IEEE 1668-2014 en Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 10.pdf

《IEEE 1668-2014 en Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 10.pdf》由会员分享，可在线阅读，更多相关《IEEE 1668-2014 en Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 10.pdf（92页珍藏版）》请在麦多课文档分享上搜索。

1、 IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V Sponsored by the Power Systems Engineering Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Industry Applications Society IEEE Std 166

2、8-2014 IEEE Std 1668-2014 IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V Sponsor Power Systems Engineering Committee of the IEEE Industry Applications Society Approved 21 August 2014 IEEE-SA Stan

3、dards Board Grateful Acknowledgment The following material from CIGRE Working Group C4.1 10 Final Report, Voltage Dip Immunity of Equipment and Installations, April 2010 is reprinted with permission: Table 7, adapted from Table 6-5 page 185 of CIGRE report Figure 19, adapted from 6-6 page 145 and Fi

4、g 6-35 page 160 of CIGRE report Table 8, adapted from Fig 2-17 page 40, and from Table 4.1 page IO1 of CIGRE report Table 9, from un-numbered table on page 35 of CIGRE report Figure 20 adapted from Table 4.2, Page 102 of CIGRE report Figure 21 adapted from Table 4.1 on page 101 of CIGRE report and T

5、able 4.2 and Table 4.3 on page 104 of CIGRE report Table A.1 adapted from Table 4.1 on page 101 of CIGRE report and Table 4.2 and Table 4.3 on page 104 of CIGRE report Abstract: A trial-use, non-industry-specific recommended practice for voltage sag and short interruption ride-through performance an

6、d compliance testing for all electrical and electronic equipment connected to low-voltage power systems that can experience malfunction or shutdown as a result of reductions in supply voltage lasting less than one minute is detailed in this document. Testing procedures and requirements for test equi

7、pment are clearly defined within this document to reflect this electrical environment, including single-phase, two-phase, and three-phase balanced and unbalanced voltage sags. Requirements for certification and test reporting, including characterization of voltage-sag ride-through equipment are also

8、 defined. Keywords: equipment testing, IEEE 1668, immunity, power quality, ride-through, voltage dip, voltage sag, voltage-sag characteristics The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Ele

9、ctronics Engineers, Inc. All rights reserved. Published 22 September 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In ad

10、dition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test

11、, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from us

12、ers of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEE

13、E Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR A

14、NY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR

15、 TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review

16、 of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operatio

17、ns Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standar

18、ds shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IE

19、EE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned

20、interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in

21、those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted t

22、o the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any

23、 applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may no

24、t be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulati

25、ons, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to pay

26、ment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center,

27、 Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents

28、 should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together w

29、ith any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not who

30、lly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata,

31、 visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standa

32、rds can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter

33、covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the

34、statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and condi

35、tions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be requir

36、ed, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standa

37、rd are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Publication of this trial-use standard for comment and critici

38、sm has been approved by the Institute of Electrical and Electronics Engineers, Inc. Trial-use standards are effective for 24 months from the date of publication. Comments for revision will be accepted for 18 months after publication. Suggestions for revision should be directed to the Secretary, IEEE

39、-SA Standards Board, 445 Hoes Lane, Piscataway, NJ 08855. It is expected that following the 24-month period, this trial-use standard, revised as necessary, shall be submitted to the IEEE-SA Standards Board for approval as a full-use standard. Copyright 2014 IEEE. All rights reserved. viParticipants

40、At the time this IEEE trial-use recommended practice was completed, the Voltage Sag Ride-through Working Group had the following membership: Doug Dorr, Chair Scott Anderson, Vice Chair Yves Allard William Brumsickle Math Bollen Jack Caufield John Coffman Sasa Djokic Brian Fortenbery Robert Gettier G

41、ary Malhoit Brad Martin John Mentzer Mark Minzlaff Melinda Norris Gregory Olson Greg Rieder James Rossman Mark Rucker Salman Sabbah Mark Stephens Rick Temple Chuck Thomas John-Carl Zarella The following members of the individual balloting committee voted on this trial-use recommended practice. Ballo

42、ters may have voted for approval, disapproval, or abstention. William Ackerman Emmanuel Agamloh Ali Al Awazi Mihaela Albu Steven Alexanderson Saleman Alibhay Gabriele F. D. Alleva Curtis Ashton George Ballassi G. Bartok Steven Bezner Thomas Bishop William Bloethe Math Bollen Kenneth Bow William Brum

43、sickle Gustavo Brunello William Bush Paul Cardinal Keith Chow Stephen Conrad Jerry Corkran Luis Coronado Randall Cunico Chuanyou Dai James Daley Glenn Davis Sasa Djokic Dieter Dohnal Gary Donner Doug Dorr Neal Dowling Gearold O. H. Eidhin Ahmed El Serafi Alexander Emanuel Dan Evans Keith Flowers Ros

44、tyslaw Fostiak Carl Fredericks Frank Gerleve Robert Gettier Mietek Glinkowski Jalal Gohari Stephen Grier J. Travis Griffith Randall Groves Thomas Gruzs Ajit Gwal Paul Hamer Jerry Harness Richard Harp Charles Henville Gary Heuston Werner Hoelzl Soonwook Hong Philip Hopkinson Ronald Jarrett Charles Je

45、nsen Andrew Jones Laszlo Kadar Yuri Khersonsky Jim Kulchisky Saumen Kundu Thomas Ladson Chung-Yiu Lam Thomas La Rose Ed Larsen Raluca Lascu Theo Laughner William Lockley Russell Lowe Bruce Mackie Gary Malhoit John McAlhaney, Jr. Walter McCannon Peter Megna James Michalec T. David Mills Sujeet Mishra

46、 Jerry Murphy R. Murphy Bruce Muschlitz Michael Newman Gregory Olson Lorraine Padden Bansi Patel Christopher Petrola Henry Pinto Ulrich Pohl Iulian Profir Michael Roberts Charles Rogers John Rossetti James Rossman Bob Saint Bartien Sayogo Robert Schuerger Kenneth Sedziol Michael Simon Veselin Skendz

47、ic Jerry Smith John Spare Mark Stephens Gary Stoedter Peter Sutherland James Swank Peter Tirinzoni Joe Uchiyama Eric Udren John Vergis Matthew Wakeham Daniel Ward Kenneth White Matthew Wilkowski Jian Yu When the IEEE-SA Standards Board approved this trial-use recommended practice on 21 August 2014,

48、it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David

49、 J. Law Hung Ling Oleg Logvinov Ted Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Patrick Gibbons IEEE-SA Content Publishing Lisa Perry IEEE-SA Technical Community Programs Copyright 2014 IEEE. All rights reserved. vii Introduction This introduction is not part of IEEE Std 1668-2014, IEEE Trial-Use Recommended Practice for Voltage Sag and Short Inte