ANSI IEEE N42 47-2010 American National Standard for Measuring the Imaging Performance of X-ray and Gamma-ray Systems for Security Screening of Humans.pdf
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4、6g3g33 Augustg3g21g19g20g19g49g23g21g17g23g26ANSI N42.47-2010 American National Standard for Measuring the Imaging Performance of X-ray and Gamma-ray Systems for Security Screening of Humans Sponsor National Committee on Radiation Instrumentation, N42 Accredited by the American National Standards In
5、stitute Secretariat Institute of Electrical and Electronics Engineers, Inc. Approved 27 July 2010 American National Standards Institute Abstract: This standard applies to security screening systems that utilize x-ray or gamma radiation and are used to inspect people who are not inside vehicles, cont
6、ainers, or enclosures. Specifically, this standard applies to systems used to detect objects carried on or within the body of the individual being exposed. The purpose of this standard is to provide standard methods of measuring and reporting imaging quality characteristics and establish minimum acc
7、eptable performance requirements. Keywords: body scanner, gamma-ray, imaging performance, materials detection, minimum requirements, penetration, personnel scanner, security screening, spatial resolution, wire detection, x-ray g120The Institute of Electrical and Electronics Engineers, Inc. 3 Park Av
8、enue, New York, NY 10016-5997, USA Copyright 2010 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 3 August 2010. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1-978-750-8400. Permission to photocopy portions
9、of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of ANSI N42.47, American National Standard for Measuring the Imaging Performance of X-ray and Gamma-ray Systems for Security Screening of H
10、umans This standard is the responsibility of the Accredited American Standards Committee on Radiation Instrumentation, N42. The standard was approved by N42 letter ballot. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance wit
11、h the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is
12、not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in privat
13、e self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE stand
14、ards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document togeth
15、er with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xp
16、l/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed
17、at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. v Copyright 2010 IEEE. All rights reserved. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/re
18、ading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in conne
19、ction therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a L
20、etter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further informatio
21、n may be obtained from the IEEE Standards Association. vi Copyright 2010 IEEE. All rights reserved. Participants At the time it approved this standard, the Accredited Standards Committee on Radiation Instrumentation, N42, had the following membership: Michael P. Unterweger, Chair Louis Costrell, Dep
22、uty Chair William Ash, Administrative Secretary Organization Represented.Name of Representative Bartlett Services . Morgan Cox Canberra.Bob Huckins Chew, M.H. Jack M. Selby Commerce Dept, U.S. NIST Michael P. Unterweger .Louis Costrell* (Alt.) Consultant . Frank X. Masse Department of Homeland Secur
23、ity .Peter Shebell Entergy-ANO. Ron Schwartz Health Physics Society Sandy Perle Harvard University . Joseph Ring IEEE . Louis Costrell* . Anthony Spurgin (Alt.) Michael P. Unterweger (Alt.) International Medcom .Don Sythe Lawrence Berkeley National Lab . Edward J. Lampo Computer Dependability Associ
24、ates, LLCGary Johnson NASA, GSFC R. Sachidananda Babu Nuclear Standards UnlimitedAl N. Tschaeche Oak Ridge National Laboratory. Peter J. Chiaro, Jr. .Charles Britton (Alt.) Ortec-Ametek Corp Ronald M. Keyser Pacific Northwest National Laboratory. Richard Kouzes Swinth Associates Kenneth L. Swinth U.
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