DLA SMD-5962-89506 REV A-1993 MICROCIRCUIT DIGITAL FAST CMOS BUS DRIVER MONOLITHIC SILICON《硅单片总线收发器高速互补型金属氧化物半导体数字微电路》.pdf

《DLA SMD-5962-89506 REV A-1993 MICROCIRCUIT DIGITAL FAST CMOS BUS DRIVER MONOLITHIC SILICON《硅单片总线收发器高速互补型金属氧化物半导体数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89506 REV A-1993 MICROCIRCUIT DIGITAL FAST CMOS BUS DRIVER MONOLITHIC SILICON《硅单片总线收发器高速互补型金属氧化物半导体数字微电路》.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、-_ _- m b 0053235 T DEFENSE LOGISTICS AGENCY DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OH 45444- 5270 5 06- %sr 0 iONXCA L. POELKING Chief, Custom Microelectronics Branch Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-999999b 0053236 925 b. ADDRESS

2、(Street, City, State, Zip Code) 5. CAGE CODE 4. ORIGINATOR a. TYPED NAME (First, Middle Initial, Defense Electronics Supply Center 67268 7. CAGE CODE 1507 Wilmington Pike Last) Dayton, OH 45444-5270 67268 9. TITLE OF DOCUMENT IO. REVISION LETTER a. CURRENT b. NEW MICROCIRCUIT, DIGITAL, FAST CMOS, BU

3、S DRIVER, MONOLITHIC SILICON NOTICE OF REVISION (NOR) 6. NOR NO. 5962-R069-94 8. DOCUMENT NO. 5962-89506 11. ECP NO. ti/A I. DATE Form Approved OMB NO. 0704-018E (YYMMDD) a. (X one) 93-1 2-22 This revision described below has been authorized for the document listed. X (1) Existing document supplemen

4、ted by the NOR may be used in manufacture. (2) Revised document must be received before manufacturer may incorporate this change. - Public reporting.burden for this collection is estimated to average 2 hours per response the time for reviewin data needed and compyeting and rev:ewing the collection o

5、f information. this burdenestimate or any other aspect of this collection of information for reducin this burden to De artment of Defense Washingtion Headquarteks Services Directorate for Informa8ion Operatio add “A“. Revisions description column; add “Changes in accordance with NOR 5962-R069-94“. R

6、evisions date column; add “93-12-22“. Revision level block; add “A“. Rev status of sheets; for sheets 1 and 6, add “A“. - Sheet 6: Table I, output disable time, OE to Y, tpHZ and tpLt! . CL = 50 pF, device type 02; change maximum CL = 5.0 pF, device type 01; change maximum Limit from “19.0 ns“ to “9

7、.0 ns“. CL = 5.0 pF, device type 02; change maximum limit from “8.0 ns“ to “7.0 ns“. imit from “7.0 ns“ to “8.0 ns“. Revision level block; add “A“. DESC-ECC I Monica L. Poelkina e. SIGNATURE I d. TITLE f. DATE SIGNED (YYMMDD) 93-12-22 c. DATE SLGNED (YYMMDD) 93-12-22 Provided by IHSNot for ResaleNo

8、reproduction or networking permitted without license from IHS-,-,-= Yb 0053237 8bL = - - -I- REVISIONS I DESCRIPTION DESC FE)% 193 o U.S CoVIRNMiNT PR!HTlf4G OfflCf. 1987- 740.11960911 SEP 27 DISTRIRUTION STATEMENT A. Approved for public release: dislribulion is unlimited. - 5%2-E1175 Provided by IH

9、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE 1.1 m. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, Vrovisiais for the use of MIL-STD-883 in conjunction with conpliant m-JN devicesIl. 1.2 Pa

10、rt nunber. The conplete part Wr shall be as shoun in the following exarrple: 2/ Must withstand the added PD ch to short circuit test; e.g., Im. I SIZE 5962-89506 STANDARDIZED MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 2 DAYTON, OHIO 45444 ? 5962-89506 o1 T K T X C I I

11、I - Drawing mmber Device type Case outline Lead finish per (1.2.1) (1.2.2) MIL-M-38510 I 1.2.1 Device tmes. The device types shall identify the circuit function as folloiic: Device tMe Generic nunber Circuit function o1 54FCT827A IO-bit non-inverting bus driver 02 54FCT827B 10-bit non-invertirig bus

12、 driver 1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows: Outline letter Case outling K F-6 (24-1ead8 X .42Olt X flat package L 3 D-9 (24-1ead8 1.280Il X .31O1I X .20O19, dual-in-line package C-4 (28-temina1, .4611 X .46O1I X .10019, square c

13、hip carrier package 1.3 Absolute maxim ratinss. I/ Supply voltage renge - - - - - - - - - - - - - - - - - - -0.5 V all other inputs at Vcc or GM. circuit condition shall not exceed 1 second. - 3/ This paremeter is not directly testable, but is derived for use in total power supply calculat i onc. CL

14、 = 50 pF; RT = Zm of pulse generators. 3. Pulse generator for all pulses: PRR s 1.0 MHZ, zouT s SIB, tr = tf 5 2.5 rts. FIGURE 3. Test circuit and switching waveforms. DEFENSE UECTRONICS SUPPLY CENTER RMSK)N LEVEL SHEET I DAYTON, OHIO 45444 9 4 U S GOYEWWENT PRINTIHG OFFICE iMG5xr547 DESC FORM 193A

15、SEP 87 / - - Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-_ E 9999996 0053246 874.E PROPAGATION DELAY WAVEFORMS SAME PHASE INPUT TRANSITION d 3,O V 1.5 V oso v PLH - VOH - OUTPUT 1.5 V OPPOSITE PHASE 1.5 V 0,o v NPUT TRANSITION FIGURE 3. Test circ

16、uit and switchins waveform - Continued. SIZE 5%2-89506 A STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER AMSION LEVEL SHEET 10 I DAMON, OHIO 45444 t U S GOVERNMENT WUNTING OFFICE 1988-550-57 SC FORM 193A EP 87 I w . -. -. - /- % t Provided by IHSNot for ResaleNo reproduction or netwo

17、rking permitted without license from IHS-,-,-m 9999996 0053247 700 W STANDARDIZED MILITARY DRAWING SIZE 5962-89506 A ENABLE ENABLE CONTROL - INPUT OUTPUT NORMALLY LOW ND DIS BLE TIMES DISABLE 3.0 V 1.5 V 0.0 v - /i OPEN OUTPUT NORMALLY HIGH A- 0.0 v LL 0.3 V 0.0 v FIGURE 3. Test circuit and switchin

18、s waveforms - Continued. I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON. OHIO 45444 I RMSION LEVEL I I I it U S GWERNMEIYT PRWTING McElSed-SM-Y7 DESC FORM 193A SEP 87 .- *- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3.4 Narking. Marking shall be in

19、accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the part nimber listed in 1.2 herein. may also be marked as listed in 6.4 herein in order to be listed as an approved saurce of swty in 6.4. The certificate of cotripliance suknitted to DESC-ECS prior to listing as an approv

20、ed source of srpply shalt state that the manufacturers product meets the requirements of MIL-STD-883. (see 3.1 herein) and the requirements herein. herein) shall be provided with each lot of microcircuits delivered to this drawing. In addition, the menufacturers part nuhr 3.5 Certificate of cmliance

21、. A certificate of compliance shall be required fwn a IEtWfaCtUrer 3.6 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 3.7 Notification of chame. Natibication of change to DESC-ECS shall be required in accordance with MIL-STD-883 (see 3.1 herein). 3.8 Ver

22、ification and review. DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facility and appticable required docunentation. shall be mede available onshore at the option of the reviewer. Offshore docunentation 4. QUALITY ASSURANCE PROVISIfflS 4.1 Samtins and ins

23、wction. Sonpiing ancf inspection procedures shalt be in accordance uith section 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein), Screening shall be io accordance with Bethod 5004 of MIL-STD-883, and shdt be conducted on all devices prior to quality conformance inspection. Th

24、e following additional criter shall apply: 4.2 Screening. a. Burn-in test, method 1015 of MIL-STD-633. (1) Test condition A, R, C, or D using the circuit submitted uith the certificate of (2) TA = +12i0C, minim. except interim electeicat parameter tests prior to hrn-in are optionak at the discretim

25、of the manufacturer. compliance (see 3.5 herein). b. interim and final electricat test parameters shekt be as specified fn tabte II herein, 4.3 Quatity conformance inspection. Quatity conformanee inspection shalt be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspec

26、tions. criteria shall apply. The f0lLWbg eddtkCmk 4.3.2 Group A inspection. a. Tests shalt be as specified in table II herein, b. Subgroups 5 and 6 in table t, method 5005 of MIL-STD-883 shak be omitted. c. Subgroup 4 (CIH and c after process or desi%changes which may affect capacitance. on five dev

27、ices with zero failures. measurements) shalt be measured only for the initial test and Test alt applicable pins d. Subgroups 7 and- 8 tests shall verify the truth table as specified on figure 2. a SIZE 5%2-89506 A: STANDARDkZED MlLCTRY DRAWING r 1 DEFENCE ELECTRONICS SUPPLY CEMER 12 I DAYMIH, iiiQ45

28、444 ESC FORM PEA t U S QOWERNMENT PRINTINQ OFFICE 1W-SW-547 SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-m 9999996 0053249 583 W MIL-STD-883 test requirements TABLE II. Electrical test reaiirements. Subgrw (per method 5005, table I) Final e

29、lectrical test parameters (method 5004) I I 1*,2,317,8,9, 10,ll - I Interim electrical parameters (method 5004) I Grwp A test requirements (method 5005) Groupc C and D end-point electrical parameters (method 5005) *PDA applies to subgrolp 1. 4.3.2 Grows C and D incmctions. a. End-point electrical pa

30、rameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, BI C, or D using the circuit submitted with the certificate of canpliance (see 3.5 herein). (2) TA = +125*C, minim. (3) Test duration: 1,000 hours, except as per

31、mitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging reauirements. The requirements for packaging shall be in accordance with M IL 4-385 10. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drwing are intended for use when military specifications do not exist and qualified mil

32、itary devices that will perform the required furction are not available for OEM application. when a military specification exists and the product covered by this drawing has been qmlified for listing on PPL-38510, the device specified herein will be inactivated and will mt be used for new Ohio 45444

33、, or telephone 513-296-5375. 6.4 Acuroved source of smly. An approved seurce of swly is listed herein. Additional sources will be added as they become availablei The verdor listed herein has agreed to this drawing and a certificate of compliance (see 3.5 herein) has been shitted to DESC-ECS. I I .I

34、I Military drawing similar part part tuher 5962-895060110( 54FCT827AEB I I I 5962-8950601LX 61772 54FCT827ADB 61772 54FCT827ALB 5962-89506013X 5962-895060210(: 54FCT827BEB 5962-8950602LX 54FCT827BDB 5962-89506023X 54FCT827BLB i l I I/ Caution. Do not use this mmber for item acquisition. Items acquir

35、ed by this nunber may not satisfy the performance requirements of this drawing. Vendor CAGE nunber 61772 Vendor name and address Integrated Device Technology 3236 Scott Boulevard Santa Clara, CA 95052 SIZE 5962-89506 STANDARDIZED MILITARY DRAWING A DEFENCE ELECTRONICS SUPPLY CENTEl REVISION LEM. SHEET 14 DAYTON, OHIO 45444 I * U 6 QOVERHL#NT n(NTIN0 OFFBE lW-550.%7 DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-