ANSI IEEE C37.239-2010 Common Format for Event Data Exchange (COMFEDE) for Power Systems《电力系统用项目数据交换(COMFEDE)公用格式标准》.pdf
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1、 IEEE Standard for Common Format forEvent Data Exchange (COMFEDE) for Power Systems Sponsored by the IEEE Power System Relaying Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 11 November 2010IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educati
2、onal classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2010 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C37.239-2010, IEEE Standard for Common Format for Event Data Exchange (COMFEDE) for Power Systems. Power network fault e
3、vent data are indispensable to the analysis, testing, evaluation, and simulation of power systems and related protection schemes. The flexibility provided by digital devices in recording such event data has brought about a situation wherein the users of these records are confronted with the difficul
4、ty of dealing with the different formats used by each device to generate, store, and transmit the recorded data. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance
5、 to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents
6、 may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of en
7、gineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded
8、 at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effec
9、t. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed
10、previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. v Copyright 2010 IEEE. All rights reserved. Errata Errata, if any, for this and all other standards can be accessed at the followin
11、g URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called
12、to the possibility that implementation of standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Ess
13、ential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are r
14、easonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyri
15、ght 2010 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Common Data Format for IED Event Data Working Group had the following membership: Mark Adamiak, Chair Pierre L. Martin, Vice Chair Eric Allen Scott Anderson Alex
16、Apostolov Christoph Brunner Jim Hacket Randy Hamilton Juergen Holbach Mladen Kezunovic Stanley Klein Larry Smith Stan Thompson Benton Vandiver The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Willia
17、m J. Ackerman Mark Adamiak S. Aggarwal James Ariza Ali Al Awazi Hugh Barrass Martin Baur Kenneth Behrendt Oscar Bolado Steven Brockschink Gustavo Brunello Suresh Channarasappa Arvind K. Chaudhary Keith Chow Stephen Conrad R. W. Corlew James Cornelison Carlo Donati Gary Donner Michael Dood Neal Dowli
18、ng Gary Engmann Kenneth Fodero Jeffrey Gilbert Manjinder Gill Jalal Gohari Edwin Goodwin Randall Groves Roeer Hedding Gary Heuston Werner Hoelzl Stuart Holoman David Horvath C. Huntley Akio Iso R. Jackson Junghoon Jee Piotr Karocki Tanuj Khandelwal Yuri Khersonsky Yongburn Kim James Kinney Stanley K
19、lein J. Koepfinger Jim Kulchisky Chung-Yiu Lam Charles Lennon James Liming G. Luri Pierre L. Martin William McBride John McDonald Gary Michel Keith Moore Jerry Murphy R. Murphy Bruce Muschlitz Anthony Napikoski Michael S. Newman Robert Orndorff Chris Osterloh Lorraine Padden Bansi Patel Farnoosh Rah
20、matian R. Ray Robert Robinson Charles Rogers Sukhbir Sachdev Bob Saint Miriam Sanders Steven Sano Bartien Sayogo Thomas Schossig Lubomir Sevov Devki Sharma Gil Shultz Mark Simon Vesselin Skendzic James Smith Jerry Smith John Spare Gary Stoedter Michael Swearingen Richard Taylor John Tengdin John Tot
21、h Demetrios Tziouvaras Joe Uchiyama Eric Udren Sterling Vaden Srinivasa Vemuru John Vergis Jane Verner John Wang Hung-Yu Wei Kenneth White Philip Winston Paul Work Richard Young Oren Yuen vii Copyright 2010 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 30 Sept
22、ember 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past President Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David
23、 J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Repre
24、sentative Michael Janezic, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2010 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normati
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