ARMY MIL-F-48267-1973 FUZE TIMER MINE (INTEGRATED CIRCUIT)《地雷引信定时器(集成电路)》.pdf

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1、MIL-F-48267 (PA) 31 October i973 MILITARY SPECIFICATION FUZE TIMER, MINE. (INTEGRATED CIRCUIT) 1. SCOPE 1.1 This specification covers the inspection and test of one type of CMOS Integrated Circuit (IC) used as the fuze timer in the 1456 Anti-tank mine electronics module. 2. APPLICABLE DOCUMENTS 2.1

2、The following documents of the issue in effect on date of invitation for bids or request for proposal form a part of this speclfication to the extent specified herein. SPECIFICATIONS MILITARY MIL-A-2550 - Ammunition and Special Weapons; ,General Specification For. STANDARDS MILITARY MIL-STD-105 - Sa

3、mpling Procedures and Tables For - , Inspection by Attributes, MIL-STD-109 - Quality Assurance Terms and Defini- tions - MIL-STD-883 - Test Methods and Procedures for Micro Electronics MIL-STD-l168- Lot -Numbering of Ammunition. MIL-STD-1169- Packaging, Packing and Marking for Shipment of Inert Ammu

4、nition Components - MIL-STD-1235- Single and Multilevel Continuous Sampling Procedures and Tables For Inspection by Attributes FSN: 1.345 - THISGEPAGES. . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-RIL-F-LI8267 33 M 9999906 0338338 7 m MIL-F-482

5、67 (PA) DRAWINGS U.S. ARMY MUNITIONS COMMAND 9255865 - Fuze Timer 9278639 - M56 Fuze Timer Static Test Load-Card. 9278640 - M56 Fuze Timer Burn - In Load Socket. 9278641- - M56 Fuze Timer Dynamic Test Set, (Copies of specifications, standards, drawings and publications listed above required by suppl

6、iers in connection with specific procurement functions should be obtained from the procuring ac- tivity or as directed by the Contracting Officer). . 3 . REQUIREMENTS 3.1 Material. - Materials shall be in accordance with 3.2 Part. - The part shall comply with all requirements applicable specificatio

7、ns and drawings. specified on drawing (dwg.) 9255865 and with al1 requirements specified in applicable specifications. 3.3 Pre-Cap Visual. - The IC shall comply with the Pre- cap requirements of MIL-STD-883. Method 2010.1, Test condition B. 3.4 Bond Strength. - The IC shall comply with the bond stre

8、ngth requirements of MIL-STD-883, Method 2011, Test Condition Di 3.5 Lead, Fatigue. - The 1.C shall comply with the lead fatigue requirements of MIL-STD-883,.Method 2004, Test.Condition B2 3.6 Conditioning Screen; - The IC shall be conditioned through the following screening procedures in accordance

9、 with Table No. 1 and MIL-STD-883. TABLE No. 1 CONDITIONING SCREEN REQUIREMENTS I I TEST METHOD TEST CONDITION Stabilization Bake i008 C (48 hours at $. 15OO.C) Thermal Shock 1011 C (15 cycles) 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-F-

10、48267 (PA) PIN NO. 1 2 3 4 5 6 7 8 9 10 11 12 17 14 15 16 TABLE No. 1 CONTINUED- PARAMETER FUNCTION FUNCTION FUNCTION (FUNCTION) No. 1 No. 2 No. 3 VSS) G G G (IH) G G D (VDD) 7. OV 7.0V 7.0V (Cl F (RI E (RC) D C C (OR) c- B B (AD) B G G (AR) A A A G (AE) G G (DE) G G G (DR) G G G - (BD) (RX) tn) n F

11、, tvc) TEST 1 METHOD 1 TEST CONDITION I I MINIMUM MAXIMUM TlNTT NOTES Temperature Cycling Mechanical Shock Centrifuge Fine Leak Gross Leak 4.85 O. 4- O. 4 2.15 0.20 o. 20 VOT,TS VOTtTPS - VT,TS 1 2 3 1010 2002 2001 i014 1014 c (10 cycles) B (5 Pulses, Y1 direction) E (Y 1 direction only) A c 3.7 Pre

12、-Burn - In Static Electrical Parameters. - The IC shall comply with the requirements of Table NO. 2 when the device is tested at a temperature of twenty five (25) plus or minus five degrees centigrade (25 - + 5C) using the test equipment of 4.4.4. TABLE NO. 2 STATIC AMBIENT ELECTRICAL PARAMETERS t I

13、 I I 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-F-48267 (PA) 16 MAXIMUM MINIMUM UNIT NOTES 0.4 260 190 19 0 850 0.20 VOLTS MICRO- MICRO- MICRO- MICRO- AMPERES AMPERES AMPERES AMPERES 4 6 5 6 L 4 Provided by IHSNot for ResaleNo reproduction

14、 or networking permitted without license from IHS-,-,-MIL-F-48267 13 = 9799406 0318123 7 W 12 14 i3 i 1E MIL-F- 4 826 7 (PA) 0.15V 6.75V 6,75v 675V . 6,75V 6.75V TABLE NO. 2 CONTINUED MINIMUM I -120 I -24 ARMING ARMING DELAY DELAY AEC-DEC E-Cell I E-Cell I E-Cell IE-Cell I11oI?J?ff -1 -10 c MAXIMUM

15、i5 LIMITS -60 -20 UNITS MI GRO - MICRO- MICRO- MICRO- , MICRO- AMPERES AMPERES AMPERES AMPERES AMPERES 5 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-F-48267 13 M 777770b 0318122 7 0 MIL-F- 482 67 (PA) TABLE NO. 2 CONTINUED 6 Provided by IHSNo

16、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-F-482b7 13 9 7979706 0318123 O .I MIL-F-4 82 6 7 (.PA TABLE NO. 2 CONTINUED . . . . . . . . . . . . . . . . . . . . . . . , . . . . . 7 Provided by IHSNot for ResaleNo reproduction or networking permitted without li

17、cense from IHS-,-,-MIL-F-48267- (PA) 1 2 3 5 6 7 8 9 10 11 12 1-2 TABLE NO. 2 CONTINUED G G G G 6 75V 6.75v 6 . 75V G G G G G G 1.ov 1. ov . - 1.ov 1.ov PIN # / PARAMETER 1 SCR V-2 I DELAY E-CELL FUNCTION Il i4 15 16 6.75 G TEST 100 ma UNITS NOTES I TEST I VOLTS VOLTS 799 7 I LIMITS I I MINIMUM 1.50

18、 I 0.25 MAXIMUM I 8 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-FIIL-F-4 82 6 7 (PA) NOTE 1: Function 1 - Functional Test consisting of 16 time slots. Inputs are driven to levels indicated. Out- puts must correspond to levels indicated. INPUTS 7

19、Il A I C 7v nlT -. 7V D fT 7V ov F NOTE 2 : INPUTS OUTPUT 9 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-F-qB267 13 9999906 03L12b b MIL-5-48267 (PA) Function 2 - Functional Test consisting of 10 time slots. Inputs are driven to levels indicat

20、ed. pond to levels indicatend. NOTE 3: slots. Inputs are driven to levels indicated. Outputs must correspond to levels indicated. Outputs must corres- Function 3 - Functional Test consisting of 7 time 7v I A INPUTS P6(RC) ov rl P2 (IH) n NOTE 4: Function 4 - Functional Test consisting of 37 time slo

21、ts. Inputs are driven to levels indicated. Outputs must correspond to levels indioated. 0.5V 10 c ,. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- MIL-F-98267 33 m 7777906 O338327 8 mi MIL-F-48267 (PA) NOTE 5: Test 7 - Disspation 3 input waveforms

22、 same as note 4 except: a) Output D not required b) Stop in time slot 33 and make required measurement (all 1s dissipation). NOTE 6: 1.0 volts on P 10 delayed 20 microseconds (minimum) from other input levels. 1.ov 1 NOTE 7: P10 ov 20/ Sec (Min; 1,ov ov * 4 CIO/Usec(Min.) t=O All other input levels

23、established NOTE 8: For all tests, power-on sequence is as follows: 1 - All specified input drives must be connected to GND. 2 - VDD (VCCi or MS) is then applied. 3 - Input high levels then established 4 - Measurement may be made. NOTE 9: Close Relay and Shunt 5K for these tests only, 11 Provided by

24、 IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1 MIL-F-48267 13 7777706 0318328 T MIL-F-48267 (PA) 3.8 Burn-In. - The IC shall be burned-in at a temperature for a minimum time of one of one hundred and twenty five degrees centigrade plus or minus five degrees

25、centigrade (125OC + 5OC) hundred and sixty eight (168) hours using the test equipment of 4.4.5. 3.9 Group A Final Static Ambient Electrical Parameters. - The IC shall meet the requirements of Table No. tested at a temperature of twenty five degrees centigrade plus or minus five degrees centigrade (2

26、5OC 1. 5OC) using the test equip- 2 when it is ment of 4.4.6. - 3.10 Group A Final High Temperature Static Electrical Para- meters, - The IC shall meet the requirements of Table No. 3 when it is tested at a temperature of one hundred and twenty five de- grees centigrade plus or minus five degrees ce

27、ntigrade (125OC + 5OC) using the equipment of 4.4.7. - 1 2. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- MIL-F-482b7 13 9999706 0318127 L MIL-F-48267 (PA) TABLE NO. 3 GROUP A FINAL STATIC HIGH TEMPERATURE ELECTRICAL PARAMETERS Provided by IHSNot

28、for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-F-48267 (PA) UNITS NOTES c TABLE NO. 3 CONTINUED MICRO- AMPERES 6 1 DISSIPATION MICRO- AMPERES PIN #/PARAMETER I CURRENT # 2 I MICRO- VOLTS VOLTS AMPERES TEST ll G 7 a o 6 G - I - 9 10 1. o 11 G 16 I LIMITS AEC-DEC AE

29、C-DEC “OFF“-l “OFF“-2 SCR V-1 SCR V-2 I 6.75V 6.75V I I I (i ti . G 0 G G G 0 G G o o 0.7V 1.ov 1. ov TEST I I I O. 7V 1.ov 1. ov TEST I 6.75 6.75V V - I I ti u 50 ma 100 ma . TEST TEST 1.6 O. 25 I 739 I 739 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH

30、S-,-,-MIL-F-48267 (PA) MAXIMUM UNITS 3.11 Group A Final Low Temperature Static Electrical Parameters. - The IC shall meet the requirements of Table No. 4 when it is tested at a temperature of minus fifty five degrees centigrade plus or minus five degrees centigrade (-55OC - t 5OC) using the test equ

31、ipment of 4.4.8. , TABLE NO. 4 2. o 0.15 0.15 0.15 VOLTS VOLTS VOLTS VOLTS GROUP A FINAL STATIC LOW TEMPERATURE ELECTRICAL PARAMETERS NOTES I FUNCTION -1 FUNCTION I FUNCTION I . FUNCTION 1 2 3 4 I , , , , I No. 2 I No. 3 I No: 4 I I LIMITS - MINIMUM -15.3 Provided by IHSNot for ResaleNo reproduction

32、 or networking permitted without license from IHS-,-,-MIL-F-42b7 13 797770b 0318132 1 PIN #/PARAMETER MIL-F-48267 (PA) DISSIPATION AEC-DEC AEC-DEC CURRENT # 2 tOPF“-l “OF3“-2 SCX Vt-1 $CR - y-2 TABLE NO. 4 CONTINUED 1 2 3 G G G G G 7.OV G .G G G 7.0V 6.75V 6.75V 6.75V 6.75V TEST 4 5 7 8 9 6.75V 6.7V

33、 G G G G G G G G G G G G G (I G a 6-7V d 10 1.ov 0.7V 1.ov 1.ov TEST 16 11 12 14 15 16 13 0.7V 1.ov 1. ov TE ST G 6.75V 6.75V G G 50 ma 100 ma LIMITS MINIMUM MAXIMUM TEST TEST - 10 - 10 185 1.6 0.25 UNITS MICRO- MICRO- MICRO- VOLTS VOLTS AMPERES AMPERES AMPERES NOTES 6 I 799 799 Provided by IHSNot f

34、or ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-F-4267 13 9999906 0318133 3 . MIL-F-48267 (PA) B2 (Any 5 Leads) A C . . . . . . . . . . . . . 3.12 Dynamic Parameter. - The IC shall have the following output wave form when tested in accordance with 4.4.9 at a temp- e

35、rature of twenty five plus or minus ten degrees centigrade (25OC - mb 100c). 3.13 Group B Environmental Requirements, - The IC shall comply with the requirements of Table No. 5 and MIL-STD-883. TABLE NO. 5 GROUP B ENVIRONMENTAL TESTS TEST I METHOD I TEST CONDITION Physical Dimensions .Marking Perman

36、ency Visual and Mechanical Bond Strength -Solderability Lend Fatigue Fine Leak Gross Leak 2008 2008 2008 2011 2003 2Q04 i014 i014 A B (Per 3.2.1.) B (10x1 D Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-F-42b7 23 999940b 0328334 5 W TEST MIL-F-

37、48267 (PA) METHOD TEST CONDITION 3.14 Group C Environmental Requirements. - The IC shall comply with the requirements of Table No. 6 and MIL-STD-883 TABLE NO. 6 Thermal Shock Temperature Cycling Moisture Resistance Fine Leak Gross Leak Mechanical Shock Vibration Variable Frequency Constant Accelerat

38、ion Salt Atmosphere High Temperature Storage Operating Life (Bias Condition) Electrical Tests per 3.9 1011 1010 i004 1014 1014 2002 2007 2001 1009 i008 i005 - C C No Voltage Applied A C B (0.5 ms) A E A (without initial conditioning) C (1000 hours) t 125OC for 1000 hours - 3.15 Test Programming. - A

39、ll final static electrical acceptance testing shall be performed using Government tapes and load cards described by 4.4.6, 4.4.7, and 4.4.8. ricated and finished in a thorough, workmanlike manner. They shall be free of cracks, surface defects, dirt, grease, rust, cor- rosion products and other forei

40、gn matter. The cleaning agent or method used shall not be injurious to any part, nor shall the part be contaminated by the cleaning agent. All markings shall be neat and sharply defined. 3.16 Workmanship. - All parts and assemblies shall be fab- 3.17 Submission of Results of Contractor Conducted Exa

41、mina- tions and Tests. - The contractor shall forward copies of the re- sults of any of his examinations 011 tests to the designated address as required by the contract. Results shall be submitted within thirty (30) days at the completion of each lot tested (see 6.4). Provided by IHSNot for ResaleNo

42、 reproduction or networking permitted without license from IHS-,-,-MIL-F-q8267 33 W 979790b 0338335 7 9 MIL-F-48267 (PA) 4. QUALITY ASSURANCE PROVISIONS 4.1 Responsibility for Inspection. - Unless otherwise specified in the contract or purchase order, the supplier is responsible for the performance

43、of all inspection requirements as specified herein. contract or order, the supplier may use his own or any other facilities suitable for the performance of the inspection re- quirements specified herein, unless disapproved by the Govern- ment. The Government reserves the right to perform any of the

44、inspections set forth in the specification where such inspec- tions are deemed necessary to assure supplies and servies con- form to the prescribed requirements. MIL-STD-109 to define terms used herein. MIL-A-2550 shall apply. lot of items deliverable under the contract is submitted to the Governmen

45、t for acceptance, the contractor shall supply the fol- lowing information accompanied by a certificate which attests that the information provided is correct and applicable to the product belng submitted. A statement that the lot complies with all of the quality assurance provisions specified in thi

46、s specification. Drawing and specification number and date, together with identification and date of changes thereto. A statement that all material purchased by the con- tractor meets requirements, when such material is controlled by Government or commercial specifications referenced in any of the c

47、ontractual documents, and that certificates of conformance are on file and available for review. Except as otherwise specified in the Reference shall be made to The provisions of Submission of Product. - At the time each completed 4.1.1 a. b. c. d. Number of items in the lot, e. Date submitted. The

48、certificate shall be signed by a responsible agent of the certifying organization. The initial certificate submitted shall be substantiated hy evidence of the agents authority to bind his principal. Substantiation of the agents authority will not be required with subsequent certificates unless, during the course of the contract, this authority is vested in another agent of the certifying organization. Provided