DLA DESC-DWG-87035 REV C-2009 DELAY LINE ACTIVE TRIPLE 14-PIN DIP COMPATIBLE LOW POWER SCHOTTKY.pdf
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1、 REVISIONS LTR DESCRIPTION DATE APPROVED A Changed several dc characteristics in table II. Changed dimensions on figure 1. Updated vendor part numbers on source table. Editorial changes throughout 29 Nov 88 Randy Larson B Added 3.1.3, 3.2.1.1, 3.2.7, 3.3.10 and note 6 to figure 1. Changed 3.1.4. Mov
2、ed rise time data from table II to 3.2.2. Added vendors 03947 and 25219. Editorial changes throughout. 22 Jan 93 Tony Westphal C Incorporated boilerplate updates. 01 Dec 09 Michael A. Radecki Prepared in accordance with ASME Y14.100 Source Control drawing REV STATUS OF PAGES REV C C C C C C C C C C
3、PAGES 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Ken R. Beymer DESIGN ACTIVITY DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OH 45444-5000 Original date of drawing 10 Nov 87 CHECKED BY Dan McGrath TITLE DELAY LINE, ACTIVE, TRIPLE, 14-PIN DIP COMPATIBLE, LOW POWER SCHOTTKY APPROVED BY Randy Larson SIZE A
4、CODE IDENT. NO. 14933 DWG NO. 87035 SCALE N/A REV C PAGE 1 OF 10 AMSC N/A 5999-E221CURRENT DESIGN ACTIVITY CAGE CODE 037Z3 DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
5、-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 87035 REV C SHEET 2 1. SCOPE 1.1 Scope. This drawing describes the requirements for a family of active triple, 14-pin DIP compatible delay lines. These are low power Schottky devices. 1.2 Part or Identifying Number
6、 (PIN). The complete PIN shall be as shown in the following example: 87035 -01 | | | | Drawing number Dash number (see table I) 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents c
7、ited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents in sections 3 and 4 of this specif
8、ication, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those c
9、ited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-DTL-19491 - Semiconductor Devices, Packaging of. MIL-PRF-83532 - Delay Lines, Active, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Test Method Standard, Electronic and Electrical Component Part
10、s. MIL-STD-883 - Test Method Standard, Microelectronics. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. Unless otherwis
11、e noted herein, or int he contract in the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3.
12、 REQUIREMENTS 3.1 Interface and physical dimensions. 3.1.1 Case material. The case material shall be molded diallyl phthalate or encapsulated epoxy and shall be in accordance with MIL-PRF-83532. 3.1.2 Dimensions and circuit diagram. Dimensions and circuit diagram shall be in accordance with figure 1
13、. 3.1.3 Microcircuits. Microcircuits shall meet the requirements of MIL-STD-883, class B, as a minimum. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 87035 REV C SHE
14、ET 3 3.1.4 Terminals. Terminal material and finish shall be in accordance with MIL-PRF-83532. 3.1.5 Terminal strength. Terminal strength testing shall be in accordance with MIL-STD-202, method 211, test condition C, and as specified in MIL-PRF-83532. 3.1.6 Solderability. Solderability testing shall
15、be as specified in MIL-PRF-83532. 3.1.7 Resistance to solvents. Resistance to solvents testing shall be as specified in MIL-PRF-83532. 3.2 Electrical. 3.2.1 Total delay time. The total delay time per line shall be in accordance with table I. 3.2.1.1 Delay tolerance. At +25C and +5.0 V dc, the delay
16、tolerance shall be 2.0 ns or 5 percent, whichever is greater. At -55C to +125C and +5.0 V dc, the tolerance shall be 3.0 ns or 8 percent, whichever is greater. 3.2.2 Rise time. The rise time shall be 8 ns maximum. Conditions: VCC= 5.0 V; TRI 3 ns. 3.2.3 Pulse width. Minimum input pulse width is 100
17、percent of the total delay. 3.2.4 Supply voltage. Supply voltage shall be 4.50 V dc to 5.50 V dc. 3.2.5 Fan out. The fan out shall be 10 maximum (each delay line is capable of driving 10 LSTTL). 3.2.6 DC characteristics. DC characteristics shall be in accordance with table II. 3.2.7 Check for intern
18、al shorts. When a test signal is applied to any input, a delay signal should be detected at the output for that line only. For example, when input 1 is tested, there shall be no signals detected at outputs 2 and 3. All three inputs shall be checked in this manner. 3.3 Environmental. 3.3.1 Temperatur
19、e range. The operating temperature range shall be -55C to +125C. 3.3.2 Thermal shock. Thermal shock testing shall be in accordance with MIL-STD-202, method 107, test condition A, 5 minutes at each temperature extreme and in accordance with MIL-PRF-83532. 3.3.3 Seal. Seal testing shall be in accordan
20、ce with MIL-PRF-83532. 3.3.4 Vibration. Vibration testing shall be in accordance with MIL-STD-202, method 204, test condition B and in accordance with MIL-PRF-83532. 3.3.5 Shock. Shock testing shall be in accordance with MIL-STD-202, method 213, test condition D and in accordance with MIL-PRF-83532.
21、 3.3.6 Immersion. Immersion testing shall be in accordance with MIL-STD-202, method 104, test condition A and in accordance with MIL-PRF-83532. 3.3.7 Moisture resistance. The moisture resistance testing shall be as specified in MIL-PRF-83532. Provided by IHSNot for ResaleNo reproduction or networkin
22、g permitted without license from IHS-,-,-DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 87035 REV C SHEET 4 FIGURE 1. Dimensions and circuit diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE ELECTRON
23、ICS SUPPLY CENTER DAYTON, OHIO SIZE A CODE IDENT NO. 14933 DWG NO. 87035 REV C SHEET 5 Ltr Inches mm Min Max Min Max A - .810 - 20.57 B - .400 - 10.16 C - .360 - 9.14 D .015 - 0.38 - E .125 .250 3.18 6.35 F .018 .022 0.46 0.56 G .007 .017 0.18 0.43 H .295 .305 7.49 7.75 J .095 .105 2.41 2.67 K .145
24、.155 3.68 3.94 L .295 .305 7.49 7.75 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Unless otherwise specified, tolerance is .005 (0.13 mm). 4. Internal design of schematic may vary, provided all electrical requirements are met. 5. Location and s
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