DLA SMD-5962-93147 REV B-2013 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate to current requirements as specified in MIL-PRF-38535. jak 07-05-03 Thomas M. Hess B Update the boilerplate paragraphs to current requirements as specified in MIL-PRF-38535. jwc 13-09-07 Thomas M. Hess REV SHEET REV B B B B

2、 SHEET 15 16 17 18 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen THIS DRAWING

3、IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Thomas M. Hess MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-05-31 AMSC N/A

4、 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-93147 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E384-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93147 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVIS

5、ION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the P

6、art or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93147 01 M R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class

7、designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PR

8、F-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABT534 Octal edge-triggered D-type f

9、lip-flop with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 co

10、mpliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style

11、 R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q, and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo

12、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93147 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc

13、 DC input voltage range (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) (VIN= 0.0 V) -18 mA DC output clamp current (IOK) (VOUT= 0.0 V) -50 mA DC output current (IOL) (per output pin) . +96 mA Storage temperature range (TSTG) -6

14、5C to +150C Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C Maximum power dissipation (PD) . 500 mW 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input volt

15、age range (VIN) . +0.0 V dc to VCC Output voltage range (VOUT) +0.0 V dc to VCCMaximum low level input voltage (VIL ) 0.8 V Minimum high level input voltage (VIH ) . 2.0 V Case operating temperature range (TC) -55C to +125C Maximum input rise and fall rate (t/V) . 5 ns/V Maximum high level output cu

16、rrent (IOH) -24 mA Maximum low level output current (IOL) . +48 mA 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced t

17、o GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. Provided by IHSNo

18、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93147 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handboo

19、ks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Ma

20、nufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standa

21、rd Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing

22、and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V

23、shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in

24、accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, app

25、endix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. T

26、he logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5.

27、3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Provided by

28、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93147 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shal

29、l be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feas

30、ible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in a

31、ccordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of co

32、mpliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be lis

33、ted as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requiremen

34、ts of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided wi

35、th each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.

36、3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at

37、the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 127 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

38、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93147 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless othe

39、rwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOH1For all inputs affecting output under test, IN= VIHor VILVIH= 2.0 V, VIL= 0.8 V IOH= -3 mA All 4.5 V 1, 2, 3 2.5 V VOH2For all inputs affecting output under test, IN= VIHor VILVIH= 2.0 V, VIL=

40、0.8 V IOH= -3 mA All 5.0 V 1, 2, 3 3.0 V VOH3For all inputs affecting output under test, IN= VIHor VILVIH= 2.0 V, VIL= 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 V Low level output voltage 3007 VOLFor all inputs affecting output under test, IN= VIHor VILVIH= 2.0 V, VIL= 0.8 V IOL= 48 mA All 4.5 V 1, 2,

41、 3 0.55 V Three-state output leakage current high 3021 IOZH4/ 5/ For control inputs affecting output under test, VIN= VIHor VILVIH= 2.0 V VIL= 0.8 V VOUT= 2.7 V All 5.5 V 1, 2, 3 10.0 A Three-state output leakage current low 3020 IOZL4/ 5/ For control inputs affecting output under test, VIN= VIHor V

42、ILVIH= 2.0 V VIL= 0.8 V VOUT= 0.5 V All 5.5 V 1, 2, 3 -10.0 A Negative input clamp voltage 3022 VIC-For input under test, IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V Off-state leakage current IOFFFor input or output under test, VINor VOUT= 4.5 V All other pins at 0.0 V All 0.0 V 1 100 A High-state leakage

43、current ICEXFor output under test, VOUT= 5.5 V Outputs at high logic state All 5.5 V 1, 2, 3 50 A Input current high 3010 IIHFor input under test, VOUT= VCCAll 5.5 V 1, 2, 3 +1.0 A Input current low 3009 IILFor input under test, VOUT= GND All 5.5 V 1, 2, 3 -1.0 A Output current 3011 IO6/ VOUT= 2.5 V

44、 All 5.5 V 1, 2, 3 -50 -200 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93147 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR

45、97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current delta, TTL input levels 3005 ICC7/ F

46、or input under test, VIN= 3.4 V For all other inputs, VIN= VCCor GND All 5.5 V 1, 2, 3 1.5 mA Quiescent supply current, output high 3005 ICCHVIN= VCCor GND IOUT= 0 A All 5.5 V 1, 2, 3 250 A Quiescent supply current, output low 3005 ICCLVIN= VCCor GND IOUT= 0 A All 5.5 V 1, 2, 3 30 mA Quiescent suppl

47、y current, output three-state 3005 ICCZVIN= VCCor GND IOUT= 0 A All 5.5 V 1, 2, 3 250 A Input capacitance 3012 CINVIN= 2.5 V or 0.5 V TC= +25C See 4.4.1c All 5.0 V 4 10.5 pF Output capacitance 3012 COUTVIN= 2.5 V or 0.5 V TC= +25C See 4.4.1c All 5.0 V 4 17.0 pF Low level ground bounce noise VOLP8/ V

48、IH= 3.0 V VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 All All 5.0 V 4 500 mV VOLV8/ All All 5.0 V 4 -1200 mV High level VCCbounce noise VOHP8/ All All 5.0 V 4 1450 mV VOHV8/ All All 5.0 V 4 -400 mV Functional tests 3014 9/ VIL= 0.8 V VIH= 2.0 V Verify output VOSee 4.4.1b All 4.5 V 7, 8 L H All 5.5 V 7, 8 L H See foot notes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93147 DLA LAND AND MARITIME COLUMBUS, OHIO 4