ARMY MIL-M-63530-1981 MICROCIRCUIT DIGITAL CMOS (LOGIC)《互补金属氧化物半导体(逻辑)数字微电路》.pdf

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1、MILITARY SPE CIF ICATION MICROCIRCUIT, DIGITAL, CMOS (LOGIC) MIL-M- 63530 8 MARCH 1981 This specification is approved foruse by the U.S. Amy Armament Research and Development Command, and is available for use by all Departments and Agencies of the Department of Defense. 1, SCOPE s shown in Figure 11

2、. meet the requirements of 3.5.6.1 shall be classed defective. test). For this test . Any device failing to (Non-destructive I 20 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-b3530 13 W 9999906 0351904 b f MIL-M-63530(AR) - 4.5.24 Steady sta

3、te life. Devices shall be subjected to the steady state life test in accordance with MIL-STD-883, Method 1005, Condition D and as specified herein. Test duration shall be 1000 hours minimum at 125% + 5OC. same test set up as for the burn-in test. Electrical parameters shall be measured before, durin

4、g and after the steady state life test in accordance with Method 1005 and Table 11. Any device failing to meet the electrical parameters requirements of Table II shall be classed defective. (Non-destructive test). For this test the device shall be connected as shown in Figure li, the 4.5.25 Data req

5、uirements. The contractor shall submit a quality inspection test, demonstration and evaluation report giving all detailed inspection and test results in accordance with Data Item Description DI-R-1724, test report format shall be submitted to the technical agency listed in 6.5. 5. PREPARATION FOR DE

6、LIVERY 5.1 - Preservation, packaging and packing. Devices to be delivered under this specification shall be prepared for delivery in accordance with the requirements of MIL-M-38510, Level C. Electrostatic discharge (ES) protection in accordance with the requirements of MIL-M-55565 shall be provided.

7、 5.2 Marking. Marking shall be in accordance with MIL-STD-1188, 5.3. Shipping. When microcircuit circuit packages of more than one lot are shipped together, each lot shall be kept separate and the division between lots clearly indicated to prevent mixing of the lots in transit. 6. NOTES 6.1 Intended

8、 use. The device covered by this specification is intended for use in U.S. Army Ordnance. 6.2 Ordering data. The procurement documents shall specify the following: (a) Title, number and date of this specification. (b) Provisions for submission of first article samples. (cl (d) Quantity required and

9、delivery schedules. Requirement for certification of conformance for each lot or shipment of product. 21 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-il-63530 13 W i99Ob 0353905 B m - MIL-M- 63530 ( AR) 6.3 Submission of inspection equipment d

10、esigns for approval. (See 4.4.4). DRDAR-QAA-I, Dover, NJ 07801 Submit equipment designs as.required to Commander, ARADCM, ATTN: 6.4 Drawings. Drawings listed in section 2 of this specification under the heading U.S. Army Armament Research and Development Command (ARRADCOM) may also include drawings

11、prepared by, and identified as Edgewood Arsenal, Frankford Arsenal, Rock Island Arsenal or Picatinny Arsenal drawings. Technical data originally prepared by these activities is now under the cognizance of ARRADCOM. 6.5 Distribution of shop traveleds), inspection and test results, rocess controls. Sh

12、op traveler(s1, inspection and test results (3.7, $.5,20), and process controls (3.8) shall be sent to: Armament Research and Development Command, ATTN: DRDAR-QAA-M, Dover, NJ 07801. Commander, U.S. Army 6.6 Contract data requirements. a, Contract data requirements for inspection equipment designs s

13、hall conform to data item description DI-E-1118 or DI-1-1714 with the appropriate addendum to each. b. Shop traveleds) shall be submitted. C. Process control documents shall be submitted in accordance with DI-P-1604 (Mod) with attachment 1 listed on DD Form 1423 incorporated in the contract. d. Cont

14、ract data requirements for quality inspection test report in accordance with Data Item Description DI-R-1724 (tailored) giving the detailed test results. 22 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-* MIL-M-63530 13 m 7777906 0426533 O m NOMXAL

15、 VALUE TOLERANCE STYLE TYPE TCC c 0.01 UF - + 1.0% Ceramic NPO - + 25 PW R1. 470 K ohms + 1.0% Metal Film 2 50 Ppm . I R2 1.0 M ohms + 5.0% cc L . MIL-N-63530 (AR) L TC DUT FIGURE 1. Oscillator function test configuration 23 Provided by IHSNot for ResaleNo reproduction or networking permitted withou

16、t license from IHS-,-,-._. MIL-M-b3530 13 477770b 042b534 2 “ 1 2 MIL-M-63 53 O (AR) L 7 8 16 DUT 12 9 FI& 2, Leakage current low test confiquration 24 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- MIL-M-63530 (AR) INPUT WAVEFORMC MIL-U-63530 33 7

17、777906 0353708 3 M DUT I OUTPUT - WAVEFORMS FIGURE 3. Sequential test configuration 25 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- MIL-M-63530 33 W 7779706 0353707 5 W - MIL-M-63530 (AR) c: W I I- - C: -0 26 Provided by IHSNot for ResaleNo repro

18、duction or networking permitted without license from IHS-,-,-e 2 (3 m O s O m O OD O UJ O Q O 27 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-b3530 33 W 777770b 0353733 3 3 1 7 3 I) 7 1 7 Provided by IHSNot for ResaleNo reproduction or netwo

19、rking permitted without license from IHS-,-,- MIL-M-63530 33 9999906 0353732 5 MIL-M- 6 3 53 rl Ali) W H - I- CR 29 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-b3530 13 W 9777706 0353733 7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-