ASTM F1680-2007 Standard Test Method for Determining Circuit Resistance of a Membrane Switch《薄膜开关线路阻抗的测定用标准试验方法》.pdf
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1、Designation: F 1680 07Standard Test Method forDetermining Circuit Resistance of a Membrane Switch1This standard is issued under the fixed designation F 1680; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision
2、. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers the determination of the circuitresistance of a membrane switch.1.2 This standard does not purport to addr
3、ess all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2F 2592 Test Me
4、thod for Measuring the Force-Displacementof a Membrane Switch3. Terminology3.1 Definitions:3.1.1 circuit resistanceelectrical resistance as measuredbetween two test points whose internal contacts, when heldclosed, complete a circuit.3.1.2 membrane switcha momentary switching device inwhich at least
5、one contact is on, or made of, a flexiblesubstrate.3.1.3 test pointstwo preselected conductive points in acircuit loop, possibly including a switch.4. Significance and Use4.1 Resistance is useful to manufacturers and users whendesigning membrane switch interface circuitry.5. Apparatus5.1 Test Probe,
6、 as defined in Test Method F 2592.5.2 Test Surface to be flat, smooth, unyielding and largerthan switch under test.5.3 Device, to hold test probe securely and provide perpen-dicular movement into and away from switch under test.5.4 Resistance Measuring Device, (for example, ohmmeter). The device sho
7、uld not apply a voltage outside theoperating range of the switch contacts.5.5 Suitable Device, to apply a controlled and measurableforce on the test probe.6. Procedure6.1 Pre-Test Setup:6.1.1 Precondition switch until approximation of steadystate condition is achieved. (Note this will typically occu
8、rbetween 5 to 25 cycles, and it is recommended that theinstrument and test probe be used when practical.)6.1.2 Secure switch on test surface so that the unit under testcan be removed and replaced in the same position aftersubsequent operations (probe contact position within 0.010 in.of its original
9、position on the switch).6.1.3 Position test probe over desired are of switch.6.1.4 Lower probe until tip is just above top surface ofswitch without touching.6.1.5 Connect switch terminals to resistance measuringdevice.6.2 In-Process Test:6.2.1 Slowly depress switch with probe until the resistancedoe
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