs, VIN= VCCor GND 5.5 V 2, 3 +1.0 A 1 -0.1 Input current low 3009 IILFor input under test, VIN= GND For all other inputs, VIN= VCCor GND 5.5 V 2, 3 -1.0 A 1 +0.25 Three-state output leakage current, high 3021 IOZHmOE = 2.0 V For

42、 all other inputs, VIN= VCCor GND VOUT= VCC5.5 V 2, 3 +2.5 A 1 -0.25 Three-state output leakage current, low 3020 IOZLmOE = 2.0 V For all other inputs, VIN= VCCor GND VOUT= GND 5.5 V 2, 3 -2.5 A 1 2.0 Quiescent supply current, 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0 A 5.5 V 2, 3 20 A 1 1.35 Q

43、uiescent supply current delta, TTL input levels ICC4/ One input at 3.4 V Other inputs VCCor GND 5.5 V 2, 3 1.5 mA Input capacitance 3012 CINTC= +25C VIN= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF Output capacitance 3012 COUTTC= +25C VOUT= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF Power dissipation capacitance

44、 CPD5/ CL= 50 pF minimum f = 1 MHz See 4.4.1c 5.0 V 4 14.0 pF VOLP6/ 5.0 V 4 1500 Low level ground bounce noise VOLV6/ 5.0 V 4 -1200 mV VOHP6/ 5.0 V 4 500 High level VCCbounce noise VOHV6/ VIH= 3.0 V,VIL = 0.0 V TA= +25C See 4.4.1d See figure 4 5.0 V 4 -750 mV See footnotes at end of table. Provided

45、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96869 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued.

46、 Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max 4.5 V Functional tests 3014 7/ VIN= 2.0 V or 0.8 V Verify output VOSee 4.4.1b 5.5 V 7, 8 L H 9 5.5 CL= 15 pF minimum RL= 1 k See figur

47、e 5 9/ 4.5 V and 5.5 V 10, 11 1.0 6.5 ns 9 7.5 tPLH8/ CL= 50 pF minimum RL= 1 k See figure 5 4.5 V and 5.5 V 10, 11 1.0 8.5 ns 9 5.5 CL= 15 pF minimum RL= 1 k See figure 5 9/ 4.5 V and 5.5 V 10, 11 1.0 6.5 ns 9 7.5 Propagation delay time, mA to mY 3003 tPHL8/ CL= 50 pF minimum RL= 1 k See figure 5 4

48、.5 V and 5.5 V 10, 11 1.0 8.5 ns 9 5.1 CL= 15 pF minimum RL= 1 k See figure 5 9/ 4.5 V and 5.5 V 10, 11 1.0 6.0 ns 9 7.1 tPZH8/ CL= 50 pF minimum RL= 1 k See figure 5 4.5 V and 5.5 V 10, 11 1.0 8.0 ns 9 5.1 CL= 15 pF minimum RL= 1 k See figure 5 9/ 4.5 V and 5.5 V 10, 11 1.0 6.0 ns 9 7.1 Propagation delay time, output enable, mOE to mY 3003 tPZL8/ CL= 50 pF minimum RL= 1 k See figure 5 4.5 V and 5.5 V 10, 11 1.0 8.0 ns 9 6.8 CL= 15 pF minimum RL= 1 k See figure 5 9/ 4.5 V and 5.5 V 10, 11 1.0 8.0 ns 9 8.8 tPHZ8/ CL= 50 pF mini