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1、 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits Sponsored by the Surge Protective Devices Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C62.36-2014 (Revision of IEEE Std C62.36-2000) I

2、EEE Std C62.36-2014 (Revision of IEEE Std C62.36-2000) IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits Sponsor Surge Protective Devices Committee of the IEEE Power and Energy Society Approved 27 March 2014 IEEE-SA Standards Board Abstr

3、act: Surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 Vrms, or 1200 V dc are covered by this standard. These surge protectors are designed to limit voltage surges, current surges, or both.

4、The methods of testing and criteria for determining the end of life of electrical surge protectors used in low-voltage data, communications, and signaling circuits are described. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements, pack

5、aged for the purpose of limiting voltage, current, or both. This standard is not intended to cover packaged single gas tube, air gap, varistor, or avalanche junction surge-protective devices, which are covered by IEEE Std C62.31 B21, IEEE Std C62.32 B22, IEEE Std C62.33 B23, and IEEE Std C62.35 B24,

6、 respectively. Keywords: communications circuits, current limiters, data circuits, electrical protection, IEEE C62.36, signaling circuits, surge protectors, surge-protective devices, voltage limiters The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997,

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36、014 IEEE. All rights reserved. vi Participants At the time this IEEE standard was completed, the 3.6.7 LV Data, Communications and Signaling Circuit Surge Protective Devices Working Group had the following membership: Albert Martin, Chair Robert Ashton Frank Basciano Nisar Chaudhry Leonard Drewes Ga

37、llo Ernie Bogey Klabassa Peter Kobsa Michael Maytum Wolfgang Oertel Tim Patel Bill Travis The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Robert Ashton William Bush William Byrd Su

38、resh Channarasappa Chuanyou Dai Carlo Donati Gary Donner Randall Groves Raymond Hill Ronald Hotchkiss Yuri Khersonsky Chad Kiger Jim Kulchisky Saumen Kundu Chung-Yiu Lam Paul Lindemulder Greg Luri Ahmad Mahinfallah Albert Martin Michael Maytum William McBride Daleep Mohla Michael Newman Gary Nissen

39、Wolfgang Oertel Lorraine Padden Thomas Phipps Ulrich Pohl Percy Pool Michael Roberts Thomas Rozek Bartien Sayogo Robert Schuerger James Smith Jerry Smith Gary Stoedter David Tepen Donald Turner John Vergis Matthew Wakeham James WilsonCopyright 2014 IEEE. All rights reserved. vii When the IEEE-SA Sta

40、ndards Board approved this standard on 27 March 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Stephen Dukes Jean-Phillippe Faure Gary Hoffman

41、Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David J. Law Hung Ling Oleg Logvinov Ted Olsen Glenn Parsons Ron Peterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritu Also included are the following nonvoting IEEE-SA Standards Board liaisons: Rich

42、ard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE-SA Content Publishing Malia Zaman IEEE-SA Standards Technical Community Copyright 2014 IEEE. All rights reserved. viii Introduction This introduction is not part of IEEE Std C62.36-2014, IEEEIEEE Standard for

43、Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits. This standard was originally developed to establish methods for testing characteristics and for identifying criteria that determine the end of life for surge protectors used in low-voltage data, commu

44、nications, and signaling circuits. This edition of the standard is a major rewrite of the 2000 edition. It has two main changes from the previous edition. One is reformatted test clauses so that each test clause now has subclauses covering background, purpose, equipment to be used, protector states

45、to test, a step-by-step test procedure, alternative tests (if any), suggested test data, requirements (if any), and comments (if any). The second is reorganized tests by characteristics and ratings, rather than by nonsurge performance tests and active performance tests. Some of the tests in the prev

46、ious edition have been deleted (subclauses 7.1, 7.2, 7.11, 7.12, 7.13, 8.6, and 8.11 in the previous edition). Some new tests have been added (7.4, 7.5, 8.10, 8.12, 8.13, 8.14, 8.15, and 8.16). The remaining tests have been updated to reflect current practice. For those tests where it is appropriate

47、, end-of-life conditions are reflected in the requirements. The purpose of this standard is to establish tests for the ratings and characteristics of surge protectors packaged for the purpose of limiting surge voltages, currents, or both. These surge protectors contain at least one nonlinear element

48、. Because these test methods and criteria apply to a range of surge protectors used in various environmental conditions and include various combinations of elements, not all tests are appropriate for every surge protector. Manufacturers and users may determine which tests apply to a surge protector

49、intended for a specific application. These standard test methods should improve the consistency of information on the data sheets for covered surge protectors. Copyright 2014 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Normative references 2 3. Definitions, acronyms, and abbreviations 2 3.1 Definitions . 2 3.2 Acronyms and abbreviations . 3 4. Service conditions 4 4.1 Normal service conditions . 4 4.2 Unusual service conditions 5 4.3 Radiation 6 5. Basic configurations . 6 6. Standard design test procedure . 8 6.1 Standar