DLA SMD-5962-96767 REV D-2009 MICROCIRCUIT LINEAR RADIATION HARDENED HIGH SPEED LOW POWER CURRENT FEEDBACK AMPLIFIER WITH PROGRAMMABLE OUTPUT LIMITING MONOLITHIC SILICON.pdf
《DLA SMD-5962-96767 REV D-2009 MICROCIRCUIT LINEAR RADIATION HARDENED HIGH SPEED LOW POWER CURRENT FEEDBACK AMPLIFIER WITH PROGRAMMABLE OUTPUT LIMITING MONOLITHIC SILICON.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-96767 REV D-2009 MICROCIRCUIT LINEAR RADIATION HARDENED HIGH SPEED LOW POWER CURRENT FEEDBACK AMPLIFIER WITH PROGRAMMABLE OUTPUT LIMITING MONOLITHIC SILICON.pdf(20页珍藏版)》请在麦多课文档分享上搜索。
1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make change to 1.2.4 and power dissipation as specified under 1.3. - ro 99-06-09 R. MONNIN B Add appendix A. - ro 01-09-10 R. MONNIN C Add dose rate footnote under paragraph 1.5 and table I. Delete Neutron testing and Dose rate induced latchup te
2、sting. - ro 05-11-02 R. MONNIN D Add case outline X. Make changes to 1.2.4, 1.3 and figure 1. -rrp 09-03-09 R. HEBER REV SHET REV D D D D D SHEET 15 16 17 18 19 REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK OFFICER DEFENSE SUPPL
3、Y CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY RAJESH PITHADIA COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL FRYE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-02-21 MICROCIRCUIT, LINEAR, RAD
4、IATION HARDENED, HIGH SPEED, LOW POWER, CURRENT FEEDBACK AMPLIFIER WITH PROGRAMMABLE OUTPUT LIMITING, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-96767 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E189-09 Provided by IHSNot for ResaleNo reproduction or networking permitted w
5、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96767 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device cla
6、sses Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in th
7、e following example: 5962 F 96767 01 V P C Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the
8、MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device
9、 type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HS1135RH Radiation hardened D.I., high speed, low power, current feedback amplifier with programmable output limiting 1.2.3 Device class designator. The device class designator is a single letter identi
10、fying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-3
11、8535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X CDFP3-F14 14 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for devic
12、e classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96767 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC
13、FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Voltage between +VSand VS. 12 V dc Differential input voltage 5 V dc Voltage at either input terminal . +VSto VSOutput current . Short circuit protected 2/ Output current (50% duty cycle) 60 mA 2/ Maximum package power dissipation at TA= +125C (PD):
14、Case X . 0.45 W 3/ Case P . 0.44 W 3/ Junction temperature (TJ) . +175C Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC): Case X . 25C/W Case P . 30C/W Thermal resistance, junction-to-ambient (JA) 115C/W Case X
15、. 110C/W Case P . 115C/W 1.4 Recommended operating conditions. Operating supply voltage (VS) . 5 V Load resistance (RL) . 50 Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 50 300 rads(Si)/s) 300 Krads (Si) 4/ 2. APPLICABLE D
16、OCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF
17、DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. _ 1/ Stresses above the absolute maximum rating
18、 may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Output is short circuit protected to ground. Brief short circuits to ground will not degrade reliability, however continuous (100% duty cycle) output current must no
19、t exceed 30 mA for maximum reliability. 3/ If device power exceeds package dissipation capability, provide heat sinking or derate linearly (the derating is based on JA) at the following rate of 8.7 mW/C for case outline P, or 9.1 mWC for case outline X. 4/ These parts may be dose rate sensitive in a
20、 space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f
21、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96767 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (C
22、opies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the referen
23、ces cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in acc
24、ordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with
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