IEC 61207-7-2013 Expression of performance of gas analyzers - Part 7 Tuneable semiconductor laser gas analyzers《气体分析器性能表示 第7部分 可调谐半导体激光气体分析器》.pdf

《IEC 61207-7-2013 Expression of performance of gas analyzers - Part 7 Tuneable semiconductor laser gas analyzers《气体分析器性能表示 第7部分 可调谐半导体激光气体分析器》.pdf》由会员分享，可在线阅读，更多相关《IEC 61207-7-2013 Expression of performance of gas analyzers - Part 7 Tuneable semiconductor laser gas analyzers《气体分析器性能表示 第7部分 可调谐半导体激光气体分析器》.pdf（50页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 61207-7 Edition 1.0 2013-09 INTERNATIONAL STANDARD NORME INTERNATIONALE Expression of performance of gas analyzers Part 7: Tuneable semiconductor laser gas analyzers Expression des performances des analyseurs de gaz Partie 7: Analyseurs de gaz laser semiconducteurs accordables IEC61207-7:2013 c

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16、 STANDARD NORME INTERNATIONALE Expression of performance of gas analyzers Part 7: Tuneable semiconductor laser gas analyzers Expression des performances des analyseurs de gaz Partie 7: Analyseurs de gaz laser semiconducteurs accordables INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTEC

17、HNIQUE INTERNATIONALE T ICS 19.040; 71.040.40 PRICE CODE CODE PRIX ISBN 978-2-8322-1117-5 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distr

18、ibutor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colourinside 2 61207-7 IEC:2013 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 7 4 Procedure for specification . 10 4.1 General . 10 4.2 I

19、n situ analyzers 10 4.2.1 Additional operation and maintenance requirements 10 4.2.2 Additional terms related to the specification of performance 10 4.2.3 Additional limits of uncertainties 11 4.3 Extractive analyzers 11 4.3.1 Additional operation and maintenance requirements 11 4.3.2 Additional ter

20、ms related to the specification of performance 12 4.4 Recommended standard values and range of influence quantities . 12 4.5 Laser safety 12 5 Procedures for compliance testing 12 5.1 In situ analyzers 12 5.1.1 General . 12 5.1.2 Apparatus to simulate measurement condition . 13 5.1.3 Apparatus to ge

21、nerate test gas mixture . 13 5.1.4 Apparatus to investigate the attenuation induced by opaque dust, liquid droplets and other particles 13 5.1.5 Testing procedures 14 5.2 Extractive analyzers 16 5.2.1 General . 16 5.2.2 Apparatus to generate test gas mixture . 16 5.2.3 Testing procedures 16 Annex A

22、(informative) Systems of tuneable semiconductor laser gas analyzers . 18 Annex B (normative) Examples of the test apparatus . 19 Bibliography 23 Figure A.1 Tuneable semiconductor laser gas analyzers 18 Figure B.1 Example of a test apparatus to simulate measurement condition for across-duct and open-

23、path analyzers 19 Figure B.2 Example of a test apparatus to simulate measurement condition for probe type analyzers 19 Figure B.3 Example of apparatus to generate the test gas mixture . 20 Figure B.4 Delay time, rise time and fall time . 21 Figure B.5 Example of a grid to simulate the attenuation by

24、 the dust in optical path . 22 61207-7 IEC:2013 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ EXPRESSION OF PERFORMANCE OF GAS ANALYZERS Part 7: Tuneable semiconductor laser gas analyzers FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization

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31、egional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried o

32、ut by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committe

33、es for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to th

34、e Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held

35、 responsible for identifying any or all such patent rights. International Standard IEC 61207-7 has been prepared by subcommittee 65B: Measurement and control devices, of IEC technical committee 65: Industrial-process measurement, control and automation. The text of this standard is based on the foll

36、owing documents: FDIS Report on voting 65B/876/FDIS 65B/891/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This International Standard is to be used in conjunction with IEC 61207-1:2010. This publication has bee

37、n drafted in accordance with the ISO/IEC Directives, Part 2. 4 61207-7 IEC:2013 A list of all parts of the IEC 61207 series, under the general title Expression of performance of gas analyzers, can be found on the IEC website. The committee has decided that the contents of this publication will remai

38、n unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover pag

39、e of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 61207-7 IEC:2013 5 INTRODUCTION This part of IEC 61207 includes the terminology, definitions, s

40、tatements and tests that are specific to tuneable semiconductor laser gas analyzers, which utilize tuneable semiconductor laser absorption spectroscopy (TSLAS). Tuneable semiconductor laser gas analyzers utilize tuneable semiconductor lasers (e.g. diode lasers, quantum cascade lasers, interband casc

41、ade lasers) as light sources, whose wavelength covers ultraviolet, visible and infrared part of the electromagnetic spectrum, to detect the absorption spectra and thus determine the concentration of gases to be analyzed. These analyzers may employ different TSLAS techniques such as direct absorption

42、 spectroscopy, frequency modulation spectroscopy (FMS), wavelength modulation spectroscopy (WMS), etc. Multi-pass absorption spectroscopy, photoacoustic spectroscopy (PAS), and cavity-enhanced absorption spectroscopy (CEAS) such as cavity-ringdown spectroscopy (CRDS) are also used to take advantage

43、of their high detection sensitivity. Tuneable semiconductor laser gas analyzers are usually used to measure concentration of small molecule gases, such as oxygen, carbon monoxide, carbon dioxide, hydrogen sulfide, ammonia, hydrogen fluoride, hydrogen chloride, nitrogen dioxide, water vapour etc. The

44、re are two main types of tuneable semiconductor laser gas analyzers: extractive and in situ analyzers. The extractive analyzers measure the sample gas withdrawn from a process or air by a sample handling system. The in situ analyzers measure the gas in its original place, including across-duct, prob

45、e and open-path types. Across-duct analyzers either have a laser source and a detector mounted on opposite sides of a duct, or both the laser and the detector are mounted on the same side and a retroreflector on the opposite side of a duct. Probe analyzers comprise a probe mounted into the duct, and

46、 the measured gas either passes through or diffuses into the measuring optical path inside the probe. And open-path analyzers measure the gas in an open environment with a hardware approach similar to across duct analyzers (source and detector on opposite sides of the open area or a retroreflector o

47、n one side and the source and detector on the opposite side), except the sample is in an open path and not contained in a duct. NOTE 1 Traditionally, only diode lasers were employed, and thus tuneable diode laser gas analyzers and tuneable diode laser absorption spectroscopy (TDLAS) are widely used

48、terms. However, with the development of laser technology, many other types of semiconductor lasers, such as quantum cascade lasers (QCLs) and interband cascade lasers (ICLs) have been developed and employed in laser gas analyzers. Therefore, the term of semiconductor laser rather than diode laser is

49、 used in this standard to reflect this technology advancement. NOTE 2 Though tuneable semiconductor laser photoacoustic spectroscopy (PAS) is in principle different from absorption spectroscopy typically used in tuneable semiconductor laser gas analyzers, the hardware and data reduction software are almost the same for analyzers utilizing these two spectroscopy technologies, and thus PAS is considered a variant of absorption spectroscopy and this s