ASTM E1548-2009(2017) Standard Practice for Preparation of Aerospace Contamination Control Plans《航空航天污染控制计划编织的标准实施规程》.pdf

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1、Designation: E1548 09 (Reapproved 2017)Standard Practice forPreparation of Aerospace Contamination Control Plans1This standard is issued under the fixed designation E1548; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of

2、 last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice is intended to assist in the preparation offormal plans for contamination control, especially of aerosp

3、acecritical surfaces. Requirements may be established at thesystems level, either by the customer or the systems integrator,or at the subsystem level. Subsystem requirements may beimposed by the responsible subsystem supplier or they may beflowed down from the systems organization (4.7). The extento

4、f detail and level of cleanliness required can vary with theparticular application and type of hardware being built, but allaspects of contamination control must be included in a finalplan. Therefore, each of the following elements must beconsidered for inclusion in a contamination control plan(CCP)

5、:1.1.1 Cleanliness requirements for deliverable hardwareaddressing particulate, molecular, or biological contaminantsor combination thereof. Specify contamination limits and anybudget allocations.1.1.2 Implementation plans to achieve, verify, and maintainthe specified cleanliness requirements. Speci

6、fy material andprocess controls, cleaning techniques, verification tests, pro-tection and prevention plans, transportation controls, andcorrective action for discrepancies.1.1.3 Environmental controls including clean facilities to beused, facility maintenance, and monitoring schedule.1.1.4 Personnel

7、 and operational controls including operat-ing procedures, restrictions, training, motivation, and organi-zational responsibilities including the organization or indi-vidual for implementation and verification of the CCP.1.2 The values stated in SI units are to be regarded asstandard. No other units

8、 of measurement are included in thisstandard.1.3 This international standard was developed in accor-dance with internationally recognized principles on standard-ization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recom-mendations issued by the

9、World Trade Organization TechnicalBarriers to Trade (TBT) Committee.2. Referenced Documents2.1 ASTM Standards:2E595 Test Method for Total Mass Loss and Collected Vola-tile Condensable Materials from Outgassing in a VacuumEnvironmentE1216 Practice for Sampling for Particulate Contaminationby Tape Lif

10、tE1235 Test Method for Gravimetric Determination of Non-volatile Residue (NVR) in Environmentally ControlledAreas for SpacecraftE1549 Specification for ESD Controlled Garments Requiredin Cleanrooms and Controlled Environments for Space-craft for Non-Hazardous and Hazardous OperationsE1559 Test Metho

11、d for Contamination Outgassing Charac-teristics of Spacecraft MaterialsE2042 Practice for Cleaning and Maintaining ControlledAreas and Clean RoomsE2217 Practice for Design and Construction of AerospaceCleanrooms and Contamination Controlled AreasF50 Practice for Continuous Sizing and Counting of Air

12、-borne Particles in Dust-Controlled Areas and CleanRooms Using Instruments Capable of Detecting SingleSub-Micrometre and Larger ParticlesF303 Practices for Sampling for Particles in AerospaceFluids and ComponentsF312 Test Methods for Microscopical Sizing and CountingParticles from Aerospace Fluids o

13、n Membrane Filters2.2 Government Standards:FED-STD-209E Airborne Particulate Cleanliness Classes inCleanrooms and Clean Zones3,4USAF Tech Order 00-25-203 Contamination Control ofAerospace Facilities, U.S. Air Force31This practice is under the jurisdiction of ASTM Committee E21 on SpaceSimulation and

14、 Applications of Space Technology and is the direct responsibility ofSubcommittee E21.05 on Contamination.Current edition approved Sept. 1, 2017. Published October 2017. Originallyapproved in 1993. Last previous edition approved in 2009 as F1548 09. DOI:10.1520/E1548-09R17.2For referenced ASTM stand

15、ards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Available from Standardization Documents Order Desk, Bldg. 4 Section D, 700Robbins Ave

16、., Philadelphia, PA 19111-5094, Attn: NPODS.4FED-STD-209 has been superceded by ISO 14644-1 and -2. It may continue tobe used if mutually agreed to by customer and supplier.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United StatesThis internati

17、onal standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committ

18、ee.12.3 International Standards:5ISO 14644-1 Cleanrooms and Associated ControlledEnvironments, Classification of Air CleanlinessISO 14644-2 Cleanrooms and Associated ControlledEnvironmentsSpecifications for testing and monitoringto prove continued compliance with ISO 14644-1ISO 15388 Space SystemsCo

19、ntamination and CleanlinessControl2.4 IEST Standards:IEST-STD-CC1246D Product Cleanliness Levels and Con-tamination Control Program6NOTE 1The Institute of Environmental Sciences has several Recom-mended Practices which may also be useful in the preparation of a CCP.3. Terminology3.1 Definitions:3.1.

20、1 bidirectional reflectance distribution function(BRDF)the scattering properties of light reflected offsurfaces, expressed as the ratio of differential outputs ofradiance divided by differential inputs of radiance. Surfacecontaminants scatter the incident radiation in all directions andwith variable

21、 intensities; BRDF is a method to quantify thespatial distribution of the scattered energy.3.1.2 biological contaminationliving material such asalgae, bacteria, fungus, and so forth, which is capable ofreproducing, thus being an increasing contaminant source.3.1.3 budget allocationthe itemized summa

22、ry of contami-nation accumulation for a given critical hardware item distrib-uted over all phases from manufacture through end of perfor-mance lifetime.3.1.4 cleanrooman environmentally conditioned areawhere temperature, humidity, and airborne contaminants arecontrolled by design and operation. High

23、 Efficiency ParticulateAir (HEPA) filters or better are usually required to achieve theair cleanliness level. Air particulate cleanliness is classified inaccordance with ISO 14644-1.3.1.4.1 as-built cleanrooma cleanroom that is completeand ready for operation, with all services connected andfunction

24、al, but without equipment or operating personnel in thecleanroom.3.1.4.2 at-rest cleanrooma cleanroom that is complete andready for operation, with all services connected and functional,and with equipment installed and operable, as specified butwithout operating personnel in the cleanroom.3.1.4.3 op

25、erational cleanrooma cleanroom in normaloperation, with all services functioning and with equipmentand personnel, if applicable, present and performing theirnormal work functions in the cleanroom.NOTE 2For batch operations, specific conditions and requirementsshould be noted for monitoring and contr

26、ol.3.1.5 clean zonea defined space in which the concentra-tion of airborne particles is controlled to meet a specifiedairborne particulate cleanliness class.3.1.6 controlled areaan area which does not require a highdegree of temperature and humidity control but a semi-cleanatmosphere is desired.Air

27、conditioning is standard commercialdesign except that filtration is rated to 80-85 % for 1.0micrometer (m) and larger particles to control airbornecontaminants. These areas shall not exceed the airborne par-ticle concentration of Class 8.5 (FED-STD-209E Class 300,000) at 0.5 m and Class 8 (Class 100

28、,000) at 5.0 m per ISO14644-1 (FED-STD-209E). Reference USAF Tech Order 00-25-203.3.1.7 facilitythe total real property required to accomplishthe environmental control and operation of cleanrooms, cleanzones, and controlled areas as well as administrative andpersonnel support.NOTE 3This includes the

29、 cleanroom proper, air locks, change rooms,parts cleaning, storage, HVAC equipment, offices, and so forth.3.1.8 HVACHeating, Ventilating, and Air Conditioning.3.1.9 image analysisthe measurement of size, shape,number, position, orientation, brightness, and other parametersof small objects using the

30、combination of an autofocusingmicroscope, an imaging sensor, and a dedicated computersystem. Can be used to perform particle counts or measureparticle dimensions automatically, with far greater accuracythan manual techniques.3.1.10 molecular contaminationnonparticulate matter inthe form of droplets

31、or thin films which adversely affectscomponent or system performance.3.1.11 nonvolatile residue (NVR)soluble material remain-ing after evaporation of a filtered volatile fluid or precipitatefrom a gas phase, usually reported in milligrams per unit area(or volume).3.1.12 particulate contaminationsmal

32、l discrete mass ofsolid matter, usually measured in micrometers (m), whichadversely affects component or system performance.3.1.13 precision cleaningcleaning of hardware surfacesby approved engineering methods to meet specific cleanlinesscriteria.3.1.14 visibly cleanabsence of particulate or molecul

33、arcontaminants when viewed from a specified distance withnormal (or corrected to normal) vision with a specifiedillumination level.4. Contents of CCP4.1 General Items and Information:4.1.1 All CCPs shall include an introduction or scopespecifying the contamination-sensitive component(s) or sys-tem(s

34、) being addressed, a list of applicable documents, and alist of definitions including any acronyms and abbreviationsused in the document.4.1.2 The level of detail required and the nature and extentof controls needed depends upon a number of factors. The5Available from American National Standards Ins

35、titute (ANSI), 25 W. 43rd St.,4th Floor, New York, NY 10036, http:/www.ansi.org.6Available from Institute of Environmental Sciences and Technology (IEST),Arlington Place One, 2340 S. Arlington Heights Rd., Suite 100, Arlington Heights,IL 60005-4516, http:/www.iest.org.E1548 09 (2017)2systems organiz

36、ation or systems integrator has a better over-view of contamination limitations, sensitivity of specific com-ponents and hardware, and total mission requirements thansub-tier suppliers. Contamination limits for total systems arethe primary responsibility of the systems organization. Finalcontaminati

37、on limits at delivery of the integrated system and atend of life should be established by agreement between thepurchaser and systems supplier. Each supplier is responsiblefor defining and controlling the contamination level of theparticular hardware being supplied, with the approval of thesystems or

38、ganization, in addition to requirements levied by thesystems integrator.4.1.3 The buyer and seller should agree on the contents andimplementation of the CCP before any parts are processedbeyond the first cleaning or inspection point. Suppliers ofsubsystems and components should prepare Contamination

39、Control Plans so that the functional requirements of thehardware are protected. If a subsystem is particularly sensitiveto contamination, there must be adequate controls and compli-ance with system contamination requirements. Examples ofsensitive subsystems include optical or non-optical sensors,gyr

40、os, thermal control systems, liquid propellant systems, andcryogenic devices.4.1.4 Some subsystems are relatively insensitive to con-tamination. These should be identified and justifications givenfor limited contamination control efforts. Even if a particularsubsystem or hardware is not sensitive to

41、 contamination it mustnot be a source of contamination for other, more sensitive orcritical hardware. Also it is important that system performanceor contamination allowables not be degraded by contaminantsemanating from contamination tolerant hardware.4.2 Cleanliness Requirements:4.2.1 Cleanliness r

42、equirements must be specified for deliv-erable components or systems addressing particulate,molecular, or biological contaminants, or combination thereof.Primary responsibility for contamination control remains withthe hardware or subsystem supplier. Levels of control andallowable types and quantiti

43、es of contaminants shall be asagreed by the supplier and systems organization when appli-cable. Specify contamination limits and the point in time whenthe requirement must be verified (for example, IEST-STD-CC1246D Level XXX after manufacture, or X.XX % areacoverage at delivery to integration contra

44、ctor). Define anybudget allocations if different cleanliness levels are to beverified at different time intervals. Also identify whether therequirement is critical to the hardware performance or isnecessary to protect other critical hardware.4.2.2 Define how the cleanliness requirements will be im-p

45、osed in operation; identify the relevant documents such asdrawings, process documents, inspection procedures, testplans, manufacturing flow diagrams, acceptance plans, and soforth.4.3 Implementation Plan:4.3.1 Attainment of Cleanliness RequirementsDescribethe means for achieving the specified cleanl

46、iness requirements.This focuses on (1) selection of low outgassing, low shedding,and low particle generating raw materials, (2) design featuresto protect against contamination such as filters, cold traps,baffles, debris shields, and so forth, (3) cleaning and processingtechniques that will effective

47、ly remove contaminants fromsurfaces, and (4) facilities to be used for various operationssuch as cleanrooms of a specified class or controlled areas.Where pre-launch or post-launch cleaning operations areplanned, these shall be described here also. These elementsmay be contained in separate document

48、s, but shall all beresponsive to the requirements and cross-referenced in theCCP. ISO 15388 also contains recommendations on contami-nation control requirements and guidelines for establishingcontamination control plans.4.3.2 Verification of Cleanliness RequirementsIdentify thetechniques planned to

49、verify compliance with the cleanlinessrequirements, including particulate, molecular, or biologicalcontaminants, or combination thereof. Rationale for use ofwitness samples versus direct examination or solvent extrac-tion techniques should be included. Specify method of directsampling, such as tape-lift per Practice E1216, spray flush perPractices F303, and so forth, and specify method of testing,such as microscope counts per Test Methods F312, outgassingper Test Method E595, Test Method E1559 to evaluate outgas-sing materials characteristics and proper