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国际标准,IEC,ISO,IEEE,JIS,ANSI,AS,EU,BS,GOST,IEC,IEEE,ISA,JASO,JIS,NASM资源 (共32716 份)

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BS EN 60749-7-2011 Semiconductor devices Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases《半导体装置机械和气候耐受性试验方法其他残余.pdf

下载积分： 10000 积分

BS EN 60749-7-2011 Semiconductor devices Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases《半导体装置机械和气候耐受性试验方法其他残余.pdf

BS EN 60749-6-2002 Semiconductor devices - Mechanical and climatic test methods - Storage at high temperature《半导体器件机械和气候试验方法高温下储存》.pdf

下载积分： 10000 积分

BS EN 60749-6-2002 Semiconductor devices - Mechanical and climatic test methods - Storage at high temperature《半导体器件机械和气候试验方法高温下储存》.pdf

BS EN 60749-5-2017 Semiconductor devices Mechanical and climatic test methods Steady-state temperature humidity bias life test《半导体器件机械和气候试验方法稳态温度湿度偏差寿命试验》.pdf

下载积分： 10000 积分

BS EN 60749-5-2017 Semiconductor devices Mechanical and climatic test methods Steady-state temperature humidity bias life test《半导体器件机械和气候试验方法稳态温度湿度偏差寿命试验》.pdf

BS EN 60749-44-2016 Semiconductor devices Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices《半导体器件机械和气候试验.pdf

下载积分： 10000 积分

BS EN 60749-44-2016 Semiconductor devices Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices《半导体器件机械和气候试验.pdf

BS EN 60749-42-2014 Semiconductor devices Mechanical and climatic test methods Temperature and humidity storage《半导体器件机械和气候试验方法温度和湿度存储》.pdf

下载积分： 10000 积分

BS EN 60749-42-2014 Semiconductor devices Mechanical and climatic test methods Temperature and humidity storage《半导体器件机械和气候试验方法温度和湿度存储》.pdf

BS EN 60749-40-2011 Semiconductor devices Mechanical and climatic test methods Board level drop test method using a strain gauge《半导体装置机械和气候试验方法利用变形测量器进行的板级落锤试验法》.pdf

下载积分： 10000 积分

BS EN 60749-40-2011 Semiconductor devices Mechanical and climatic test methods Board level drop test method using a strain gauge《半导体装置机械和气候试验方法利用变形测量器进行的板级落锤试验法》.pdf

BS EN 60749-4-2002 Semiconductor devices - Mechanical and climatic test methods - Damp heat steady state highly accelerated stress test (HAST)《半导体器件机械和气候试验方法湿热、稳态态、高加速应力试验（HAST）》.pdf

下载积分： 10000 积分

BS EN 60749-4-2002 Semiconductor devices - Mechanical and climatic test methods - Damp heat steady state highly accelerated stress test (HAST)《半导体器件机械和气候试验方法湿热、稳态态、高加速应力试验（HAST）》.pdf

BS EN 60749-39-2006 Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconduc.pdf

下载积分： 10000 积分

BS EN 60749-39-2006 Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconduc.pdf

BS EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件机械和气候试验方法带存储器的半导体器件用软.pdf

下载积分： 10000 积分

BS EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件机械和气候试验方法带存储器的半导体器件用软.pdf

BS EN 60749-37-2008 Semiconductor ndevices — Mechanical nand climatic test nmethods — nPart 37 Board level drop test method nusing an accelerometer《半导体装置机械和气候试验方法使用加速计的电路板级落锤试验方法.pdf

下载积分： 10000 积分

BS EN 60749-37-2008 Semiconductor ndevices — Mechanical nand climatic test nmethods — nPart 37 Board level drop test method nusing an accelerometer《半导体装置机械和气候试验方法使用加速计的电路板级落锤试验方法.pdf

BS EN 60749-36-2003 Semiconductor devices - Mechanical and climatic test methods - Acceleration steady state《半导体器件机械和气候试验方法稳态加速》.pdf

下载积分： 10000 积分

BS EN 60749-36-2003 Semiconductor devices - Mechanical and climatic test methods - Acceleration steady state《半导体器件机械和气候试验方法稳态加速》.pdf

BS EN 60749-35-2006 Semiconductor devices - Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components《半导体器件机械和气候试验方法塑封电子器件的声学显微方法》.pdf

下载积分： 10000 积分

BS EN 60749-35-2006 Semiconductor devices - Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components《半导体器件机械和气候试验方法塑封电子器件的声学显微方法》.pdf

BS EN 60749-34-2010 Semiconductor devices Mechanical and climatic test methods Power cycling《半导体器件机械和环境测试方法动力循环》.pdf

下载积分： 10000 积分

BS EN 60749-34-2010 Semiconductor devices Mechanical and climatic test methods Power cycling《半导体器件机械和环境测试方法动力循环》.pdf

BS EN 60749-33-2004 Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave《半导体器件机械和气候试验方法加速耐湿性无偏差压热器》.pdf

下载积分： 10000 积分

BS EN 60749-33-2004 Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave《半导体器件机械和气候试验方法加速耐湿性无偏差压热器》.pdf

BS EN 60749-32-2003+A1-2010 Semiconductor devices Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)《半导体器件机械和气候试验方法塑料密封器件的易燃性(.pdf

下载积分： 10000 积分

BS EN 60749-32-2003+A1-2010 Semiconductor devices Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)《半导体器件机械和气候试验方法塑料密封器件的易燃性(.pdf

BS EN 60749-31-2003 Semiconductor devices - Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced)《半导体器件机械和气候试验方法塑料包封器件的易燃性(内部感应.pdf

下载积分： 10000 积分

BS EN 60749-31-2003 Semiconductor devices - Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced)《半导体器件机械和气候试验方法塑料包封器件的易燃性(内部感应.pdf

BS EN 60749-3-2002 Semiconductor devices - Mechanical and climatic test methods - External visual examination《半导体器件机械和气候试验方法目视检验》.pdf

下载积分： 10000 积分

BS EN 60749-3-2002 Semiconductor devices - Mechanical and climatic test methods - External visual examination《半导体器件机械和气候试验方法目视检验》.pdf

BS EN 60749-29-2011 Semiconductor devices Mechanical and climatic test methods Latch-up test《半导体装置机械和气候耐受性试验方法闩锁效应测试》.pdf

下载积分： 10000 积分

BS EN 60749-29-2011 Semiconductor devices Mechanical and climatic test methods Latch-up test《半导体装置机械和气候耐受性试验方法闩锁效应测试》.pdf

BS EN 60749-28-2017 Semiconductor devices Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing Charged device model (CDM) Device level《半导体器件机械和气候.pdf

下载积分： 10000 积分

BS EN 60749-28-2017 Semiconductor devices Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing Charged device model (CDM) Device level《半导体器件机械和气候.pdf

BS EN 60749-26-2014 Semiconductor devices Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing Human body model (HBM)《半导体器件机械和气候试验方法静电放电(ESD)灵敏度.pdf

下载积分： 10000 积分

BS EN 60749-26-2014 Semiconductor devices Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing Human body model (HBM)《半导体器件机械和气候试验方法静电放电(ESD)灵敏度.pdf

BS EN 60749-25-2003 Semiconductor devices - Mechanical and climatic test methods - Temperature cycling《半导体器件机械和气候试验方法温度循环》.pdf

下载积分： 10000 积分

BS EN 60749-25-2003 Semiconductor devices - Mechanical and climatic test methods - Temperature cycling《半导体器件机械和气候试验方法温度循环》.pdf

BS EN 60749-24-2004 Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased HAST《半导体器件机械和气候试验方法加速耐湿性无偏差HAST》.pdf

下载积分： 10000 积分

BS EN 60749-24-2004 Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased HAST《半导体器件机械和气候试验方法加速耐湿性无偏差HAST》.pdf

BS EN 60749-22-2003 Semiconductor devices - Mechanical and climatic test methods - Bond strength《半导体器件机械和气候试验方法粘接强度》.pdf

下载积分： 10000 积分

BS EN 60749-22-2003 Semiconductor devices - Mechanical and climatic test methods - Bond strength《半导体器件机械和气候试验方法粘接强度》.pdf

BS EN 60749-21-2011 Semiconductor devices Mechanical and climatic test methods Solderability《半导体装置机械和气候耐受性试验方法可焊性》.pdf

下载积分： 10000 积分

BS EN 60749-21-2011 Semiconductor devices Mechanical and climatic test methods Solderability《半导体装置机械和气候耐受性试验方法可焊性》.pdf

BS EN 60749-20-2009 Semiconductor devices - Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat《半导体.pdf

下载积分： 10000 积分

BS EN 60749-20-2009 Semiconductor devices - Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat《半导体.pdf

BS EN 60749-20-1-2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the com.pdf

下载积分： 10000 积分

BS EN 60749-20-1-2009 Semiconductor devices - Mechanical and climatic test methods - Part 20-1 Handling packing labelling and shipping of surface-mount devices sensitive to the com.pdf

BS EN 60749-2-2002 Semiconductor devices - Mechanical and climatic test methods - Low air pressure《半导体装置机械和气候试验方法低气压》.pdf

下载积分： 10000 积分

BS EN 60749-2-2002 Semiconductor devices - Mechanical and climatic test methods - Low air pressure《半导体装置机械和气候试验方法低气压》.pdf

BS EN 60749-18-2003 Semiconductor devices - Mechanical and climatic test methods - Ionizing radiation (total dose)《半导体器件机械和气候试验方法电离辐射(总剂量)》.pdf

下载积分： 10000 积分

BS EN 60749-18-2003 Semiconductor devices - Mechanical and climatic test methods - Ionizing radiation (total dose)《半导体器件机械和气候试验方法电离辐射(总剂量)》.pdf

BS EN 60749-17-2003 Semiconductor devices - Mechanical and climatic test methods - Neutron irradiation《半导体器件机械和气候试验方法中子辐照》.pdf

下载积分： 10000 积分

BS EN 60749-17-2003 Semiconductor devices - Mechanical and climatic test methods - Neutron irradiation《半导体器件机械和气候试验方法中子辐照》.pdf

BS EN 60749-16-2003 Semiconductor devices - Mechanical and climatic test methods - Particle impact noise detection (PIND)《半导体器件机械和气候试验方法粒子冲击噪音探测(PIND)》.pdf

下载积分： 10000 积分

BS EN 60749-16-2003 Semiconductor devices - Mechanical and climatic test methods - Particle impact noise detection (PIND)《半导体器件机械和气候试验方法粒子冲击噪音探测(PIND)》.pdf

BS EN 60749-14-2003 Semiconductor devices - Mechanical and climatic test methods - Robustness of terminations (lead integrity)《半导体器件机械和气候试验方法端子的耐久性》.pdf

下载积分： 10000 积分

BS EN 60749-14-2003 Semiconductor devices - Mechanical and climatic test methods - Robustness of terminations (lead integrity)《半导体器件机械和气候试验方法端子的耐久性》.pdf

BS EN 60749-11-2002 Semiconductor devices - Mechanical and climatic test methods - Rapid change of temperature - Two-fluid-bath method《半导体装置机械和气候试验方法温度速变双流体浸泡法》.pdf

下载积分： 10000 积分

BS EN 60749-11-2002 Semiconductor devices - Mechanical and climatic test methods - Rapid change of temperature - Two-fluid-bath method《半导体装置机械和气候试验方法温度速变双流体浸泡法》.pdf

BS EN 60749-10-2002 Semiconductor devices - Mechanical and climatic test methods - Mechanical shock《半导体装置机械和气候试验方法机械振动》.pdf

下载积分： 10000 积分

BS EN 60749-10-2002 Semiconductor devices - Mechanical and climatic test methods - Mechanical shock《半导体装置机械和气候试验方法机械振动》.pdf

BS EN 60749-1-2003 Semiconductor devices - Mechanical and climatic test methods - General《半导体器件机械和气候试验方法总则》.pdf

下载积分： 10000 积分

BS EN 60749-1-2003 Semiconductor devices - Mechanical and climatic test methods - General《半导体器件机械和气候试验方法总则》.pdf

BS EN 60747-5-5-2011 Semiconductor devices Discrete devices Optoelectronic devices Photocouplers《半导体器件分立器件光电器件光电耦合器》.pdf

下载积分： 10000 积分

BS EN 60747-5-5-2011 Semiconductor devices Discrete devices Optoelectronic devices Photocouplers《半导体器件分立器件光电器件光电耦合器》.pdf

BS EN 60747-5-1-2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - General《半导体分立器件和集成电路光电器件总则》.pdf

下载积分： 10000 积分

BS EN 60747-5-1-2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - General《半导体分立器件和集成电路光电器件总则》.pdf

BS EN 60747-16-5-2013 Semiconductor devices Microwave integrated circuits Oscillators《半导体装置微波集成电路振荡器》.pdf

下载积分： 10000 积分

BS EN 60747-16-5-2013 Semiconductor devices Microwave integrated circuits Oscillators《半导体装置微波集成电路振荡器》.pdf

BS EN 60747-16-10-2004 Semiconductor devices - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits《半导体器件单片微波集成电路的技术验收程序(TAS)》.pdf

下载积分： 10000 积分

BS EN 60747-16-10-2004 Semiconductor devices - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits《半导体器件单片微波集成电路的技术验收程序(TAS)》.pdf

BS EN 60747-16-1-2002+A1-2007 Semiconductor ndevices — nPart 16-1 Microwave integrated ncircuits — Amplifiers《半导体器件微波集成电路放大器》.pdf

下载积分： 10000 积分

BS EN 60747-16-1-2002+A1-2007 Semiconductor ndevices — nPart 16-1 Microwave integrated ncircuits — Amplifiers《半导体器件微波集成电路放大器》.pdf

BS EN 60747-16-1-2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers《分立的半导体器件和集成电路微波集成电路放大器》.pdf

下载积分： 10000 积分

BS EN 60747-16-1-2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers《分立的半导体器件和集成电路微波集成电路放大器》.pdf

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