DLA SMD-5962-89517 REV A-1994 MICROCIRCUIT DIGITAL CMOS 16-BIT SLICE MICROPROCESSOR MONOLITHIC SILICON《硅单片16位片状微处理器互补型金属氧化物半导体数字微电路》.pdf

《DLA SMD-5962-89517 REV A-1994 MICROCIRCUIT DIGITAL CMOS 16-BIT SLICE MICROPROCESSOR MONOLITHIC SILICON《硅单片16位片状微处理器互补型金属氧化物半导体数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89517 REV A-1994 MICROCIRCUIT DIGITAL CMOS 16-BIT SLICE MICROPROCESSOR MONOLITHIC SILICON《硅单片16位片状微处理器互补型金属氧化物半导体数字微电路》.pdf（25页珍藏版）》请在麦多课文档分享上搜索。

1、m b 0055676 TIT DEFENSE LOGISTICS AGENCY DEFENSE ELECTRONICS SUPPLY CENTER 1507 WILMINGTON PIKE DAYTON,.OH 45444- 5 765 NRoicY REFOI10: DESC-ELDC (Mr. Hess/(AV 986) 513-296-8526/tmh) 81 MY 1994 SUBJECT: Notice of Revision (NOR) 5962-R184-94 for Standardized Military Drawing (SMD) 5962-89517. Militar

2、y/Industry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. completion, the NOR should be attached to the subject SMD for

3、 future reference. After Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DESC a certificate of compliance. This is evidenced by an existing active current certificate of compliance on fi

4、le at DESC along with a DESC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DESC is otherwise notified. DESC has received and accepted a certificate of compliance from Logic Devices, Cage code 65896, for PINS 5962

5、-8951701ZX, 5962-8951701UX, 5962-8951701TX and vendor similiar part numbers L29C101GMB45, L29C101RMB45, L29ClOlDMB45, respectively. This action will be reflected in the next revision of MIL-BUL-103. If you have comments or questions, please contact Tom Hess at (AV)986-8526 /(513)296-8526. 1 Encl MON

6、ICA L. POELKING Chief, Custom Microelectronics Branch Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-= b 0055677 756 MICROCIRCUIT, DIGITAL, CWS, 16-BIT SLICE MICROPROCESSOR, MONOLITHIC SILICON NOTICE OF REVISION (NOR) a. CURRENT b. NEU Initial A I 9

7、4-05-09 This revision described below has been authorized for the docunent listed. a. (X one) Pliblic rTrting burden for this collection is estimated to average 2 hours per res the time or revicwi data necdcd and catting and reviewing the collection of inforinetton. Send caaimts regarding this burde

8、nestimate or other aspect of this collection of information inclubing suggestions for reuci for Inf m%On Operatis Services, Directorate et Paperwork Reduction Prokt (0%-0!88, X (1) Existing docunent sqplemented by the NOR may be used in manufacture. (2) Revised docunent must be received before manuf

9、acturer may incorporate this change. (3) Custodian of master docunent shall make above revision and furnish revised docunent. . - -. . b. ADDRESS (Street, City, State, Zip Code) 5. CAGE CODE 4. ORIGINATOR b. ACTJVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DESC-ELDC 7. CAGE CODE Defense Electron

10、ics Supply Center 1507 Ui lnington Pike 45664-5765 Last) c. TYPED NAME (First, Middle Initial, Last) Monica L. Poelking I I 9. TITLE OF DOCUIENT 10. REVISION LETTER d. TITLE Chief, Custom Microelectronics 15a. ACTIVITY ACCOMPLISHING REVISION DESC-ELDC Form wroved NO. 0704-0188 e. SIGNATURE f. DATE S

11、IGNED (YYMD) Monica L. Poelking 94-05-09 b. REVISION COnPLETED (Signature) c. DATE SIGNED (YYMMDD) Thomas M. Hess 94- 05-09 2. PROCURING ACTIVITY NO. 3. DODMC 6. NOR NO. 5962-Rl4-94 8. DOCUIENT NO. 5962-89517 11. ECP NO. Sheet 1: Revisions ltr col=; add W1. Revisions description colum; add “Changes

12、in accordance with NOR 5962-R184-94I8. Revisions date colum; edd H94-OS-091. Revision level block; add W1. Rev status of sheets; For sheets 1, 2, 15 add IW. Paragraph 1.2.2 Case outline. Add: T Change revision status of sheet to Wl Sheet 2: 0-13 (64-lead, 3.2401 x .92011 x .2251i1, dual-in-line pack

13、age Sheet 15: Figure 3. Terminal connections. Change from: Case outline X Change revision status of sheet to Wl to: Case outline X, T (2 places) 14. THIS SECTION FOR GOVERNMENT USE ONLY I I W Form 1695, APII 92 Previous editions are obsolete Provided by IHSNot for ResaleNo reproduction or networking

14、 permitted without license from IHS-,-,-m 9999996 0055b78 892 m THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPAFfTMENT OF DEFENCE AMSC NIA 7-Y9-/7 SIZE CMECOOE D dlsirlbulion Is unlimiled. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

15、nse from IHS-,-,-9999996 0055679 729 I 1. SCOPE 1.1 SCO e. This drawi ngndescri bec device requirements for cl ass B mi croci rcui ts in accordance with l. e.g., 10s. I STANDARDIZED SIZE MILITARY DRAWING A 5962-89517 DEFENSE ELECTRONICS SUPPLY CEHER SHEET MYTON, OHIO 45444 2 1.2 Part number. The com

16、plete part number shall be as shown in the following example: 5962-89517 o1 X X I -I- l- -r I 1 I I I I I I 1 I I 1 Drawing number bevice type Case outline lead finish per (1.2.1) (1.2.2) MIL-M-38510 I 1.2.1 Device types. The device types shall identify the circuit function as follows: Cycle time De

17、vice type Generic number Ci rcui t function o1 02 1.2.2 Case outlines. I as follows: 7C9101-45 16-bi t microprocessor slice 45 ns 7C 9 101 - 3 5 35 ns The case outlines shall be as designated in appendix C of MIL-M-38510, and 16-bit microprocessor slice Outline letter Case out1 ine U X Y 2 1.3 Absol

18、ute maximum ratings. See figure 1 (64-lead, .915“ x .915“ x .090“), quad flat package See figure 2 (64-lead, 3.240“ x .920“ x .225“), dual-in-line package C-7 (68-terminal, .962“ x .962“ x .120“), square chip carrier package P-BC (68-pin, 1.135“ x 1.135“ x .345“), pin grid array Supply voltage range

19、 - - - - - - - - - - - - - - - DC voltage applied to outputs in high Z state - - - DC output current - - - - - - - - - - - - - - - - - Maximum power dissipation i/ - - - - - - - - - - - Lead temperature (soldering, 10 seconds) - - - - - Thermal resistance, junction-to-case (81: DC input voltage - -

20、- - - - - - - - - - - - - - - Caseu . Casex . Cases Y and Z - - - - - - - - - - - - - - - - - - Junction temperature (TJ) - - - - - - - - - - - - - Storage temperature range - - - - - - - - - - - - - 1.4 Recommended operating conditions. Supply voltage range (Vcc) - - - - - - - - - - - - Input high

21、voltage range (VI - - - - - - - - - - input low voltage range VIL - - - - - - - - - - - Case operating temperature range (TC) - - - - - - - -0.5 V dc to t7.0 V dC -0.5 Y dc to +7.Q Y dC -3.0 V dC to t7.0 V dC 30 mA 1.0 w +300“C 28“C/W See MIL-M-38510, appendix C +175“C -65C to +15OoC 22“c/w t4.5 V d

22、c to +5.5 V dc 2.0 Y dc to 6.0 V dc -55C to +125“C -0.5 V dC to t0.8 V dc Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-= 999999b 0055680 440 SUE A 5962-89517 STANDARDIZED MILKARY DRAWING EFENSEELECTRONICSSUPPLYCM SHEET oAYToN,oHoHK)45444 3 L 2. AP

23、PLICABLE DOCUMENTS 2.1 Government specification and standard. Unless otherwise specified, the following specification and standard, of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the e

24、xtent speci fi ed herei n . I SPECIFICATION MILITARY MI L-M- 38510 - Microcircuits, General Specification for. STANDARD MIL ITARY MIL-STO-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with specific acquisitio

25、n functions should be obtained from the contracting activity or as directed by the contracting activity. 1 references cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. 3. REQUIREMENTS 3.1 In the event of a conflict between the text of this drawing and the Item re

26、quirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as Specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dime

27、nsions shall be as specified in MIL-M-38510 and herei n . I 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 3. 3.2.2 Functional block diagram. The functional block diagram shall be as specified on figure 4. 3.2.3 Case outlines. The case outlines shall be in accor

28、dance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are as specified in table I and apply over the full case operating temperature range. 3.4 Markin . Marking shall be in accordance with MIL-STD-883 (see 3.1 here

29、in). The part shall be marked -rit w t the part number listed in 1.2 herein. In addition, the manufacturers part number may also be marked as listed in 6.5 herein. in order to be listed as an approved source of supply in 6.5. submitted to DESC-ECS prior to listing as an approved source of supply sha

30、ll state that the manufacturers product meets the requirements of MIL-ST-883 (see 3.1 herein) and the requirements herein. herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.5 Certificate of compliance. A certificate of compliance shall be required from a manufactu

31、rer The certificate of compliance 3.6 Certificate of confonnance. A certificate of conformance as required in MIL-STD-883 (see 3.1 I 3.7 Notification of change. Notification of change to DESC-ECS shall be required in accordance with MIL-STD-883 1 see 3,5 herein). I I . ! Provided by IHSNot for Resal

32、eNo reproduction or networking permitted without license from IHS-,-,-b 0055b8L 387 TABLE I. Electrical performance characteristics. I I I I I I I I -55C 45444 7 I I I ir U. 5. OWEWMENT PRINTIN0 OmE lW-%.Ry DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted wi

33、thout license from IHS-,-,-W 7b 0055685 T22 W TABLE I. Electrical performance characteristics - Continued. I I I I I I I I type I subgroupsf-f-r I I 4.5 v 7 VCCC 5.5 v I I I Min I Max I I junless therwTse specified1 ,I I 1 I I I I I I I I I tp15 I O1 19, 10, ill I 37 I ns I- I IiI Test ISymbol I Con

34、ditions IDevicel Group A I Limits I Unit I -55C * OVERFLOW OUTPUT MULTIPLEXER y 15-0 DATA OUT FIGURE 4. Block diaaram. ESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-9999996 0055b95 971 +5 v t5v cLs All outputs except open drain

35、 Open drain (F = O) NOTES : 1. 2. CL = 50 pF includes scope probe, wiring, and stray capacitance. CL = 5 pF for output disable tests. FIGURE 5. AC loading test circuits and waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-W 9999996 0055bb 8

36、08 StE A STANDARDIZED I .5V J k SAME PHASE INPUT TRANSITION 5962-8951 7 OUTPUT OPPOSITE PHASE - INPUT TRANSITION Propagation delay time wavefz. OUTPUT NORMALLY LOW OUTPUT NORM ALLY HIGH -0v 0.5V NOTE: Diagram shown for input enable-low and input control disable-high. Output enable and disable times

37、waveforms. FIGURE 5. AC loading test circuits and waveforms - Continued. DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-W 9999996 0055697 744 I STANDARDIZED MILITARY DRAWING 3.8 Verification and review. DESC, DESCs agent, and t

38、he acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. I SIZE A 5962-89517 I 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and in

39、spection procedures shall be in accordance with section 4 of MIL - M 38310 to the extent specified in MIL-STO-883 (see 3.1 herein). I 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. shall

40、apply: The following additional criteria I I a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) TA = +125OC, minimum. b. Interim and final electrical test parameters shall be as specified in tabl

41、e II herein, except interim electrical parameter tests prior to burn-In are optional at the discretion of the manufacturer. I 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL - STO 883 i ncluding groups A, B, C, and D inspections. crit

42、eria shall apply. The following additional 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. I b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CIN/$UT measurement) shall be measured only for the initial test and after process or

43、 design changes which may affect input/output capacitance. A minimum sample size of five devices with zero rejects shall be required. I d. Subgroups 7 and 8 shall verify the instruction set. The instruction set forms a part of the of the vendors test tape and shall be maintained and available from t

44、he approved sources of supply. I I 4.3.2 Groups C and D inspections. I a. End-point electrical parameters shall be as specified in table II herein. I b. Steady-state life test, method 1005 of MIL-STO-883 conditions: (1) Test condition C or D using the circuft submitted with the certificate of compli

45、ance (see 3.5 herein). I (2) TA = +125OC, minimum. (3) Test duration: 1,000 hours, except as pernitted by method 1005 of MIL-STD-883. I I DEFENSE ELECTRONICS SUPPLY CENTE MYTON. OH0 45444 I 7n I REV“ LEVEL b I I I -v t U. S. QOVERNMEM PRINTIM OFFEE 18M-YO-8M DESC FORM 193A SEP 87 Provided by IHSNot

46、for ResaleNo reproduction or networking permitted without license from IHS-,-,-I STANDARDIZED MILTTAW DRAWING DEFENSE ELECTRONICS SUPPLY CENTER TABLE II. Electrical test requirements. _ SIZE A 5962-89517 I RMSIONLEVEL I SHEET I I I i MIL-STD-883 test requirements i Subgroups i 1 1 (per method 1 I 50

47、05, table I) I I I I I I I I r i i interim electrical parameters i - 1 (method 5004) I I I (method 5004) I I I I Final electrical test parameters I 1*,2,3,7,8,9 I I Group A test requirements i 1,2,3,4,78, i I (method 5005) I 9,10,11 I I I Groups C and D end-point 1 1,2.3 I I electrical parameters I

48、I I (method 5005) I I * PDA applies to subgroups 1 and 7. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with 6. NOTES IIL-M-38510. 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military ;pecificatfons do not exis

49、t and qualified mllitary devices that will perform the required function ire not available for OEM application. When a military specification exists and the product covered )y this drawing has been qualified for listing on QPL-38510, the device s ecified herein will be inactivated and will not be used