ANSI IT9.27-1999 Imaging Materials - Life Expectancy of Information Stored in Recordable Compact Disc Systems - Method for Estimating Based on Effects of Temperature and Relative H.pdf
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1、7 -ENGL 1999 0724150 055b3b2 922 = ANSUPIMA IT9.27-1 for Imaging Materials - Life Expectancy of Information Stored in Recordable Compact Disc Systems - Method for Estimating, Based on Effects of Temperature and Relative Humidity 999 - -m mmn Na1 American National Standards Institute I I West 42nd St
2、reet New York, Nau York I0036 - STD-ANSI IT9.27-ENGL 1999 m 0724350 055b3b3 Bb m ANSVPIMA lT9.27-1999 American National Standard for Imaging Materials - Life Expectancy of Information Stored in Recordable Compact Disc Systems - Method for Estimating, Based on Effects of Temperature and Relative Humi
3、dity Secretariat Photographic their existence does not in any respect preclude anyone, whether he has approved the standards or not, from manufacturing, marketing, purchasing, or using products, processes, or procedures not conforming to the standards. The American National Standards Institute does
4、not develop standards and will in no circumstances give an interpretation of any American National Standard. Moreover, no person shall have the right or authority to issue an interpretation of an American National Standard in the name of the American National Standards Institute. Requests for interp
5、retations should be addressed to the secretariat or sponsor whose name appears on the title page of this standard. CAUTION NOTICE: This American National Standard may be revised or withdrawn at any time. The procedures of the American National Standards Institute require that action be taken periodi
6、cally to reaffirm, revise, or withdraw this standard. Purchasers of American National Standards may receive current information on all standards by calling or writing the American National Standards Institute. Standard Published by American National Standards Institute, Inc. 11 West 42nd Street, New
7、 York, NY 10036 Copyright O 2000 by American National Standards Institute All rights reserved. No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without prior written permission of the publisher. Printed in the United States of America Content
8、s Page Foreword i 1 Scope . 1 2 Normative references . 1 3 Definitions . 2 4 Measurements 4 5 Accelerated stress test plan . 5 6 Data evaluation . 10 7 Disclaimer . 15 Tables 1 2 Figure 1 Annexes A Ten-step analysis outline 13 B Example of test plan and data analysis 14 C Bibliography 27 Temperature
9、 and relative humidity ramp profile . 7 Summary of stress conditions 9 Graph of nominal 80C/85% RH ramp profile 8 I STD-ANSI IT9.27-ENGL 1999 m 072qL50 055b3bb 578 m Foreword (This foreword is not part of American National Standard ANSVPIMA lT9.27-1999.) This standard was prepared by the Joint Techn
10、ical Commission of PIMA IT9-5 on Optical - Sample life distribution is appropriately modeled by the lognormal distribution; - The kinetics of the dominant failure mechanism is appropriately modeled by an Eyring acceleration model; - The dominant failure mechanism acting at the usage condition is the
11、 same as that at the accelerated conditions. Publications by Hamada l” and Stinson 2 provide data indicating that these assumptions are applicable to CD-R systems. 2 Normative references The following American Standards contain provisions which, through reference in this text, constitute provisions
12、of this American National Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on this American National Standard are encouraged to investigate the possibility of applying the most - ) The number in the bracke
13、ts refers to the reference in clause 2. 1 ANSI/PIMA lT9.27-1999 recent editions of the standards indicated below. Members of IEC and IS0 maintain registers of currently valid Standards. ISO/IEC 908: 1987, Compact disc digital audio systed ISO/IEC 1 O1 49:1995, Information technology - Data interchan
14、ge on read-only 120 mrn optical data disks (CD-ROM) *) l Hamada, E., Taiyo Yuden: Technologie et Fiabilite du CD-WORM. Memoires optiques 1990 5 Murray, W. P., Accelerated service life predictions of compact disks. ASTM STP 1202: 263- 271 ; 1994 6 Tobias, P. A. and Trindade, D. C., Applied reliabilit
15、y. New York: Van Nostrand Reinhold; 1986 (A second edition issued in 1995.) 3 Definitions For the purpose of this standard, the following definitions apply. 3.1 baseline: Initial parameter measurement taken prior to any application of stress. 3.2 block error rate (BLER): As defined in ISO/IEC 908, B
16、LER is the ratio of erroneous blocks to total blocks measured at the input of the first (Cl) decoder (before any error correction is applied). The more commonly reported value for BLER is the number of erroneous blocks per second measured at the input of the C1-decoder during playback at the standar
17、d (1X) data rate. 3.2.1 maximum block error rate (max BLER): Maximum BLER measured anywhere on a disc. 3.3 compact disc-recordable (CD-R): Recordable disc which, after recording, satisfies the specifications as written in the disc parameters clause (clause 2) of ISO/IEC 908. The term, compact disowr
18、ite once (CD-WO), has also been used to describe this type of disc. 3.4 cumulative distribution function, F(t): Fraction of all units in the population that fail by time t. Also, the probability that a random unit drawn from the population fails by time t. 3.5 disc-at-once recording: Method of recor
19、ding a CD-R disc whereby the entire CD is recorded in one pass without turning off the laser. 3.6 end-of-life: Occurrence of any loss of information. - 2, For electronic copies of some standards, visit ANSIs Electronic Standards Store (ES) at www.ansi.org. For printed versions of all these standards
20、, contact Global Engineering Documents, 15 Inverness Way East, Englewood, CO 801 12-5704, (800) 854-7179. 2 - - STD=ANSI IT9-27-ENGL 1999 = 0724150 0556370 TT9 H ANSVPIMA lT9.27-1999 3.7 glass transition temperature: As an amorphous polymer is warmed, many properties of the polymer (modulus, coeffic
21、ient of thermal expansion, dielectric loss, etc.) undergo dramatic change over a narrow temperature range. The midpoint of the temperature span over which this change in properties occurs is the glass transition temperature. 3.8 information: Signal or image recorded using the system. 3.9 life expect
22、ancy (LE): Length of time that information is predicted to be retrievable in a system under extended-term storage conditions. 3.9.1 standardized life expectancy: Minimum life span, predicted with 95% confidence, of 95% of product stored at a temperature not exceeding 25OC and a relative humidity not
23、 exceeding 50% RH. 3.1 O lognormal cumulative distribution function: It is defined by the following equation: where f is the time; 0, Pl is the log mean ioge(x) is the log standard deviation; is the natural logarithm of x NOTE - When t =epL the lognormal cumulative distribution function evaluates to
24、 0.5. In other words, the model predicts that at that time half of the samples have failed. 3.1 1 retrievability: Ready access to information as recorded. 3.12 stress: Experimental variable to which the specimen is exposed for the duration of the test interval. In this standard, stresses are confine
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