DLA DSCC-VID-V62 11601 REV B-2013 MICROCIRCUIT LINEAR SINGLE 9 AMP HIGH SPEED LOW SIDE MOSFET DRIVER WITH ENABLE MONOLITHIC SILICON.pdf
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1、 REVISIONS LTR DESCRIPTION DATE APPROVED A Add device type 02 and case outline Y. - ro 13-02-14 C. SAFFLE B Make correction to ENBL pin and IN pin input voltage, delete -5 V and substitute -0.3 V as specified under paragraph 1.3. Delete power dissipation limit entirely from paragraph 1.3. - ro 13-05
2、-01 C. SAFFLE Prepared in accordance with ASME Y14.24 Vendor item drawing REV PAGE REV PAGE REV STATUS OF PAGES REV B B B B B B B B B B B B B B B B PAGE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.
3、dla.mil/ Original date of drawing YY-MM-DD CHECKED BY RAJESH PITHADIA TITLE MICROCIRCUIT, LINEAR, SINGLE 9 AMP HIGH SPEED LOW SIDE MOSFET DRIVER WITH ENABLE, MONOLITHIC SILICON 10-10-20 APPROVED BY CHARLES F. SAFFLE SIZE A CODE IDENT. NO. 16236 DWG NO. V62/11601 REV B PAGE 1 OF 16 AMSC N/A 5962-V053
4、-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/11601 REV B PAGE 2 1. SCOPE 1.1 Scope. This drawing documents the general requirements of a high performance single 9 amp
5、 high speed low side metal oxide semiconductor field effect transistor (MOSFET) with enable microcircuit, with an operating temperature ranges of -40C to +105C for device type 01 and -55C to +125C for device type 02. 1.2 Vendor Item Drawing Administrative Control Number. The manufacturers PIN is the
6、 item of identification. The vendor item drawing establishes an administrative control number for identifying the item on the engineering documentation: V62/11601 - 01 X E Drawing Device type Case outline Lead finish number (See 1.2.1) (See 1.2.2) (See 1.2.3) 1.2.1 Device type(s). Device type Generi
7、c Temperature Circuit function 01 UCC27322-EP -40C to +105C Single 9 amp high speed low side MOSFET with enable 02 UCC27322-EP -55C to +125C Single 9 amp high speed low side MOSFET with enable 1.2.2 Case outline(s). The case outline(s) are as specified herein. Outline letter Number of pins JEDEC PUB
8、 95 Package style X 8 MO-187-AA Plastic surface mount Y 8 MS-012-AA Plastic small outline 1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacturer: Finish designator Material A Hot solder dip B Tin-lead plate C Gold plate D Palladium
9、 E Gold flash palladium Z Other Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/11601 REV B PAGE 3 1.3 Absolute maximum ratings. 1/ 2/ Supply voltage range (VDD) . -0.3 V to
10、 16 V Output current (OUT) . 0.6 A Input voltage (VI): IN pin -0.3 V to 6 V or VDD+ 0.3 V (whichever is larger) ENBL pin -0.3 V to 6 V or VDD+ 0.3 V (whichever is larger) Latch up protection . 500 mA Junction operating temperature range (TJ) : Device type 01 . -40C to +150C Device type 02 . -55C to
11、+150C Storage temperature range (TSTG) -65C to +150C 1.4 Recommended operating conditions. 3/ Supply voltage range (VDD) . 4.5 V to 15 V Operating free-air temperature range (TA) : Device type 01 . -40C to +105C Device type 02 . -55C to +125C 1/ Stresses beyond those listed under “absolute maximum r
12、ating” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods m
13、ay affect device reliability. 2/ All voltages are within respect to GND. Currents are positive into and negative out of the specified terminal. 3/ Use of this product beyond the manufacturers design rules or stated parameters is done at the users risk. The manufacturer and/or distributor maintain no
14、 responsibility or liability for product used beyond the stated limits. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/11601 REV B PAGE 4 1.5 Thermal characteristics. Therm
15、al metric Symbol Case X Case Y Unit Thermal resistance, junction-to-ambient 4/ JA161.8 116.3 C/W Thermal resistance, junction-to-case (top) 5/ JC(TOP)56.2 70.8 C/W Thermal resistance, junction-to-board 6/ JB81.1 56.6 C/W Characterization parameter, junction-to-top 7/ JT5.7 22.8 C/W Characterization
16、parameter, junction-to-board 8/ JB79.8 56.1 C/W _ 4/ The thermal resistance, junction-to-ambient under natural convection is obtained in a simulation on a JEDEC standard, High-K board, as specified in JESD51-7, in an environment described in JESD51-2a. 5/ The thermal resistance, junction-to-case (to
17、p) is obtained by simulating a cold plate test on the package top. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. 6/ The thermal resistance, junction-to-board is obtained by simulating in an environment with a ring cold plate fixture to
18、 control the printed circuit board (PCB) temperature, as described in JESD51-8. 7/ Characterization parameter, junction-to-top (JT) estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (se
19、ctions 6 and 7). 8/ Characterization parameter, junction-to-board (JB) estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining JA, using a procedure described in JESD51-2a (sections 6 and 7). Provided by IHSNot for ResaleNo reproduction
20、 or networking permitted without license from IHS-,-,-DLA LAND AND MARITIME COLUMBUS, OHIO SIZE A CODE IDENT NO. 16236 DWG NO. V62/11601 REV B PAGE 5 2. APPLICABLE DOCUMENTS AMERICAN NATIONAL STANDARDS INSTITUTE ANSI SEMI STANDARD G30-88 - Test Method for Junction-to-Case Thermal Resistance Measurem
21、ents for Ceramic Packages (Applications for copies should be addressed to the American National Standards Institute, Semiconductor Equipment and Materials International, 1819 L Street, NW, 6 th floor, Washington, DC 20036 or online at http:/www.ansi.org) JEDEC Solid State Technology Association JEDE
22、C PUB 95 - Registered and Standard Outlines for Semiconductor Devices EIA/JESD51-8 - Integrated Circuits Thermal Test Method Environment Conditions Junction-to-Board EIA/JESD51-2a - Integrated Circuits Thermal Test Method Environment Conditions Natural Convection (Still Air) EIA/JESD51-7 - High Effe
23、ctive Thermal Conductivity Test Board for Leaded Surface Mount Packages. (Applications for copies should be addressed to the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington, VA 22201-3834 or online at http:/www.jedec.org) 3. REQUIREMENTS 3.1 Marking. Parts shall be permanently and l
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