BS EN 60749-36-2003 Semiconductor devices - Mechanical and climatic test methods - Acceleration steady state《半导体器件 机械和气候试验方法 稳态加速》.pdf

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1、BRITISH STANDARD BS EN 60749-36:2003 Semiconductor devices Mechanical and climatic test methods Part 36: Acceleration, steady state The European Standard EN 60749-36:2003 has the status of a British Standard ICS 31.080.01 BS EN 60749-36:2003 This British Standard was published under the authority of

2、 the Standards Policy and Strategy Committee on 19 June 2003 BSI 19 June 2003 ISBN 0 580 42065 5 National foreword This British Standard is the official English language version of EN 60749-36:2003. It is identical with IEC 60749-36:2003. It partially supersedes BS EN 60749:1999 which will be withdr

3、awn on 2006-04-01. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which imp

4、lement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication d

5、oes not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/Europ

6、ean committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pag

7、es 2 to 5 and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60749-36 NORME EUROPENNE EUROPISCHE NORM April 2003 CENELEC European Committee for Electrotechnica

8、l Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 607

9、49-36:2003 E ICS 31.080.01 English version Semiconductor devices Mechanical and climatic test methods Part 36: Acceleration, steady state (IEC 60749-36:2003) Dispositifs semiconducteurs Mthodes dessais mcaniques et climatiques Partie 36: Acclration constante (CEI 60749-36:2003) Halbleiterbauelemente

10、 Mechanische und klimatische Prfverfahren Teil 36: Gleichmiges Beschleunigen (IEC 60749-36:2003) This European Standard was approved by CENELEC on 2003-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standar

11、d the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French

12、, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cz

13、ech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom. EN 60749-36:2003 - 2 - Foreword The text of document 47/1667/FDIS, future edition 1 of IEC 60749-36, p

14、repared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60749-36 on 2003-04-01. This mechanical and climatic test method, as it relates to acceleration, steady state, is a complete rewrite of the test contained in Clause 5, Chapte

15、r 2 of EN 60749:1999. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2004-01-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow)

16、 2006-04-01 Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60749-36:2003 was approved by CENELEC as a European Standard without any modif

17、ication. _ 2egaP 3002:6294706NEPage2 EN6074936:200360749-36 IEC:2003 3 SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 36: Acceleration, steady state 1 Scope This part of IEC 60749 provides a test for determining the effects of constant acceleration on cavity-type semiconductor devic

18、es. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test. It may be used as a high stress (destructive) test to determine the mechanical limits of the package, internal metallisation and lead system, die or

19、substrate attachment, and other elements of the microelectronic device. When proper stress levels have been established this test method may also be employed as a non-destructive in-line 100 % screen to detect and eliminate devices with lower than normal mechanical strengths in any of the structural

20、 elements. In general, this acceleration steady-state test method is in conformity with IEC 60068-2-7 but, due to specific requirements of semiconductors, the clauses of this standard apply. 2 Normative references The following referenced documents are indispensable for the application of this docum

21、ent. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-2-7, Environmental testing Part 2: Tests Test Ga and guidance: Acceleration, steady state 3 Test apparatus Constant accelerat

22、ion tests shall be made on an apparatus capable of applying the specified acceleration for the required time. 4 Procedure The device shall be restrained by its case, or by normal mountings, and the leads or cables secured. Unless otherwise specified, a constant acceleration of the value specified sh

23、all then be applied to the device for 1 min in each of the orientations X 1 , X 2 , Y 1 , Z 1and Z 2 . For devices with internal elements mounted with the major seating plane perpendicular to the Y axis, the Y 1orientation shall be defined as that one in which the elements tend to be removed from th

24、eir mount. Unless otherwise specified, test condition E shall apply. Pa3eg E3002:6294706NPage3 EN6074936:200360749-36 IEC:2003 4 Test condition Stress level ms 2A 50 000 B 100 000 C 150 000 D 200 000 E 300 000 F 500 000 G 750 000 H 1 000 000 J 1 250 000 4.1 Final measurements Hermeticity tests, visu

25、al examination, and electrical measurements (consisting of parametric and functional tests) shall be performed. 4.2 Failure criteria A device shall be defined as a failure if hermeticity cannot be demonstrated, if parametric limits are exceeded, or if functionality cannot be demonstrated under the c

26、onditions specified in the applicable procurement document. Mechanical damage such as cracking, chipping, or breaking of the package will also be considered a failure provided such damage was not caused by fixturing or handling. 5 Summary The following details shall be specified in the relevant spec

27、ification : a) Amount of acceleration to be applied, in ms 2if other than test condition E (see Clause 4). b) Measurements to be made after test, when required. c) Any variations in duration or limitations to orientation (e.g., Y 1only) (see Clause 4). d) Sequence of orientations, if other than as s

28、pecified (see Clause 4). e) Duration of test, if other than as specified (see Clause 4). f) Sample size. _ Page4 3002:6294706NEPage4 EN6074936:2003 - 3 - EN 60749-36:2003 Annex ZA (normative) Normative references to international publications with their corresponding European publications This Europ

29、ean Standard incorporates by dated or undated reference, provisions from other publications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications

30、apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest edition of the publication referred to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the re

31、levant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-2-7 - 1)Basic environmental testing procedures Part 2: Tests - Test Ga and guidance: Acceleration, steady state EN 60068-2-7 1993 2)1)Undated reference. 2)Valid edition at date of issue. 5egaP 3002:6294706NEPage5 EN6074936:2003BS EN 6

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