ASTM F16-12(2017) Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps.pdf
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1、Designation: F16 12 (Reapproved 2017)Standard Test Methods forMeasuring Diameter or Thickness of Wire and Ribbon forElectronic Devices and Lamps1This standard is issued under the fixed designation F16; the number immediately following the designation indicates the year of originaladoption or, in the
2、 case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscriptepsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 These test methods cover procedures for measuring thediameter or thickness of round and
3、 flat wire (ribbon) 0.060 in.(1.52 mm) maximum used in electronic devices and lamps.1.2 The values stated in inch-pound units are to be regardedas standard. The values given in parentheses are mathematicalconversions to SI units that are provided for information onlyand are not considered standard.1
4、.3 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.1.4 This interna
5、tional standard was developed in accor-dance with internationally recognized principles on standard-ization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recom-mendations issued by the World Trade Organization TechnicalBarriers to Trade (TBT) Com
6、mittee.2. Summary of Test Method2.1 In order to provide reliable determinations of physicaldimensions of wire and ribbon products, these test methods aredesigned to mechanically measure the diameter or thicknesswith a high degree of precision. These test methods are basedon the use of a sensitive me
7、asuring head with calibratedpressure settings, shaped measuring anvils to reduce errorscaused by material curvature or waviness, and a method forpresetting the anvil spacing by means of gage blocks orcylindrical master standards.3. Significance and Use3.1 The methods contained in this standard are i
8、ntendedprimarily for referee use, for laboratory measuring, and forcertifying size of standard samples used for checking othermeasuring equipment that may be agreed upon between thesupplier and the purchaser.4. Apparatus4.1 Either of two general types of apparatus may be used formeasuring, depending
9、 on the accuracy desired and on theavailability of certified cylindrical master standards for gagesetting, as follows:4.1.1 Apparatus A For use with cylindrical master stan-dards for gage setting.4.1.2 Apparatus B For use with gage block standards forgage setting.4.2 Apparatus A, shown in Fig. 1, sh
10、all have the followingfeatures:4.2.1 An adjustable anvil of the size and shape specified forthe material to be inspected. The anvil shall be nonrotating andshall be adjustable for position by means of a micrometer orprecision adjusting screw, with means for locking the anvil inany set position after
11、 adjustments have been made.4.2.2 A sensing anvil of the size and shape specified for thematerial to be measured, linked directly to a sensing andindicating device of specified precision and sensitivity.4.2.3 The adjustable fixed anvil and sensing anvil and thesensing device shall be rigidly mounted
12、 with both anvils inalignment on the same axis. The sensing anvil shall be movablewith provisions for retracting the anvil for placing the speci-men in the measuring position.4.2.4 Both anvils shall be properly fitted, lapped, andpolished so the contacting surfaces are flat and parallel withinthe ac
13、curacy specified.4.2.5 The sensing device shall be provided with a means forsetting the indicator hand or scale to zero, and a calibratedscale or dial for setting the sensing anvil measuring pressure tothe specified value required for measuring. This setting shall beaccurate to within6 10 % of the s
14、et value.4.3 Apparatus B, shown in Fig. 2, shall meet the require-ments specified for Apparatus A in 4.2 with the followingadditional features:4.3.1 The fixed anvil and support to which it is attachedshall be free to move along the measuring axis but shall be heldin line with the sensing anvil by me
15、ans of cantilever springs sothat parallelism with the sensing anvil is maintained. The1These test methods are under the jurisdiction of ASTM Committee F01 onElectronics and are the direct responsibility of Subcommittee F01.03 on MetallicMaterials, Wire Bonding, and Flip Chip.Current edition approved
16、 June 1, 2017. Published June 2017. Originallypublished in 1961 as F16 61 T. Last previous edition approved in 2012 as F16 12.DOI: 10.1520/F0016-12R17.This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on
17、Principles for theDevelopment of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.1opposite end of the movable anvil support shall terminate in aball contact having a diameter from 0.19 to 0.25 in. (4.8 to 6.4mm).
18、The total pressure of the support and springs shall exerta force of 500 6 0 g on the gage block.4.3.2 The gage block for setting shall be located directly incontact with the movable anvil support ball contact. Theopposite side of the gage block shall be supported at threeplaces by hardened steel bal
19、ls 0.09 to 0.12 in. (2.4 to 3.2 mm)in diameter and equilaterally spaced to form a triangle.4.3.3 The three ball contacts shall be securely fixed to asupport table and shall be movable for setting the measuringdevice by means of a precision adjusting screw. Provision shallbe made for securely locking
20、 the table in place after setting.5. Test Specimens5.1 Test specimens shall be selected at least 3 ft (0.9 m)from the end of a spool or coil of material and shall be straightand free from kinks, dents, or other damage that wouldinterfere with measuring accuracy.5.2 Wire or fine ribbon shall be drawn
21、 from the spool underuniformly low tension to prevent elongation. If the material isobviously contaminated with oil, dirt, or other foreign matter,it shall be drawn gently through a lint-free cloth, wet with asuitable solvent.6. Test Conditions6.1 The measuring device shall be used in a location tha
22、t isclean and free of dust and lint. Vibration, drafts, direct heatfrom lamps, and temperature variations shall be minimized.The equipment shall be kept clean and covered when not inuse.6.2 For fine wire, smaller than 0.0008 in. (0.02 mm) indiameter, extra precautions shall be taken to avoid all pos
23、siblecauses (see 6.1) of inaccurate measurements. The measuringdevices shall be used in a small gage laboratory with tempera-ture variations kept to within6 5C. The equipment shall belaid out on a clean surface with tools and gage blocks on foamrubber pads. All equipment used for measuring, and them
24、aterial samples, shall be stabilized by leaving them togetherin the gage room for at least 1 h. Gage blocks shall be handledwith tongs to prevent temperature variations.6.3 Gage blocks shall be recalibrated at least once everyyear, using the block calibration size for the calibration setting.Blocks
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