AECMA PREN 2950-2007 Aerospace series Test method Wrought heat resisting alloys Semi-finished products and parts Conditions for macrographic and micrographic examination Atlas of s.pdf

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1、ASD STANDARD NORME ASD ASD NORM prEN 2950 Edition P 1 February 2007 PUBLISHED BY THE AEROSPACE AND DEFENCE INDUSTRIES ASSOCIATION OF EUROPE - STANDARDIZATIONAvenue de Tervuren, 270 - B-1150 Brussels - Tel. + 32 2 775 8126 - Fax. + 32 2 763 3565 - www.asd-stan.orgICS: Descriptors: ENGLISH VERSION Aer

2、ospace series Test method Wrought heat resisting alloys Semi-finished products and parts Conditions for macrographic and micrographic examination Atlas of structures and defects Srie arospatiale Mthode dessais Demi-produits et pices corroys en alliage rsistant chaud Conditions dexamens macrographiqu

3、e et micrographique Atlas de structures et de dfauts Luft- und Raumfahrt Prfverfahren Umgeformte Erzeugnisse aus hochwarmfesten Legierungen Prfbedingungen fr makrographische und mikrographische Untersuchung Gefge- und Fehleratlas This “Aerospace Series“ Prestandard has been drawn up under the respon

4、sibility of ASD-STAN (The AeroSpace and Defence Industries Association of Europe - Standardization). It is published for the needs of the European Aerospace Industry. It has been technically approved by the experts of the concerned Domain following member comments. Subsequent to the publication of t

5、his Prestandard, the technical content shall not be changed to an extent that interchangeability is affected, physically or functionally, without re-identification of the standard. After examination and review by users and formal agreement of ASD-STAN, it will be submitted as a draft European Standa

6、rd (prEN) to CEN (European Committee for Standardization) for formal vote and transformation to full European Standard (EN). The CEN national members have then to implement the EN at national level by giving the EN the status of a national standard and by withdrawing any national standards conflicti

7、ng with the EN. Edition approved for publication 28 February 2007 Comments should be sent within six months after the date of publication to ASD-STAN Metallic Material Domain Copyright 2007 by ASD-STAN Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA No

8、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:20072 Contents Page Foreword2 1 Scope 3 2 Normative references 3 3 Terms and definitions .3 4 Macrographic examination .4 5 Micrographic examination 6 6 Reporting of results.7 Annex A (normative) Atlas of macr

9、ographic references 8 Annex B (normative) Atlas of micrographic references .31 Foreword This standard was reviewed by the Domain Technical Coordinator of ASD-STANs Metallic Material Domain. After inquiries and votes carried out in accordance with the rules of ASD-STAN defined in ASD-STANs General Pr

10、ocess Manual, this standard has received approval for Publication. Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:20073 1 Scope The present document defines t

11、he conditions for the macrographic and micrographic examination of heat resisting alloy semi-finished and parts. It includes an atlas of commonly encountered and structural defects. The present document shall be applied in conjunction with the material standards specifying the criteria of acceptance

12、. The present document is not intented to apply to cast or powder metallurgy products. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of

13、 the referenced document (including any amendments) applies. EN 2078, Aerospace series Metallic materials Manufacturing schedule, inspection schedule, inspection and test report Definition, general principles, preparation and approval. 3 Terms and definitions For the purposes of this document, the f

14、ollowing terms and definitions apply. 3.1 tree rings one or more concentric or non-concentric rings evidenced by a difference in texture associated with minor composition gradients due to ingot solidification 3.2 dendritic aspect coarse structure having a fir-tree like appearance initiated during th

15、e solidification of the ingot 3.3 grain flow fibre like lines which are caused by orientation of the constituents of the metal during deformation 3.4 recrystallisation formation of a new grain structure from that existing previously 3.5 freckles a type of segregation consisting of circular or near-c

16、ircular dark etching areas, generally enriched with carbides and hardening elements 3.6 white spots a type of segregation consisting of bright white areas having bulk or fibrous configuration, generally depleted in carbides and hardening elements 3.7 stringer predominantly straight linear formation

17、which is 2 particles in width Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:20074 3.8 cluster predominantly straight elongated formation which is mainly 2 pa

18、rticles in width 3.9 chain linear formation whose particle distribution does not lie predominantly in a straight line 3.10 random distribution of particles with no particular orientation 4 Macrographic examination 4.1 General Macrographic examination shall be carried out in accordance with this stan

19、dard and by reference to Annex A (normative) to verify that the requirements of the relevant material standard, technical specification or order have been met. 4.2 Product surface examination 4.2.1 General Examination shall be performed on the entire surface of the product in the delivery heat treat

20、ment condition unless otherwise agreed between the manufacturer and the purchaser. Handling zones which may cause imperfect etching shall be defined and agreed between the manufacturer and the purchaser, and shall not be taken into account in the evaluation. 4.2.2 Surface preparation Preparation sha

21、ll not alter, contaminate or cold work the surface structure. The product shall be cleaned and degreased to ensure uniform etching. 4.2.3 Macroetching The etching method to be used shall be agreed between the manufacturer and purchaser. A list of typical etching reagents and conditions are given in

22、Table 1. All structural characteristics, particularly the segregation resulting from solidification of the ingot shall be revealed. After etching, the surfaces shall be cleaned in a way which does not affect the quality of the contrast and shall be protected from deterioration and contamination unti

23、l inspection is carried out. 4.2.4 Examination Examination shall be carried out under a minimum light intensity of 250 Lux. Examination shall normally be performed without magnification but when necessary may be supplemented by the use of a magnification up to a maximum of 12. In case of doubt or wh

24、en the structural features are unusual, a micrographic examination of the affected area shall be made in accordance with clause 5. Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license fro

25、m IHS-,-,-prEN 2950:20075 4.3 Cut-up examination 4.3.1 General Unless otherwise agreed between the manufacturer and the purchaser, examination shall be performed on a plane section of the product in the delivery heat treatment condition. The location and orientation of the plane section shall be as

26、required by the relevant technical specification or order. The cutting method shall not cause damage to the structure. Slices shall be of sufficient thickness to allow further examination perpendicular to this plane section if required. 4.3.2 Surface preparation The surface to be examined shall be p

27、repared in such a way that any contamination and mechanical alteration of the surface are avoided or eliminated. The resulting surface shall be cleaned and degreased to ensure uniform etching. 4.3.3 Macroetching Wherever possible, electro-chemical techniques shall be used. The etching method to be u

28、sed, shall be carried out by a technical agreed between manufacturer and purchaser. A list of typical etching reagents and conditions is given in Table 1. Etching shall reveal all structure characteristics, particularly segregation resulting from the ingot solidification. After etching the surface s

29、hall be cleaned in a way which does not affect the quality of the contrast and shall be protected from deterioration and contamination until inspection is carried out. Table 1 Etchant Alloy type Name Composition vol. % Conditions Fe, Ni base Hydrochloric etch HCl . 50 H2O 50 Electrolytic (40 A/dm2 l

30、 100 A/dm2) Ambient temperature Fe, Ni base with Nb Ferric chloride FeCl3 .49 HCl . 4 H2O 47 Chemical 40 C 120 C Fe, Ni, Co base Sulphuric etch H2SO4 95 H2O 5 Electrolytic 25 A/dm2Ambient temperature 4.3.4 Examination Macrographic examination shall be carried out in accordance with 4.2.4. Copyright

31、European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:2007 6 5 Micrographic examination 5.1 General Micrographic examination shall be carried out in accordance with this stand

32、ard and by reference to Annex B (normative) and to verify the requirements of the relevant material standard and/or order have been met. 5.2 Product surface examination 5.2.1 General Examination shall be carried out to investigate anomalies observed during macrographic examination (see 4.2.4) or whe

33、n required by the material standard. 5.2.2 Surface preparation Material shall be removed from the surface to be examined until it is polished to a mirror finish and is free from cold working, contamination and the effects of prior surface preparation. 5.2.3 Microetching Micro examination may be requ

34、ired in either or both polished and etched conditions. When etching is required, the method to be used shall be agreed between manufacturer and purchaser. A list of typical etching reagents and conditions is given in Table 2. After etching, the surfaces shall be cleaned in a way which does not affec

35、t the quality of the contrast, and shall be protected from deterioration and contamination until examination is carried out. Table 2 Etchant Alloy type Name Composition Conditions Co base Nital 2 % HNO3 10 % ethyl alcohol Electrolytic Ambient temperature Fe, Ni base low Al, Ti content Frys reagent C

36、uCl2. 20 gHCl . 200 ml H2O 100 ml Chemical Ambient temperature Fe, Ni, Co base Murakamis reagent KOH 10 g K3Fe(CN)4. 8 g H2O 100 ml Chemical 60 C 90 C Ni base high Al, Ti content Glyceregia HCl . 20 ml HNO3. 10 ml Glycerol . 35 ml Electrolytic Ambient temperature Ni base High Cr, Al, Ti content HF/G

37、lycerol HF . 5 ml Glycerol . 10 ml H2O 85 ml Electrolytic Ambient temperature 5.2.4 Examination Examination shall be carried out directly on the prepared surface or by using a replica, under an optical microscope with a minimum magnification of 50. Copyright European Association of Aerospace Industr

38、ies Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:2007 7 Wherever possible examination shall be made at the same magnification as the reference photomicrograph. In all cases, the magnification used shall permit r

39、esolution of the structural characteristics sought. 5.3 Cut-up examination 5.3.1 General Examination shall be carried out on a plane section of the product in order to investigate anomalies observed during macrographic examination (see 4.3.4) or when required by the material standard, technical spec

40、ification or order. In case of such a requirement, this examination shall be carried out in the heat treatment condition required by the relevant material standard. 5.3.2 Sampling The location and orientation of samples shall be as required by the relevant material standard or order or as determined

41、 by the presence of macro anomalies. The sampling method shall not cause damage to the structure. 5.3.3 Surface preparation The surface preparation shall be carried out in accordance with 5.2.2. 5.3.4 Microetching Microetching shall be carried out in accordance with 5.2.3. 5.3.5 Examination Examinat

42、ion shall be carried out in accordance with 5.2.4. 6 Reporting of results The results of macro or micro examination shall be recorded in the inspection and test report in accordance with EN 2078. Each photograph of the structure shall be identified with the location, orientation, etch method and mag

43、nification. Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:20078 Annex A (normative) Atlas of macrographic references A.1 Tree rings A.1.1 Concentric tree rin

44、gs See Figure A.1 (A to E). A B Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:20079 C D Copyright European Association of Aerospace Industries Provided by IH

45、S under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:200710 E Figure A.1 Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without li

46、cense from IHS-,-,-prEN 2950:200711 A.1.2 Non-concentric tree ring See Figure A.2 (A to F). A B Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:200712 C D Copy

47、right European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:200713 E F Figure A.2 Copyright European Association of Aerospace Industries Provided by IHS under license with AEC

48、MA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:200714 A.2 Dendritic aspect See Figure A.3 (A to E). A B Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-prEN 2950:200715 C D Copyright European Association of Aerospace Industries Provided by IHS under license with AECMA N