DLA SMD-5962-89447 REV F-2007 MICROCIRCUIT HYBRID DIGITAL DUAL CHANNEL 15 VOLT DRIVER-RECEIVER RECEIVER IDLE NORMALLY HIGH《硅单片15伏驱动器-通常偏高接收器双渠道混合微电路》.pdf

《DLA SMD-5962-89447 REV F-2007 MICROCIRCUIT HYBRID DIGITAL DUAL CHANNEL 15 VOLT DRIVER-RECEIVER RECEIVER IDLE NORMALLY HIGH《硅单片15伏驱动器-通常偏高接收器双渠道混合微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89447 REV F-2007 MICROCIRCUIT HYBRID DIGITAL DUAL CHANNEL 15 VOLT DRIVER-RECEIVER RECEIVER IDLE NORMALLY HIGH《硅单片15伏驱动器-通常偏高接收器双渠道混合微电路》.pdf（24页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redrawn with changes. Added devices 05, 06, and 07 for cage code 32116. Made changes to table I and figures 1, 2, and 3. 94-04-08 K. A. Cottongim B Delete CAGE code 32116. Made changes to table I. 95-06-02 K. A. Cottongim C Inactivate device type

2、s 01, 05, and 07 for new design. Add device type 08. 98-06-05 K. A. Cottongim D Table I; for device type 08 change the max limit for the tDRtest from 400 ns to 450 ns. Table I; for device type 08 change the max limit for the tDI-Htest from 200 ns to 225 ns. Redrew entire document. -sld 01-05-18 Raym

3、ond Monnin E Correct paragraphs 4.2.a.2. and 4.3.3.b.2 and add TA. Paragraph 1.3, correct power dissipation for device types 01, 06, and 08 from 2 W to 2.5 W. Figure 2, terminal connections, case outlines X and Y, correct note to add 08 after 07 (2 places). 05-02-22 Raymond Monnin F Table I; changed

4、 the maximum limit for ICC1-SB, ICC1-25, ICC1-50, and ICC1-100 from 25 mA to 60 mA for device type 02. Editorial changes throughout. -sld 07-05-07 Robert M. Heber REV SHEET REV F F F F F F F F SHEET 15 16 17 18 19 20 21 22 REV STATUS REV F F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9

5、10 11 12 13 14 PMIC N/A PREPARED BY Donald R. Osborne STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert M. Heber DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, DIGITAL, DUAL CHANNEL, 15 VOLT, DRIVER-RECEIVER, RECEIVE

6、R IDLE NORMALLY HIGH THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-11-26 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-89447 SHEET 1 OF 22 DSCC FORM 2233 APR 97 5962-E363-07Provided by IHSNot for ResaleNo reproduction

7、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89447 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragra

8、ph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example

9、: 5962 - 89447 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL

10、-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Coupling transformer turns ratio: Device types Generic number Circuit function Direct Tra

11、nsformer 01 1/ ARX3416, ARX3436 Dual channel, driver-receiver 1.4:1 2:1 receiver idle normally high 02 NHI-1501 “ 1.4:1 2:1 03 FC1553622 1.4:1 2:1 04 BUS63135II, BUS63136II “ 1.4:1 2:1 05 1/ CT1487-DI 1.4:1 2:1 06 2/ ACT4487-DI-002 “ 1.4:1 2:1 07 1/ CT1487-DFI 1.4:1 2:1 08 ACT4436-DI, ACT4487-DI “ 1

12、.4:1 2:1 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D)

13、. The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high relia

14、bility devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic

15、 and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document s

16、hould be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1/ Device types 01, 05, and 07

17、are obsolete. Device type 08 replaces device types 01, 05, and 07. 2/ Device type 06, the generic number CT1892-500 is obsolete as of the date of revision B ,generic number 3416-511 is obsolete as of the date of revision C and generic number ARX3416-002 is obsolete as of the date of revision E.Provi

18、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89447 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as desig

19、nated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style U See figure 1 28 Dual-in-line X See figure 1 36 Dual-in-line Y See figure 1 36 Flat package Z See figure 1 36 Flat package 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1

20、.3 Absolute maximum ratings. 1/ Supply voltage range: VCC(devices 01, 02, 05, 06, 07, and 08) -0.3 V dc to +18 V dc VEE(devices 01, 03, 04, 05, 06, 07, and 08). +0.3 V dc to -18 V dc VCC1(all devices) -0.3 V dc to +7 V dc Logic input voltage. -0.3 V dc to VCC1Receiver differential voltage. 40 VP-PRe

21、ceiver common mode voltage range . -10 V dc to +10 V dc Driver peak output current . 200 mA Power dissipation (PD) at TC= +125C: (devices 01, 06, and 08). 2.5 W (device 02) 0.96 W (device 03) 1.65 W 2/ (device 04) 3 W 2/ (devices 05 and 07) 3.8 W 2/ Storage temperature range -65C to +150C Lead tempe

22、rature (soldering, 10 seconds). +300C Junction temperature (TJ): (devices 01, 03, 06, and 08) . +167C 3/ 4/ (device 02) +145C 3/ 5/ (device 04) +160C 3/ 6/ (devices 05 and 07) +150C 3/ Thermal resistance, junction-to-case (JC): (devices 01, 06, and 08). 88C/W (device 02) 8.8C/W (device 03) 18C/W (de

23、vice 04) 7.0C/W (devices 05 and 07) 60C/W 1.4 Recommended operating conditions. Supply voltage range: VCC(devices 01, 02, 05, 06, 07, and 08) +14.25 V dc to +15.75 V dc VEE(devices 01, 03, 04, 05, 06, 07, and 08). -14.25 V dc to -15.75 V dc VCC1(all devices) +4.5 V dc to +5.5 V dc Logic input voltag

24、e. 0 V dc to +5 V dc Receiver differential voltage: (devices 01, 02, 05, 06, 07, and 08) . 40 VP-P(devices 03 and 04) 30 VP-PReceiver common mode voltage range: (devices 01, 03, 04, 06, and 08) . -5 V dc to +5 V dc (devices 02, 05, and 07). -10 V dc to +10 V dc Driver peak output current (all device

25、s) . 180 mA Serial data rate 1.0 MHz maximum Case operating temperature range (TC). -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade the performance and affect reliability. 2/ One channel transm

26、itting at 100 percent duty cycle and the second channel is at standby. 3/ Worst case operating junction temperature when case is held to +125C. 4/ Maximum junction temperature rise above case temperature for the hottest die at 100% transmitting duty cycle shall be 42C. 5/ Maximum junction temperatur

27、e rise above case temperature for the hottest die at 100% transmitting duty cycle shall be 20C. 6/ Maximum junction temperature rise above case temperature for the hottest die at 100% transmitting duty cycle shall be 21C. Provided by IHSNot for ResaleNo reproduction or networking permitted without l

28、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89447 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and hand

29、books form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STAN

30、DARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. MIL-HDBK-1553 - Multiplex Applicatio

31、ns Handbook. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict betw

32、een the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance

33、 requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. Th

34、e manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for

35、 the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connectio

36、ns. The terminal connections shall be as specified on figure 2. 3.2.3 Timing waveforms. The timing waveforms shall be as specified on figure 3. 3.2.4 Typical transformer connection. The typical transformer connection shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unle

37、ss otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical t

38、ests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. Provided by IHSNot for ResaleNo

39、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89447 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, t

40、he manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those w

41、hich, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to s

42、upply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be pro

43、vided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not

44、 affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufa

45、cturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD

46、-883. (2) TAor TCas specified in the approved manufacturers QM plan. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleN

47、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89447 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C

48、TC +125C unless otherwise specified Group A subgroups Device types Limits Unit Min Max RECEIVER Input level VIDifferential input, pin 20 to pin 21, pin 29 to pin 30 2/ 4,5,6 All 51 VP-P01,03,04, 06,08 -5 +5 Input common mode voltage range VICMIndependent of xfmr or in accordance with MIL-HDBK-1553 section 5.1.2.2 4,5,6 02,05,07 -10 +10 V(pk) IOL= 4 mA All 0.5 Output low voltage VOLIOL= 16 mA 1,2,3 04 0.5 V Output high voltage VOHIOH= -0.4 mA 1,2,3 All 2.5 V TRANSMITTER Input low voltage VIL1,2,3 All 0.7 V Input hi