DLA SMD-5962-87750 REV A-2010 MICROCIRCUIT DIGITAL ECL 3 INPUT 2-NOR 1-OR GATE MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - gap 10-01-07 Charles F. Saffle The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6

2、7 8 9 10 11 PMIC N/A PREPARED BY Christopher A. Rauch DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Ray Monnin APPROVED BY Michael

3、 A. Frye MICROCIRCUIT, DIGITAL, ECL, 3 INPUT, 2-NOR/1-OR GATE, MONOLITHIC SILICON DRAWING APPROVAL DATE 88-07-22 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-87750 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E431-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without l

4、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87750 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in

5、 accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87750 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circui

6、t function as follows: Device type Generic number Circuit function 01 10612 3 input 2-NOR/1-OR gate 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line package

7、F GDFP2-F16 or CDFP3-F16 16 Flat package 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VCC= 0.0 V) . -8.0 V dc to 0.0 V dc Input voltage range . 0.0 V dc to -5.2 V dc St

8、orage temperature range . -65C to +175C Lead temperature (soldering 10 seconds) . +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 274 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage (VEE) -5.46 V dc minimum to -4

9、.94 V dc maximum Ambient operating temperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C . -0.780 V TA= +125C . -0.630 V TA= -55C -0.880 V Maximum low-level input voltage (VIL): TA= +25C . -1.850 V TA= +125C . -1.820 V TA= -55C -1.920 V Provided by IHSNot for Resale

10、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87750 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks.

11、 The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manuf

12、acturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard

13、Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of th

14、is drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in acco

15、rdance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-

16、38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications s

17、hall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The

18、design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The

19、 truth table shall be as specified on figure 2. 3.2.4 Test circuit. The ac parameters shall be tested using the test circuit as specified on figure 3, or an equivalent test circuit. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characterist

20、ics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for

21、ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87750 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix

22、A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Cert

23、ification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option i

24、s used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall a

25、ffirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8

26、Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore docu

27、mentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall b

28、e conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition D or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made

29、available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test paramet

30、ers shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-877

31、50 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C Unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F, and 2 Quiescent tests 1/ 2/ VI

32、HVILHigh level output voltage VOHOutputs terminated -0.780 -1.850 1 -0.930 -0.780 V through -0.630 -1.820 2 -0.825 -0.630 100 to -2 V -0.880 -1.920 3 -1.080 -0.880 Low level output voltage VOLVCC= 0.0 V -0.780 -1.850 1 -1.850 -1.620 V EE= -5.2 V -0.630 -1.820 2 -1.820 -1.545 3/ -0.880 -1.920 3 -1.92

33、0 -1.655 High level threshold VOHA-1.105 -1.475 1 -0.950 -0.780 V output voltage -1.000 -1.400 2 -0.845 -0.630 -1.255 -1.510 3 -1.100 -0.880 Low level threshold VOLA-1.105 -1.475 1 -1.850 -1.600 V output voltage -1.000 -1.400 2 -1.820 -1.525 -1.255 -1.510 3 -1.920 -1.635 Power supply drain current I

34、EEVEE= 5.2 V 1 -38 mA VCC= 0.0 V 2, 3 -42 VIH= -0.780 V at +25C High level input current IIH-0.630 V at +125C 1 410 A -0.880 V at -55C 2, 3 700 Low level input voltage IILVEE= -5.2 V 1, 3 0.5 A VCC= 0.0 V VIL= -1.850 at +25C 2 0.3 -1.820 at +125C -1.920 at -55C See footnotes at end of table. Provide

35、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87750 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continu

36、ed. Test Symbol Conditions -55C TA +125C Unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F, and 2 Ac tests Transition time tTLH, VEE= -3.2 V VCC= 2.0 V CL 5 pF RL= 100 See figure 3 4/ 9 1.0 2.5 ns tTHL10 1.0 3.011 1.0 2.9Propagation delay time tPLH1, 9 1.0 2.5 ns tPHL1, 10

37、1.0 3.0tPLL1, 11 1.0 2.9tPHH1tPLH2, 9 1.0 2.5 ns tPHL2, 10 1.0 3.0tPLL2, 11 1.0 2.9tPHH21/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blo

38、wing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. 2/ The T test method creates the limits and test conditions to be used after an increased ambient temperature has been stab

39、ilized by external thermal sources. This adjusted temperature simulates the quiescent method by increasing the specified case temperature (+25C, +125C, -55C) with a T. The T is theoretically determined based on the power dissipation and thermal characteristics of the device and package used. 3/ The

40、high and low level output current varies with temperature, and can be calculated using the following formula: IOH= (VOH- 2 V)/100 and IOL= (VOL- 2 V)/100 . 4/ CLincludes the scope probe, wiring, and stray capacitance without the package in the test fixture. tPHHis measured from the midpoint of a hig

41、h input to the midpoint of a high output. tPLLis measured from the midpoint of a low input to the midpoint of a low output. Voltage waveforms for tPHLand tPLHshall be in accordance with method 3003 of MIL-STD-883 with the transition point being 50 percent of the maximum input or output voltage. Volt

42、age waveforms for tTLHand tTHLshall be in accordance with method 3004 of MIL-STD-883, with measurement points at 20 percent and 80 percent. See test circuit, figure 3. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

43、 A 5962-87750 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Terminal Terminal symbol number Case E Case F Case 2 1 VCC12Y2$ $ $ $NC 2 1Y1 2Y1 VCC13 1Y2$ $ $ $VCC11Y1 4 1Y3$ $ $ $VCC21Y2$ $ $ $5 1A VCC11Y3$ $ $ $6 1B 1Y1 NC 7 1C 1Y2$ $ $ $1A 8

44、 VEE1Y3$ $ $ $1B 9 2A 1A 1C 10 2B 1B VEE11 2C 1C NC 12 2Y3$ $ $ $VEE 2A 13 2Y2$ $ $ $2A 2B 14 2Y1 2B 2C 15 VCC12C 2Y3$ $ $ $16 VCC22Y3$ $ $ $NC 17 2Y2$ $ $ $18 2Y119 VCC120CC2NC = No connection FIGURE 1. Terminal connection. Provided by IHSNot for ResaleNo reproduction or networking permitted withou

45、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87750 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Inputs Outputs 1A 1B 1C 2A 2B 2C 1Y1 1Y2$ $ $ $1Y3$ $ $ $2Y1 2Y2$ $ $ $2Y3$ $ $ $L L L L L L L H H L H H H L L L L L H L L L

46、H H L H L L L L H L L L H H L L H L L L H L L L H H L L L H L L L H H H L L L L L L H L L H H H L L L L L L L H L H H H L L L L L L L L L H H L H H H = High level voltage L = Low level voltage NOTE: This is not strictly a functional truth table, it does not cover all possible modes of operation. How

47、ever it gives a sufficient number of tests to ensure that the device will function properly in all modes of operation. FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87750 DEFENSE SUPP

48、LY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. All power supply levels are shown shifted 2 volts positive. 2. Pulse generator must be capable of rise and fall times of 2.0 ns. 3. 50 resistor in series with 50 coaxial cable constitutes the 100 load. FIGURE 3. Test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87750 DEFENSE SUPPLY CENTER