CECC 30 901- 008 CEI CECC 30 901-008 Issue 1 Fixed Polystyrene Film Dielectric d c Capacitors (En)《CEI CECC 30 901-008第一期 聚苯乙烯膜电介质直流固定电容器(英)》.pdf

《CECC 30 901- 008 CEI CECC 30 901-008 Issue 1 Fixed Polystyrene Film Dielectric d c Capacitors (En)《CEI CECC 30 901-008第一期 聚苯乙烯膜电介质直流固定电容器(英)》.pdf》由会员分享，可在线阅读，更多相关《CECC 30 901- 008 CEI CECC 30 901-008 Issue 1 Fixed Polystyrene Film Dielectric d c Capacitors (En)《CEI CECC 30 901-008第一期 聚苯乙烯膜电介质直流固定电容器(英)》.pdf（9页珍藏版）》请在麦多课文档分享上搜索。

1、CECC CECC*30*qOl- 008 * W 1974499 0030589 904 W IIMENSIONS in mm - :OMITATO ELETTROTECNICO ITALIANO 20126 Milano - Viale Monza 259 Telefoni (02) 2550641 (5 linee) Telex: 33207 CEITALIA Telegrammi: Elettrocomit Milano QUICK REFERENCE DATA: Rated cap. range : 47 pF to 34 nF Cap. Tolerance : f 0.625% C

2、ode P 2 1% * F CECC 3090 1-008 I CEI-CECC 30901-008 Issue 1 - Jan 1986 I Lpecification available from: ARCOTRONICS ITALIA S.P.A. 1 pages 9 - :LECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: CECC 30000 - 30900 IETAIL SPECIFICATION FOR FIXED POLYSTYRENE FILM DIELETRIC D.C. :APACITORS: ypi

3、cal construction: Rectangular Solvent resistant case Insulated Radial terminations Intended for printed circuits iefer to Qualified Product List CECC 00200 for details of ianufactures approved to this specification. :omitato Elettrotecnico Italiano (CEI) :omitato Tecnico CE1 40 * Condensatori e resi

4、stori per e 1 e ttronica“ . Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*90L- OOB XX 1974499 0030590 626 CASE SIZE 8 H LI L. 2 P D REF. max max 2 1.5 t 0.4 2 0.

5、3 A 6.25 11 14 20 7.18 5.08 6 7.5 13 12 18 9.18 5.08 C 10 13 12 18 10.74 7.62 TABLE 1 0 +0,05 0.5 0.6 0.6 CASE SIZE REF. all dimensions are in mm Capacitance range (pF) C I A I 47 pF to 10000 pF 1 15000 pF to 34000 pF I B I 47 pF to 16000 pF I 2. SPECI-FIED METHOD OF MOUNTING-,.-FOR VIBRATION AND SH

6、OCK TESTING The component terminations face shall be held firmly against the mounting surface by the solder terminations which shall be of minimum pratica1 lenght. Case sizes to inclusive shall also have their bodies clamped. 3. RATINGS , CHARACTERISTICS Grade 1 Capacitance range see table 2 Capacit

7、ance tolerance see page 1 Category voltage (Vc) up to a5 OC Vc=Vr Rated temperature 85 OC Tangent of loss angle at 1KHz 5 2*10e-4 for C 1OOOpF Insulation resistance 5*10e5 MOhm between terminations Temperature coefficient -(120 2 50) ppm/OC Climatic category 40 / OR5 / 56 Rated voltage (Vr) . 63 V a

8、t 1MHz I 1*10e-3 for C 5 1OOOpF 4. RELATED DOCUMENTS IEC 68 Method for envirommental testing of electronic 2 component and elettronic equipment. CECC 30000 Generic specification for fixed capacitors. CECC 30900 Sectional specification for fixed polystyrene film CECC 30901 Blanck detail specification

9、 for fixed polystyrene CECC O0200 CECC Qualified Product List dielectric d.c. capacators. film dielectric d.c. capacitors. Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC

10、CECC*30*901- O08 * 1974497 0030593 562 m C. MARKING -.-. LNFQRIATTON The following, marking informatinn will be given on the capacitor: - Rated capacitance - Rated voltaEe - Tolerance on rated Capacitance - Year and month of manufacture coded accordinE to IFC 62 - Manufactures series - Dot indicatin

11、E outer foil termination Order for components to this specifications shall contain the following minimum information: - Quantity - Detail specification number - Manufactures type designation - Code for rated voltage (D=63V) - Code for dimension, table 1 - Rated capacitance - Tolerance on rated capac

12、itance 7. QUALIFICATION APPROVAL AND QUA.LITY CONFORMANCE INSPECTION The procedure for quality assessment procedure are given in section 3.3 table 1 of CECC 30.900 and for the performance requirements see table 4A and 48 in this specification. . (=ERTIFIED TEST RECORDS Not required. 3 Copyright CENE

13、LEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*901- O08 * = 1974499 0030592 4T9 TALE 4A. TEST SCHEDULE GRlJPS A AND 3 INSPECTION : LOT RY LOT TESTS CECC 30900 Ref. Examination

14、or test Test method and severity GROLJP A INSPECTION Subgroup AI Visual examination Markinp: Dimensions 4.3 4.4 4.5 4.6 Subgroup A2 Voltage proof 2.5 Vr test point la only 1KHz for C InF 1MHz for Cc InF 1KHz for C InF 1Mhz for Cc InF Test point la) Capacitance 4.10.2 Tangent of loss angle Insulation

15、 resistance clause 4.12 IEC 68 Test Ta Method 3: solder globule at 235 OC GROUP B INSPECTION Suberoup BI Outer foil termination Solderabil i ty )/ND - ND ND - ND D - I I erformance re q u i re men ts lo visible damage darking legible see table 1 10 breakdown zr flashover is permitted Within specif.

16、tolerance. See clause 3 See clause 3 Dot indicating outer foil termination over top surface. IL=Inspection Level;AQL=Acceptdmce quality Leve1;DDestructive ND=Non destructive Inspection Levels (IL) and Acceptable Quality Levels (AQL) are selected from IEC 410. 4 Copyright CENELEC Electronic Component

17、s Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*90L- 008 * m 1974499 0030593 335 m TARLE 48. TEST SCHEDULE GROUP C INSPECTION : PERIODIC TESTS Examination or test GROUP C INSPECTION Subgroup CI Initial

18、 measurements Capacitance Tancent of loss ancyle Insulation resistance Subgroup Clla) Part of sample Robustness of termination Resistance to soldering heat Final measurements Visual examination Capacitance Tangent af loss angle CECC 30900 Ref. 4.9.1 4.4 4.5 4.6 4.9.2 4.9.3 4.9.4 4.2 4.4 Test method

19、and severity IKHz for C InF 1MHz for C InF IMHz for C InF IMHz for C InF IMHz for Cc InF erf ormance -e qu i reme n ts Vithin cpecif. :olerance. See clause 3 See clause 3 JO visible jamage 2ap. chane;e C+(0.3%+0.3pF) see clause 3 p=Periodicity months);n=Sample size;c=Permissible defectives. 5 Copyri

20、ght CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*901- 008 * m 1974499 0030594 271 m Examination or test Subcroup Cl(b) Other part of sample Rapid chante of temperature Vi

21、sual examination Vi bra tion Visual examination Shock Final me asu re me n t c Visual examination Capacitance Tangent of loss angle CECC 30900 Ref. I. 10.3 4.2 I. 10.4 4.2 1.10.5 1.10.6 4.2 4.4 4.5 Test method and severity IEC 68 test Na TA= -40 OC TB= +85 OC Duration:30min. 5 cicles Recovery Ih + 2

22、h IEC 68 Test Fc Procedure : B4 Freq. ranp;e: 10 to 2000 Hz Amplitude ,75mm or 98m/s2 Duration 6h For method of moiintina, see clause 2 IEC 68 Test Ea Acceleration: 490m/s2.0uration of pulse: Ilmcec Method of mounting,see clause 2 1KHz for C InF 1MHz for C$ InF IKHt for C InF 1MHz for C 5 InF - P 6

23、crf ormance -e qui remen ts 40 visible jamage 40 visible jamap;e Yo visible damage 2ap. chanEe :2(0.3%+0.3pF) shall not exceed the value in 3 6 Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without licen

24、se from IHS-,-,-CECC CECC*30*901- 008 * 1974499 0030595 LOB M 3 7 Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*90II- O08 * = II974499 0030596 044 1.12.1 4.4 4.5

25、 4.6 4.12 .12.3 4.2 4.4 4.5 4.6 i. 13.1 4.4 4.5 4.6 4.13 :xamination Ir test ubgroup C2 Initial ieasii reme n tc :apacitance -ange n t of .ocs anqle Insulation -esistanCe )amo heat, ;teadv state inal ne asuremen t s Jisual zxami nation 2apacitance rangent of loss angle Insulation resistance Subgroup

26、 C3 Initial m e a s u r,e m e n t s Capacitance Tangent of loss angle Insulation resistance Endurance D - CECC 30900 Ref. Test method and severity IKHz for C InF IMHz for C InF IMHz for C InF IMHz for Cc InF IKHz for C InF 1MHz for Cc InF Test point Ia) onlv IKHz for C InF 1MHt for Cc 1nF IKHz for C

27、 InF 1MHz for Cc InF Test points la) and IC) Duration: 2000h at 05 oc, 1.5 Vr Performance requirements Within specif. tolerance. See clause 3 ;ee clause 3 lo breakdown Ir flashover .s permitted 40 visible jamace :ap. change f(O.S%+lpF) 2 times the ;alue in 3 50% of ;alue in 3 Within specif. toleranc

28、e. See clause 3 See clause 3 Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*901- 008 Xt m 197qq99 0030597 TAO m ; Exami na t i nn or test Performance requirements

29、 Subqroup C3 (cont d 1 Final measurements Cap. change (+(O. 3%+0.3pF) Shall not exceed the value in 3 50% of Value in 3 Accordine: to clause 3, temp-coeff. Visual examination Capacitance TanRent of loss angle Insulation resistance Subgroup C4 Variation of capacitance with ternperat. n - CECC 30900 R

30、ef. 4.13.3 4.2 4.4 4.5 4.6 4.14 Test method and severity 1KHt for C InF 1MHz for C 1nF IMHz for Cc InF rest point la) 3nly Static method 9 No visible damage Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-