BS EN 60749-39-2006 Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconduc.pdf
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1、 g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used
2、 for semiconductor componentsThe European Standard EN 60749-39:2006 has the status of a British StandardICS 31.080.01Semiconductor devices Mechanical and climatic test BRITISH STANDARDBS EN 60749-39:2006BS EN 60749-39:2006This British Standard was published under the authority of the Standards Polic
3、y and Strategy Committee on 29 December 2006 BSI 2006ISBN 0 580 49866 2Amendments issued since publicationAmd. No. Date Commentssecretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a Briti
4、sh Standard cannot confer immunity from legal obligations.National forewordThis British Standard was published by BSI. It is the UK implementation of EN 60749-39:2006. It is identical with IEC 60749-39:2006. It partially supersedes BS EN 60749:1999 which will be withdrawn when the last part in the s
5、eries is published. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on EPL/47 can be obtained on request to its EUROPEAN STANDARD EN 60749-39 NORME EUROPENNE EUROPISCHE NORM August 2006 CENELEC European Committee
6、 for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC memb
7、ers. Ref. No. EN 60749-39:2006 E ICS 31.080.01 English version Semiconductor devices - Mechanical and climatic test methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2006) Dispositifs semiconducteurs - Mthod
8、es dessais mcaniques et climatiques Partie 39: Mesure de la diffusion dhumidit et de lhydrosolubilit dans les matriaux organiques utiliss dans les composants semiconducteurs (CEI 60749-39:2006) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren Teil 39: Messung des Feuchtediffusionskoe
9、ffizienten und der Wasserlslichkeit in organischen Werkstoffen, welche bei Halbleiter-Komponenten verwendet werden (IEC 60749-39:2006) This European Standard was approved by CENELEC on 2006-08-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the condi
10、tions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in th
11、ree official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechni
12、cal committees of Austria, Belgium, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the Unite
13、d Kingdom. Foreword The text of document 47/1860/FDIS, future edition 1 of IEC 60749-39, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60749-39 on 2006-08-01. The following dates were fixed: latest date by which the EN
14、has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2007-05-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2009-08-01 _ Endorsement notice The text of the International Standard IEC 60749-
15、39:2006 was approved by CENELEC as a European Standard without any modification. _ EN 60749-39:2006 2 CONTENTS 1 Scope 4 2 Apparatus.4 3 Samples.4 4 Procedure 5 4.1 Sample preparation .5 4.2 Absorption measurements below 100 C 5 4.3 Solubility and diffusivity calculation 7 4.4 Desorption measurement
16、s above 100 C7 5 Calculation of activation energy for moisture diffusion 8 6 Summary .9 Figure 1 Example of linearly increasing mass gain6 EN 60749-39:2006 3 SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 39: Measurement of moisture diffusivity and water solubility in organic materi
17、als used for semiconductor components 1 Scope This part of IEC 60749 details the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are impo
18、rtant parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow. NOTE It is recommended that the moisture absorption parameters used in this standard be obtained from the material suppliers
19、 (such as the resin supplier). 2 Apparatus 2.1 Analytical balance capable of a resolution of either 0,000 01 g or 0,001 % of sample mass. 2.2 High-temperature oven capable of maintaining uniform temperatures from 100 C to 250 C 2 C. 2.3 Temperature/humidity chamber(s) capable of maintaining temperat
20、ures in a range from 30 C to 85 C and relative humidities (HR) in a range from 60 % HRto 85 % HR. Within the chamber working area, temperature tolerance shall be 2 C and the HRtolerance shall be 3 % HR. 2.4 Perforated stainless steel trays or stainless steel wire mesh baskets used for holding sample
21、s and for placement into ovens. 2.5 Large aluminium plate or disk used for heat sink capability. 2.6 Desiccator for holding dry samples. 3 Samples Samples must be flat parallel-sided discs or coupons. The linear dimensions shall be accurately measured to within 0,02 mm. To approximate one-dimensiona
22、l diffusion behaviour with edge effects limited to less than 5 % of the total diffusional moisture mass uptake, the free surface area in the thickness dimension must be less than 5 % of the flat-sided free surface area of the sample. For a disc of radius, r, and thickness, h, the following relation
23、shall be met: h 0,05r (1) EN 60749-39:2006 4 for a coupon of length, L, and width, W, )()(0,05LWWLh+= (2) Recommended sample thickness should be in the range from 0,3 mm to 1,0 mm. It is recommended that the maximum sample thickness should not exceed 1,0 mm, because the time to achieve moisture satu
24、ration at temperatures below 60 C will be excessively long for compounds with slow diffusivity. 4 Procedure 4.1 Sample preparation 4.1.1 Process and cure the samples using recommended processing conditions in accordance with the manufacturers specification. 4.1.2 To obtain the appropriate sample thi
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