DLA SMD-5962-78020 REV V-2010 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL LINE RECEIVER MONOLITHIC SILICON.pdf

《DLA SMD-5962-78020 REV V-2010 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL LINE RECEIVER MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-78020 REV V-2010 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL LINE RECEIVER MONOLITHIC SILICON.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED G Convert to SMD format. Add vendor CAGE 01295. Add device types 03 and 04. 87-07-28 M. A. Frye H Convert to one part-one part number format. Technical changes to 1.3, 4.2, and tables I and II. Add device type 05. Add vendor CAGE 18324 and 27014. A

2、dd figures 2 and 3. 91-07-05 M. A. Frye J Changes in accordance with N.O.R. 5962-R061-92. 91-11-22 M. L. Poelking K Redrawn with changes. Add device type 06. 95-10-31 M. A. Frye L Changes in accordance with N.O.R. 5962-R089-96. 96-03-28 M. A. Frye M Redrawn with changes to table I for device type 05

3、. - drw 97-10-14 R. Monnin N Add radiation hardened information. - drw 99-05-25 R. Monnin P Make changes to 3.1, 3.5.1, and 6.6.3. - ro 00-02-15 R. Monnin R Add radiation hardness assurance level R devices. - ro 00-08-08 R. Monnin T Add case outline Z. - ro 01-05-03 R. Monnin U Make a change to 6.6.

4、3 and footnote 3/ as specified under the BULLETIN SHEET. - ro 07-07-17 R. Heber V Add device type 07. Editorial changes throughout. drw 10-03-03 Charles F. Saffle CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV V V V SHEET 15 16 17 REV STATUS REV V V

5、V V V V V V V V V V V V OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles E. Besore COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTM

6、ENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, QUAD DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 79-01-26 AMSC N/A REVISION LEVEL V SIZE A CAGE CODE 14933 78020 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E183-10 Provided by IHSN

7、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL V SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class

8、levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflect

9、ed in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 R 78020 01 Q E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. De

10、vice classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a

11、 non-RHA device. 1.2.2 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 26LS32 Quad, differential line receiver 1/ 02 26LS33 Quad, differential line receiver 2/ 03 26LS32A Quad, differential line receiver 1/ 04 26LS33A Quad, diff

12、erential line receiver 2/ 05 26F32 Quad, differential line receiver 1/ 06 26LS32 Quad, differential line receiver 1/ 07 26LS33A Quad, differential line receiver 2/ 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device

13、 class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are

14、as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat package Z GDFP1-G16 16 Flat pack with gullwing leads 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. Th

15、e lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. _ 1/ Input voltage range (differential or common mode) 7 V. Input sensitivity 200 mV. 2/ Input voltage range (differential or common mode) 15 V. Input sensitivity 500 mV. Provid

16、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL V SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 3/ Power supply voltage (VCC) .

17、 7.0 V dc Common mode range . 25 V dc Differential input voltage . 25 V dc Enable voltage 7.0 V dc Output sink current . 50 mA Storage temperature range . -65C to +150C Power dissipation (PD) 500 mW 4/ Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +150C Thermal resista

18、nce, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Device types Device type 01-04, 06, 07 05_ Case outline E . 100C/W 100C/W Case outlines F and Z . 140C/W 142C/W Case outline 2 . 130C/W 87C/W 1.4 Recommended operating conditions. Supply voltage range (VCC) . +

19、4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL) . 0.8 V dc Input hysteresis (VHYST) 50 mV typical Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 50 - 300 rads (Si)/

20、s) 100 Krads(Si) 5/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solic

21、itation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT O

22、F DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Phila

23、delphia, PA 19111-5094.) _ 3/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 4/ Must withstand the added PDdue to short circuit test, e.g., IOS. 5/ These parts may be dose r

24、ate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A.Provided by IHSNot for ResaleNo reproduction or networking permitted

25、without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL V SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the te

26、xt of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-385

27、35 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix

28、 A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

29、3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 2. 3.2.4 Radia

30、tion exposure circuit. The radiation exposure circuit shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specifie

31、d in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with

32、the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA

33、designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML” or

34、 “Q” as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C” as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the r

35、equirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an ap

36、proved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of confo

37、rmance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of produc

38、t (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable

39、required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 53 (see MIL-PRF-38535, appendix A). 3.11 PIN super

40、session information. The PIN supersession information shall be as specified in the appendix. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION

41、LEVEL V SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ Group A Device Unit -55C TA +125C subgroups type Limits unless otherwise specified Min Max Differential input voltage sensitivity VTHVOUT= VOLor VOH, 1, 2, 3 01,03, 05,06 -0.2 +0.2 V -

42、7 V VCM +7 V M,D,P,L,R 1 05 -0.2 +0.2 VOUT= VOLor VOH, 1, 2, 3 02,04, -0.5 +0.5 -15 V VCM +15 V 07 Input resistance 3/ RIN-15 V VCM +15 V 4, 5, 6 01,02 6.0 k (one input ac ground) 06 03,04,07 12.0 05 14.0 Input current (under test) IINVIN= +15 V, 1, 2, 3 01,02, 2.3 mA (other input -15 V VIN 15 V) 05

43、,06 M,D,P,L,R 1 05 2.3 VIN= -15 V, 1, 2, 3 01,02, -2.8 (other input -15 V VIN 15 V) 05,06 M,D,P,L,R 1 05 -2.8 VIN= +15 V, 1, 2, 3 03,04 2.3 (other input -10 V VIN 15 V) 07 1.2 VIN= -15 V, 03,04 -2.8 (other input -15 V VIN 10 V) 07 -1.7 Output high voltage (3006) VOHVCC= 4.5 V, VIN= 1.0 V, VENABLE= 0

44、.8 V, IOH= -440 A 1, 2, 3 All 2.5 V M,D,P,L,R 1 05 2.5 Output low voltage (3007) VOLVCC= 4.5 V, IOL= 4.0 mA, VENABLE= 0.8 V, VIN= -1.0 V 1, 2, 3 All 0.4 V M,D,P,L,R 1 05 0.4 VCC= 4.5 V, IOL= 8.0 mA, 1, 2, 3 All 0.45 VENABLE= 0.8 V, VIN= -1.0 V M,D,P,L,R 1 05 0.45 See footnotes at end of table. Provi

45、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL V SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Continued.

46、Test Symbol Conditions 1/ 2/ Group A Device Unit -55C TA +125C subgroups type Limits unless otherwise specified Min Max Enable low voltage VILVCC= 5.5 V 4/ 1, 2, 3 All 0.8 V Enable high voltage VIHVCC= 4.5 V 4/ 1, 2, 3 All 2.0 V Enable clamp voltage (3022) VICVCC= 4.5 V, IIN= -18 mA 4/ VCC= 5.5 V 1,

47、 2, 3 All -1.5 V Off-state (high impedance) output output current (3021) IOVCC= 5.5 V, VO= 2.4 V 1, 2, 3 All 20 A M,D,P,L,R 1 05 20 VCC= 5.5 V, VO= 0.4 V 1, 2, 3 All -20 M,D,P,L,R 1 05 -20 Enable low current (3009) IILVIN= 0.4 V, VCC= 5.5 V 5/ 1, 2, 3 All -0.36 mA Enable high current sensitivity (30

48、10) IIHVIN= 2.7 V, VCC= 5.5 V 5/ 1, 2, 3 All 20 A Output short circuit current (3011) IOSVO= 0 V, VCC= 5.5 V, 6/ VIN= 1.0 V 1, 2, 3 All -15 -85 mA Supply current (3005) ICCVCC= 5.5 V, data inputs = GND, 1, 2, 3 01-04, 70 mA outputs disabled 06,07 05 50 M,D,P,L,R 1 05 50 Enable input high current IIVIN= 5.5 V, VCC= 5.5 V 5/ 1, 2, 3 01-04, 100 A 06,07 05 -10 50 Propagation delay, input to output (3003) tPLHVCC= 5.0 V, CL= 15 pF, 9 01,02 25 ns see figure 2 10, 11 38 9 03,04, 35 10, 11 07 53 CL= 50 pF 9 05 23 10, 11 31 See footnotes at end