DLA SMD-5962-95835 REV A-2008 MICROCIRCUIT DIGITAL BIPOLAR CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON《单片硅TTL兼容输入 八路透明D类锁存.pdf

《DLA SMD-5962-95835 REV A-2008 MICROCIRCUIT DIGITAL BIPOLAR CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON《单片硅TTL兼容输入 八路透明D类锁存.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-95835 REV A-2008 MICROCIRCUIT DIGITAL BIPOLAR CMOS OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON《单片硅TTL兼容输入 八路透明D类锁存.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to the current requirements of MIL-PRF-38535. - jak 08-08-04 Thomas M. Hess REV SHET REV A SHET 15 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Larry T. Ga

2、uder STANDARD MICROCIRCUIT DRAWING CHECKED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-10-1

3、2 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-95835 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E469-08 Provided by IHSNot for ResaleNo reproduction or netwo

4、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95835 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliab

5、ility (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN

6、is as shown in the following example: 5962 - 95835 01 Q R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked

7、devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device ty

8、pe(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54BCT573 Octal transparent D-type latch with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the pro

9、duct assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Ca

10、se outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead fi

11、nish is as specified in MIL-PRF-38535 for device classes Q, and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95835 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS

12、, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) (

13、VIN 0.0 V) -30 mA DC output current (IOL) (per output). +96 mA Storage temperature range (TSTG) -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C Maximum power dissipation (PD) . 555 mW 1.4 Recomm

14、ended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . +0.0 V dc to VCCOutput voltage range (VOUT) +0.0 V dc to VCCMaximum low level input voltage (VIL ) 0.8 V Minimum high level input voltage (VIH ) . 2.0 V Case operating temperature range

15、(TC) -55C to +125C Maximum high level output current (IOH) -12 mA Maximum low level output current (IOL) . 48 mA Input clamp current . -18 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and a

16、ffect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input negative and output voltage rating mat be exceeded provided that

17、the input and output clamp current rating is observed. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95835 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 AP

18、R 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or cont

19、ract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDB

20、OOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 1911

21、1-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. RE

22、QUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or

23、function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shal

24、l be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1

25、. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms

26、and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as spe

27、cified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproducti

28、on or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95835 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the ma

29、nufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for dev

30、ice classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance

31、 mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). F

32、or device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall af

33、firm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in

34、MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to

35、this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation sh

36、all be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 127 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking per

37、mitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95835 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -

38、55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max VOH1For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -3.0 mA 4.5 V 1, 2, 3 2.4 High level output voltage 3006 VOH2For all inputs affecting output under test, VIN= 2.0 V or 0.8 V

39、IOH= -12.0 mA 5.0 V 1, 2, 3 2.0 V Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= 2.0 V, VIL= 0.8 V IOL= 48 mA 4.5 V 1, 2, 3 0.55 V Three-state output leakage current high 3021 IOZHFor control inputs affecting outputs under test, VIN= VIHor VILVIH= 2.0 V, VIL= 0.8 V

40、 VOUT= 2.7 V 5.5 V 1, 2, 3 50.0 A Three-state output leakage current low 3020 IOZHFor control inputs affecting outputs under test, VIN= VIHor VILVIH= 2.0 V, VIL= 0.8 V VOUT= 0.5 V 5.5 V 1, 2, 3 -50.0 A Negative input clamp voltage 3022 VIC- For input under test, IIN= -18 mA 4.5 V 1 -1.2 V Input curr

41、ent high 3010 IIHFor input under test, VIN= 2.7 V 5.5 V 1, 2, 3 20.0 A Input current low 3009 IILFor input under test, VIN= 0.5 V 5.5 V 1, 2, 3 -0.6 mA Short circuit output current 3011 IOS4/ VOUT= 0.0 V 0.0 V 1, 2, 3 -100 -225 mA Quiescent supply current, outputs high 3005 ICCH5.5 V 1, 2, 3 8.0 mA

42、Quiescent supply current, outputs low 3005 ICCL5.5 V 1, 2, 3 62.0 mA Quiescent supply current, outputs three-state 3005 ICCZVIN= VCCor GND IOUT= 0 A 5.5 V 1, 2, 3 8.0 mA 4.5 V 7, 8 L H Functional test 3014 5/ VIL= 0.8 V VIH= 2. 0 V Verify output VOSee 4.4.1d 5.5 V 7, 8 L H See footnotes at end of ta

43、ble. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95835 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristi

44、cs Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 4/ Unit Min Max5.0 V 9 2.0 7.2 tPLH16/ 4.5 V and 5.5 V 10, 11 1.0 9.8 ns 5.0 V 9 2.8 8.2 Propagation delay time, mD input to mQ output 30

45、03 tPHL16/ CL= 50 pF minimum RL= 500 See figure 4 4.5 V and 5.5 V 10, 11 1.5 10.3 ns 5.0 V 9 2.4 7.2 tPLH26/ 4.5 V and 5.5 V 10, 11 2.0 9.7 ns 5.0 V 9 2.9 7.1 Propagation delay time, LE input to mQ output 3003 tPHL26/ CL= 50 pF minimum RL= 500 See figure 4 4.5 V and 5.5 V 10, 11 2.0 8.8 ns 5.0 V 9 3

46、.0 8.5 tPZH6/ 4.5 V and 5.5 V 10, 11 2.5 11.0 ns 5.0 V 9 4.3 9.3 Propagation delay time, output enable, OE to mQ output 3003 tPZL6/ CL= 50 pF minimum RL= 500 See figure 4 4.5 V and 5.5 V 10, 11 3.5 11.5 ns 5.0 V 9 2.2 5.6 tPHZ6/ 4.5 V and 5.5 V 10, 11 1.5 7.2 ns 5.0 V 9 1.7 5.2 Propagation delay tim

47、e, output disable, OE to mQ output 3003 tPLZ6/ CL= 50 pF minimum RL= 500 See figure 4 4.5 V and 5.5 V 10, 11 1.0 7.0 ns 5.0 V 9 2.5 Setup time, high or low, data before LE ts7/ 4.5 V and 5.5 V 10, 11 2.5 ns 5.0 V 9 4.0 Hold time, high or low, data after LE th7/ CL= 50 pF minimum RL= 500 See figure 4

48、 4.5 V and 5.5 V 10, 11 4.0 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95835 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits