DLA SMD-5962-80016 REV D-2005 MICROCIRCUIT LINEAR FAST SAMPLE AND HOLD GATED OPERATIONAL AMPLIFIER MONOLITHIC SILICON《硅单片选通运算扬声器 快速测定样品及保持 线性微型电路》.pdf

《DLA SMD-5962-80016 REV D-2005 MICROCIRCUIT LINEAR FAST SAMPLE AND HOLD GATED OPERATIONAL AMPLIFIER MONOLITHIC SILICON《硅单片选通运算扬声器 快速测定样品及保持 线性微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-80016 REV D-2005 MICROCIRCUIT LINEAR FAST SAMPLE AND HOLD GATED OPERATIONAL AMPLIFIER MONOLITHIC SILICON《硅单片选通运算扬声器 快速测定样品及保持 线性微型电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Pages 4 and 5 table I, change test conditions limits for: ICC, ID, QTR, CMR, TR(tr), and TR(OS). 85-07-31 N. A. Hauck B Convert to military drawing format. Change CAGE code to 67268. Add case outline 2. Changes to 1.3 and 1.4. Changes to conditio

2、ns and limits in table I. Change C and D end-point electricals in table II. 89-06-10 M. A. Frye C Drawing updated to reflect current requirements. - ro 01-06-21 Raymond Monnin D Correction to marking paragraph 3.5. Editorial changes through out. - drw 05-03-22 Raymond Monnin CURRENT CAGE CODE 67268

3、THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY C. R. Jackson DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY William E. Shoup COLUMBUS, OHIO 43218-3990

4、http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Darrell Hill MICROCIRCUIT, LINEAR, FAST SAMPLE AND HOLD, GATED OPERATIONAL AMPLIFIER, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 80-09-26 MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A C

5、AGE CODE 14933 80016 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E159-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FO

6、RM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 80016 01 C A Drawing

7、 number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 2420 Sample and hold amplifier 1.2.2 Case outlines. The case outlines are as designated in MIL-S

8、TD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply vo

9、ltage (+VS) . +20 V dc Negative supply voltage (-VS) . -20 V dc Digital input voltage ( S /H pin) +8 V dc, -15 V dc Differential input voltage range (VID) 24 V Output current (IO) Short circuit protected Power dissipation (PD): Case outline C . 1.03 W at +75C Case outline 2 . 1.14 W at +75C Junction

10、 temperature (TJ) . +175C Lead temperature (soldering, 10 seconds) . +300C Storage temperature range . -65C to +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case outline C . 96C/W Case outline 2 . 88C/W Provided by IHSNot for ResaleN

11、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage (+VS) . +15 V dc Negati

12、ve supply voltage (-VS) . -15 V dc Analog input voltage . 10 V High level input voltage (VIH) +2.0 V Low level input voltage (VIL) . +0.8 V Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specifica

13、tion, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specif

14、ication for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (

15、Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text o

16、f this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. Provided by IHSNot for ResaleNo reproduction or networking permitted without license

17、 from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN c

18、lass level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance

19、 with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the devic

20、e. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall

21、 be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified he

22、rein, the electrical performance characteristics are as specified in table I and shall apply over the full (case or ambient) operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each sub

23、group are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be mark

24、ed on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance

25、shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-

26、PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be

27、required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the revi

28、ewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics.

29、Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxInput offset voltage VIOVCM= 0 V 1 01 4.0 mV 2, 3 6.0 Input common mode range VCM1, 2, 3 01 10 V Input offset current IIOVCM= 0 V 1 01 50 nA 2, 3 100 Input bias current IIBVCM= 0 V 1 0

30、1 200 nA 2, 3 400 Supply current +I 1 01 5.5 mA 2, 3 7.0 -I 1 -3.5 2, 3 -5.0 Power supply rejection ratio +PSRR +VS= 10 V, -VS= -15 V, +VS= 20 V, -VS= -15 V 1, 2, 3 01 80 dB -PSRR -VS= -10 V, +VS= 15 V, -VS= -20 V, +VS= 15 V 80 Drift current IDVIN= 0 V, RL= 2 k, 2 01 10 nA CL= 50 pF, VS /H= 4.0 V 1,

31、 3 2/ 10 Hold step error VERRORVIN= 0 V, 4 V, tr (VS /H) = 30 ns, CH= 1,000 pF 4 01 20 mV Large signal voltage gain AVSVOUT= 10 V, RL= 2 k, CL= 50 pF 1, 2, 3 01 25 V/mV See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST

32、ANDARD MICROCIRCUIT DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device ty

33、pe Limits Unit Min MaxCommon mode rejection ratio +CMRR +VS= 25 V, -VS= -5 V, VOUT= +10 V, VS /H= 10.8 V 1,2,3 01 80 dB -CMRR +VS= 5 V, -VS= -25 V, VOUT= -10 V, VS /H= -9.2 V 80 Output current +IOVOUT= +10 V 1 01 +15 mA -IOVOUT= -10 V -15 Output voltage swing +VOPRL= 2 k, CL= 50 pF 1,2,3 01 +10 V -V

34、OP-10 Digital input current IIN1VIN1= 0 V 1,2,3 01 800 A IIN2VIN2= 5.0 V 20 Digital input voltage VIL1,2,3 01 0.8 V VIH2.0 Transient response rise time TR(tr)VOUT= 200 mVPP, 7 01 100 ns CL= 50 pF, RL= 2 k, 8a 2/ 100 AV= +1 8b 2/ 120 Transient response overshoot TR(OS)VOUT= 200 mVPP, 7 01 40 ns CL= 5

35、0 pF, RL= 2 k, 8a 2/ 40 AV= +1 8b 2/ 60 Transient response slew rate TR(SR)VOUT= 10.0 VPP, 7 01 3.5 V/s CL= 50 pF, RL= 2 k, 8a 2/ 3.5 AV= +1 8b 2/ 1.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUI

36、T DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min

37、 MaxAcquisition time (0.1%) 2/ +tacq (0.1%) VOUT= 0 V, +10 V, AV= 1, RL= 2 k, CL= 50 pF, TA= +25C 4 01 4 s -tacq (0.1%) VOUT= 0 V, -10 V, AV= 1, RL= 2 k, CL= 50 pF, TA= +25C 4 Acquisition time (0.01%) 2/ +tacq (0.01%) VOUT= 0 V, +10 V, AV= 1, RL= 2 k, CL= 50 pF, TA= +25C 4 01 6 s -tacq (0.01%) VOUT=

38、 0 V, -10 V, AV= 1, RL= 2 k, CL= 50 pF, TA= +25C 6 1/ Unless otherwise specified, +VS= +15 V, -VS= -15 V, CH= 1,000 pF, digital input VIL= +0.8 V (Sample), VIH= +2.0 V (Hold). 2/ If not tested, shall be guaranteed to the limits specified in table I herein. Provided by IHSNot for ResaleNo reproductio

39、n or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines C 2 Terminal number Terminal symbol 1 -INPUT NC 2 +INPUT -INPUT 3 OFF

40、SET ADJUST +INPUT4 OFFSET ADJUST OFFSET ADJUST 5 -VSNC 6 NC OFFSET ADJUST 7 OUTPUT NC 8 NC -VS9 +VSNC 10 NC OUTPUT 11 HOLD CAPACITOR NC 12 NC NC 13 GND +VS14 SAMPLE /HOLD NC 15 - NC 16 - HOLD CAPACITOR 17 - NC 18 - NC 19 - GND 20 - SAMPLE /HOLD NC = No connection FIGURE 1. Terminal connections. Prov

41、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and i

42、nspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test,

43、method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, an

44、d power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the

45、discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 4, 7 Group A test requirem

46、ents (method 5005) 1, 2, 3, 4, 7, 8* Groups C and D end-point electrical parameters (method 5005) 1, 4 * PDA applies to subgroup 1. * Subgroup 8 guaranteed if not tested to the limits specified in table herein. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance

47、 with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided

48、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test conditi