ASTM E2862-2012 Standard Practice for Probability of Detection Analysis for Hit Miss Data《击中 丢失数据检测分析的概率标准规程》.pdf
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1、Designation: E2862 12Standard Practice forProbability of Detection Analysis for Hit/Miss Data1This standard is issued under the fixed designation E2862; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A n
2、umber in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice defines the procedure for performing astatistical analysis on nondestructive testing hit/miss data todetermine the demonst
3、rated probability of detection (POD) fora specific set of examination parameters. Topics coveredinclude the standard hit/miss POD curve formulation, valida-tion techniques, and correct interpretation of results.1.2 The values stated in inch-pound units are to be regardedas standard. The values given
4、 in parentheses are mathematicalconversions to SI units that are provided for information onlyand are not considered standard.1.3 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish ap
5、pro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E1316 Terminology for Nondestructive Examinations2.2 Department of Defense Handbook:MIL-HDBK-1823A Nondestructive Evaluation System Re-liability A
6、ssessment33. Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 analyst, nthe person responsible for performing aPOD analysis on hit/miss data resulting from a POD examina-tion.3.1.2 demonstrated probability of detection, nthe calcu-lated POD value resulting from the statistical ana
7、lysis on thehit miss data.3.1.3 false call, nthe perceived detection of a discontinu-ity that is identified as a find during a POD examination whenno discontinuity actually exists at the inspection site.3.1.4 hit, nan existing discontinuity that is identified as afind during a POD demonstration exam
8、ination.3.1.5 miss, nan existing discontinuity that is missedduring a POD examination.3.1.6 probability of detection, nthe fraction of nominaldiscontinuity sizes expected to be found given their existence.3.2 Symbols:3.2.1 adiscontinuity size.3.2.2 apthe discontinuity size that can be detected withp
9、robability p.3.2.2.1 DiscussionEach discontinuity size has an inde-pendent probability of being detected and corresponding prob-ability of being missed. For example, being able to detect aspecific discontinuity size with probability p does not guaran-tee that a larger size discontinuity will be foun
10、d.3.2.3 ap/cthe discontinuity size that can be detected withprobability p with a statistical confidence level of c.3.2.3.1 Discussionap/cis calculated by applying a statis-tical uncertainty bound to ap. The uncertainty bound is afunction the amount of data, the scatter in the data, and thespecified
11、level of statistical confidence. The resulting valuerepresents how large the discontinuity with POD equal to pcould be when uncertainty associated with estimating apisaccounted for. Hence ap/c ap. Note that POD is equal to p forboth ap/cand ap. apis based solely on the hit/miss data resultingfrom th
12、e examination and represents a snapshot in time,whereas ap/caccounts for the uncertainty associated withlimited sample data.1This practice is under the jurisdiction of ASTM Committee E07 on Nonde-structive Testing and is the direct responsibility of Subcommittee E07.10 onSpecialized NDT Methods.Curr
13、ent edition approved Jan. 15, 2012. Published February 2012. DOI:10.1520/E2862-12.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary pag
14、e onthe ASTM website.3Available from Standardization Documents Order Desk, DODSSP, Bldg. 4,Section D, 700 Robbins Ave., Philadelphia, PA 19111-5098, http:/dodssp.daps.dla.mil.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.4. Summary
15、 of Practice4.1 This practice describes step-by-step the process foranalyzing nondestructive testing hit/miss data resulting from aPOD examination, including minimum requirements for vali-dating the resulting POD curve.4.2 This practice also includes definitions and discussionsfor results of interes
16、t (for example, a90/95) to provide forcorrect interpretation of results.5. Significance and Use5.1 The POD analysis method described herein is based ona well-known and well established statistical method. It shallbe used to quantify the demonstrated POD for a specific set ofexamination parameters an
17、d known range of discontinuitysizes when the initial response from a nondestructive evalua-tion inspection system is ultimately binary in nature (that is, hitor miss). This method requires that a relationship betweendiscontinuity size and POD exists and is best described by ageneralized linear model
18、 with the appropriate link function forbinary outcomes.5.2 Prior to performing the analysis it is assumed that thediscontinuity of interest is clearly defined; the number anddistribution of induced discontinuity sizes in the POD speci-men set is known and well-documented; discontinuities in thePOD s
19、pecimen set are unobstructed; the POD examinationadministration procedure (including data collection method) iswell-defined, under control, and unbiased; and the initialresponse is ultimately binary in nature (that is, hit or miss). Theanalysis results are only valid if convergence is achieved andth
20、e model adequately represents the data.5.3 The POD analysis method described herein is consistentwith the analysis method for binary data described in MIL-HDBK-1823A, which is included in several widely utilizedPOD software packages to perform a POD analysis on hit/missdata. It is also found in stat
21、istical software packages that havegeneralized linear modeling capability. This practice requiresthat the analyst has access to either POD software or othersoftware with generalized linear modeling capability.6. Procedure6.1 The POD analysis objective shall be clearly defined bythe responsible engin
22、eer or by the customer.6.1.1 The analyst shall obtain the hit/miss data resultingfrom the POD examination, which shall include at a minimumthe documented known induced discontinuity sizes, whether ornot the discontinuity was found, and any false calls.6.2 The analyst shall also obtain specific infor
23、mation aboutthe POD examination, which shall include at a minimum thespecimen standard geometry (for example, flat panels), speci-men standard material (for example, Nickel), examination date,number of inspectors, type of inspection method (for example,line-of-site Level 3 Fluorescent Penetrant Insp
24、ection), andpertinent comments from the inspector(s) and test administra-tor.6.3 Prior to performing the analysis, the analyst shallconduct a preliminary review of the POD examination proce-dure and resulting hit/miss data to identify any examinationadministration or data issues. The analyst shall r
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