DIN EN ISO 3274-1998 Geometrical Product Specifications (GPS) - Surface texture Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274 1996) German vers.pdf

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1、DEUTSCHE NORM April 1998 DIN GPS - Surface texture: Profile method Nominal characteristics of contact (stvlus) instruments -I IEN IS0 3274 (is0 3274 : i 9961 English version of DIN EN IS0 3274 ICs 17.040.30 Descriptors: GPS, surface texture, stylus instruments. Supersedes DIN 4772, November 1979 edi

2、tion. Geometrische Produktspezifikationen (GPS) - Oberflchenbeschaffenheit: Tastschnittverfahren - Nenneigenschaften von Tastschnittgerten (IS0 3274 : 1996) European Standard EN IS0 3274 : 1997 has the status of a DIN Standard. A comma is used as the decimal marker. National foreword This standard h

3、as been published in accordance with a decision taken by CEN/TC 290 to adopt, without alteration, International Standard IS0 3274 as a European Standard. The responsible German body involved in its preparation was the Normenausschu Technische Grundlagen (Fundamentals in Technology Standards Committe

4、e), Technical Committee Geometrische Produktspezifi- kation und -Prfung. The DIN Standards corresponding to the International Standards referred to in clause 2 of the EN are as follows: IS0 Standard DIN Standard IS0 4288 IS0 11562 IS0 12085 DIN EN IS0 4288 DIN EN IS0 11562 DIN EN IS0 12085 IS0 13565

5、-1 IS0 13565-2 DIN EN IS0 13565-1 DIN EN IS0 13565-2 Amendments DIN 4772, November 1979 edition, has been superseded by the specifications of EN IS0 3274, which is identical to IS0 3274. Previous edition DIN 4772: 1979-1 1. Continued overleaf. EN comprises 15 pages. No part of this standard may be r

6、eproduced without the prior permission of Ref. No. DIN EN IS0 3274 : 1998-04 IN Deutsches Institut fr Normung e. V., Berlin. leuth Verlag GmbH, D-10772 Berlin, has the exclusive right of sale for German Standards (DIN-Normen). English price group 11 Sales No. 11 11 09.98 Page 2 DIN EN IS0 3274 : 199

7、8-04 National Annex NA Standards referred to (and not included in Normative references and Annex ZA) DIN EN IS0 4288 GPS - Surface texture: Profile method - Rules and procedures for the assessment of surface texture (IS0 4288 : 1996) DIN EN IS0 11 562 GPS - Surface texture: Profile method - Metrolog

8、ical characteristics of phase correct filters (IS0 11562 : 1996) DIN EN IS0 12085 GPS - Surface texture: Profile method - Motif parameters (IS0 12085 : 1996) DIN EN IS0 13565-1 GPS - Surface texture: Profile method -Surface having stratified functional properties - Part 1 : Filtering and general mea

9、surement conditions (IS0 13565-1 : 1996) DIN EN IS0 13565-2 GPS - Surface texture: Profile method -Surface having stratified functional properties - Part 2: Height characterization using the linear material ratio (IS0 13565-2 : 1996) EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN IS0 3274 Nove

10、mber 1997 ICs 17.040.30 Descriptors: GPS, surface texture, stylus instruments. English version Geometrical Product Specifications (GPS) Nominal characteristics of contact (stylus) instruments (IS0 3274 : 1996) Surface texture: Profile method Spcification gomtrique des Geometrische Produktspezifikati

11、onen produits (GPS) - tat de surface: Mthode du profil - Caractristiques nominales des appareils contact (palpeur) (IS0 3274 : 1996) (GPS) - Oberflchenbeschaffenheit: Tastschnittverfahren - Nenn- eigenschaften von Tastschnittgerten (IS0 3274 : 1996) This European Standard was approved by CEN on 1997

12、-1 1-02. CEN members are bound to comply with the CENKENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national stand- ards may be obt

13、ained on application to the Central Secretariat or to any CEN member. The European Standards exist in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN member into its own language and notified to the Central Secr

14、etariat has the same status as the official versions. CEN members are the national standards bodies of Austria, Belgium, the Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the United K

15、ingdom. CEN European Committee for Standardization Comit Europen de Normalisation Europisches Komitee fr Normung Central Secretariat: rue de Stassart 36, B-1050 Brussels O 1997. CEN - All rights of exploitation in any form and by any means reserved worldwide for CEN national members. Ref. No. EN IS0

16、 3274 : 1997 E Page 2 EN IS0 3274 : 1997 Foreword International Standard IS0 3274 : 1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments, which was prepared by ISO/TC 57 Metrology and properties of surfaces of the I

17、nternational Organization for Standardization, has been adopted by Technical Committee CEN/TC 290 Dimensional and geometrical prod- uct specification and verification, the Secretariat of which is held by DIN, as a European Standard. This European Standard shall be given the status of a national stan

18、dard, either by publication of an identical text or by endorsement, and conflicting national standards withdrawn, by May 1998 at the latest. In accordance with the CENKENELEC Internal Regulations, the national standards organizations of the follow- ing countries are bound to implement this European

19、Standard: Austria, Belgium, the Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the United Kingdom. Endorsement notice The text of the International Standard IS0 3274 : 1996 was approve

20、d by CEN as a European Standard without any modification. NOTE: Normative references to international publications are listed in Annex ZA (normative). Contents Page 1 Scope 3 2 Normative references . 3 3 Definitions . 4 4 Nominal values for instrument characteristics 9 Annexes A Instruments conformi

21、ng to IS0 3274:1975 11 B Background for the improvements introduced in this International Standard . 12 C Relation to the GPS matrix model . 14 D Bibliography . 15 Page 3 EN IS0 3274 : 1997 Introduction This International Standard is a Geometrical Product Specification (GPS) standard and is to be re

22、garded as a Genera/ GPS standard (see ISO/TR 14638). It influences chain link 5 of the chain of standards for roughness profile, waviness profile and primary profile. For more detailed information of the relation of this standard to other standards and the GPS matrix model, see annex C. Filters for

23、profile meters according to IS0 3274:1975 were realized as a series connection of two analog RC filters. This led to considerable phase shifts in the transition of the profile and therefore io asymmetrical profile distortions. The influence of this distortion on the parameters Ra and Rz are normally

24、 negligible if the sampling lengths (cut-off wavelength) according to IS0 4288:1985 are used. Therefore, analog instruments according to IS0 3274:1975 or instruments using 2RC filters may be used for assessment of Ra and Rz (see annex A). However, for other parameters the distortion is relevant. 1 S

25、cope This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be applied to practical profile evaluation. It specifies the properties of the instrument which influ

26、ence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and profile recorder). NOTES 1 A data sheet dealing with characteristics of contact (stylus) instruments to be completed by the instrument makers IS under preparation and will be in

27、troduced in a future standard on calibration procedures 2 The relationships between the waviness cut-off Af, tip radius and waviness cut-off ratio are under consideration and will be added to this International Standard as an amendment 2 Normative references The following standards contain provision

28、s which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on this International Standard are encouraged to investigate the possib

29、ility of applying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain registers of currently valid International Standards. IS0 4287: 1996, Geometrical Product Specifications IGPSI - Surface texture: Profile method - Terms, definitions and surface texture param

30、eters. IS0 4288:1996, Geometricai Product Specifications (GPSI - Surface texture: Profile method - Rules and procedures for the assessment of surface texture. IS0 5436:1985, Calibration specimens - Stylus instruments - Types, calibration and use of specimens. IS0 1 1562:1996, Geometrical Product Spe

31、cifications (GPSI - Surface texture: Profile method - Metrological characteristics of phase correct filters. Page 4 EN IS0 3274 : 1997 IS0 12085:1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Motif parameters. IS0 13565-1 : 1996, Geometrical Product Specifications

32、 (GPS) - Surface texture: Profile method; Surfaces having stratified functional properties - Part I: Filtering and overall measuring conditions. IS0 13565-2: 1 996, Geometrical Product Specifications (GPS) - Surface texture: Profile method; Surfaces having stratified functional properties - Part 2:

33、Height characterization using the linear material ratio curve. IS0 13565-3:-1), Geometrical Product Specifications (GPS) - Surface texture: Profile method; Surfaces having stratified functional properties - Part 3: Height characterization using the material probability curve. 3 Definitions For the p

34、urposes of this International Standard, the following definitions apply. 3.1 Profiles 3.1.1 traced profile: Locus of the centre of a stylus tip which features an ideal geometrical form (conical with spherical tip) and nominal dimensions with nominal tracing force, as it traverses the surface within

35、the intersection plane. NOTE - This is the profile from which all other profiles defined in this International Standard are derived 3.1.2 reference profile. Trace on which the probe is moved within the intersection plane along the guide NOTE - The shape of the reference profile is the practical real

36、ization of a theoretical exact profile Its nominal deviations depend on the deviations of the guide as well as on external and internal disturbances 3.1.3 total profile: Digital form of the traced profile relative to the reference profile, with the vertical and horizontal coordinates assigned to eac

37、h other. NOTE - The total profile is characterized by the vertical and horizontal digital steps. 3.1.4 primary profile: Total profile after application of the short wavelength filter, J.S. NOTES 1 The primary profile represents the basis for digital profile processing by means of a profile filter an

38、d calculation of the profile parameters according to IS0 4287. It is characterized by the vertical and horizontal digital steps which may be different rom those of the total profile. 2 The hest fit least squares form of the type indicated in the specification is not part of the primary profile and s

39、hould be excluded before filters are applied. For a circle, the radius should also be included in the least squares optimization and not held fixed to the nominal value. 3 The nominal form is removed before the primary profile is obtained. 3.1.5 residual profile: Primary profile obtained by tracing

40、an ideally smooth and flat surface (optical flat) NOTE - The residual profile is composed of the deviations of the guide, external and internal disturbances, as well as deviations in profile transmission. The determination of the causes of the deviations is not normally possible without special equi

41、pment and a suitable environment. 3.2 stylus instrument: Measuring instrument which explores surfaces with a stylus and acquires deviations in the form of a surface profile, calculates parameters and can record the profile (see figure 1) NOTE - The diagram as shown represents only the essential oper

42、ators required in a theoretically exact measuring system The specific inter-relationship of operators may be subject to design considerations Therefore figure 1 should not be considered as the only form of theoretically exact configuration 1) To be published W + 3 2 2 a + o- a + - c w ._ ._ 5 rc L +

43、 a - ._ L C L C rt - .- L L a IL Y I Page 5 EN IS0 3274 : 1997 + .- C aJ L .- o Figure 1 - Schematic representation of a stylus instrument Page 6 EN IS0 3274 : 1997 3.2.1 displacement sensitive, digitally storing stylus instrument: Stylus instrument whose profile presentation contains deviations inc

44、luding long-wave components and Set-up deviations. NOTE - The profile is digitally stored and, if filtered, is phase-correct filtered. Parameters are digitally calculated and the profile is recorded by means of a graphics system excluding deformation. 3.3 Stylus instrument components 3.3.1 measureme

45、nt loop: Closed chain which comprises all mechanical components connecting workpiece and the stylus tip, e.g. positioning means, workholding fixture. measuring stand, drive unit, probe (pick-up). (See figure 2.1 NOTE - The measuring loop is subjected to external and internal disturbances and transmi

46、ts them to the reference profile. The influence of these disturbances depends on the individual measuring Set-up, the measuring environment and the skill of the user. The disturbances influence the residual value to a great extent. 3.3.2 reference guide: Component which generates the intersection pl

47、ane and guides the probe in it on a theoretically exact geometrical trace (reference profile), generally in a straight line. NOTE - The guide is an essential part of the drive unit; it can be partially included in the probe For the use of skids, see annex A 3.3.3 drive unit: Component which moves th

48、e probe along the reference guide and transmits the horizontal position of the stylus tip in the form of a horizontal profile coordinate. NOTE - Drive units are characterized by the longest selectable tracing length I- Base Drive uni1 Figure 2 - Example of measurement loop of a stylus instrument Pag

49、e 7 EN IS0 3274 : 1997 3.3.4 probe (pick-up): Component which contains the tracing element with the stylus tip and the transducer 3.3.5 tracing element: Element which transmits the stylus tip displacement to the transducer 3.3.6 stylus tip: Element which consists of a nominally right, circular cone of defined cone angle and of a nominally spherical tip of defined radius. NOTE - It is a very important element in profile acquisition when employing stylus instruments. 3.3.7 transducer: Device which converts the vertical coordinates of the traced profile referred to