ASTM E2033-1999(2006) Standard Practice for Computed Radiology (Photostimulable Luminescence Method)《计算机辐射(光刺激照明法)标准操作规程》.pdf

《ASTM E2033-1999(2006) Standard Practice for Computed Radiology (Photostimulable Luminescence Method)《计算机辐射(光刺激照明法)标准操作规程》.pdf》由会员分享，可在线阅读，更多相关《ASTM E2033-1999(2006) Standard Practice for Computed Radiology (Photostimulable Luminescence Method)《计算机辐射(光刺激照明法)标准操作规程》.pdf（10页珍藏版）》请在麦多课文档分享上搜索。

1、Designation: E 2033 99 (Reapproved 2006)Standard Practice forComputed Radiology (Photostimulable LuminescenceMethod)1This standard is issued under the fixed designation E 2033; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the ye

2、ar of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice2covers application details for computedradiology (CR) examination using a process in which photo-

3、stimulable luminescence is emitted by the penetrating radiationdetector, a storage phosphor imaging plate (SPIP). Because thetechniques involved and the applications for CR examinationare diverse, this practice is not intended to be limiting orrestrictive, but rather to address the general applicati

4、ons of thetechnology and thereby facilitate its use. Refer to Guides E94and E 2007, Terminology E 1316, and Practices E 747 andE 1025, and 21 CFR 1020.40 and 29 CFR 1910.96 foradditional information and guidance.1.2 The general principles discussed in this practice applybroadly to penetrating radiat

5、ion CR systems. However, thisdocument is written specifically for use with X-ray andgamma-ray systems. Other CR systems, such as those employ-ing neutrons, will involve equipment and application detailsunique to such systems.1.3 This standard does not purport to address all of thesafety concerns, if

6、 any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use. For specific safetystatements, see Section 10 and 21 CFR 1020.40 and 29 CFR1910.96.2. Ref

7、erenced Documents2.1 ASTM Standards:3E94 Guide for Radiographic ExaminationE 747 Practice for Design, Manufacture and MaterialGrouping Classification of Wire Image Quality Indicators(IQI) Used for RadiologyE 1025 Practice for Design, Manufacture, and MaterialGrouping Classification of Hole-Type Imag

8、e Quality Indi-cators (IQI) Used for RadiologyE 1316 Terminology for Nondestructive ExaminationsE 1453 Guide for Storage of Media that Contains Analog orDigital Radioscopic DataE 1475 Guide for Data Fields for Computerized Transfer ofDigital Radiological Examination DataE 1817 Practice for Controlli

9、ng Quality of RadiologicalExamination by Using Representative Quality Indicators(RQIs)E 2007 Guide for Computed Radiology (PhotostimulableLuminescence (PSL) Method)2.2 ASNT Standards:SNT-TC-1A Recommended Practice for Personnel Qualifi-cation and Certification in Nondestructive Testing4ANSI/ASNT-CP-

10、189 Standard for Qualification and Certi-fication of Nondestructive Testing Personnel42.3 Federal Standards:Title 21, CFR 1020.40 Safety Requirements of CabinetX-Ray Systems5Title 29, CFR 1910.96 Ionizing Radiation52.4 AIA Standard:NAS-410 Certification and Qualification of NondestructiveTesting Per

11、sonnel63. Summary of Practice3.1 ACR examination system can be used for a wide varietyof applications. A typical CR examination system consists of aradiation source, a storage phosphor imaging plate detector, aplate reader, an electronic imaging system, a digital image1This test method is under the

12、jurisdiction of ASTM Committee E07 onNondestructive Testing and is the direct responsibility of Subcommittee E07.01 onRadiology (X and Gamma Method).Current edition approved May 1, 2006. Published June 2006. Originallyapproved in 1999. Last previous edition approved in 1999 as E 2033 - 99.2ForASME B

13、oiler and Pressure Code applications, see related Practice SE-2033in Section II of that code.3For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document

14、Summary page onthe ASTM website.4Available from American Society for Nondestructive Testing, 1711 ArlingatePlaza, P.O. Box 28518, Columbus, OH 43228-0518.5Available from Standardization Documents Order Desk, Bldg. 4 Section D, 700Robbins Ave., Philadelphia, PA 19111-5094, Attn: NPODS.6Available from

15、Aerospace IndustriesAssociation ofAmerica, Inc., 1250 Eye St.NW, Washington, D.C. 20005.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.processor, a monitor display, a digital image archiving system,and, if desired, equipment for pro

16、ducing hard copy analogimages. This practice establishes the basic parameters for theapplication and control of the CR method.4. Significance and Use4.1 The X-, gamma-ray detector discussed in this practice isa storage phosphor imaging plate, hereafter referred to as SPIP.The SPIP, which is the key

17、component in the CR process,differentiates CR from other radiologic methods. This practiceis written so that it can be specified on the engineeringdrawing, specification, or contract and must be supplementedby a detailed procedure (see Section 6 and Annex A1 andAnnex A2).5. Equipment5.1 System Confi

18、gurationDifferent examination systemsconfigurations are possible, and it is important to understandthe advantages and limitations of each. It is important that theoptimum system be selected for each examination requirementthrough a careful analysis of the benefits and limitations of theavailable sys

19、tem components and the chosen system configu-ration. The provider as well as the user of the examinationservices should be fully aware of the capabilities and limita-tions of the examination system that is proposed for examina-tion of the part. The provider and the user of examinationservices shall

20、agree upon the system configuration to be usedfor each application under consideration and how its perfor-mance is to be evaluated.5.1.1 The minimum system configuration will include anappropriate source of penetrating radiation, a phosphor platedetector, a plate reader, and an electronic imaging sy

21、stem witha CRT display.5.1.2 A more complex system might include a microfocusX-ray system, a digital image processing evaluation system,and an image recording and printing system.6. General Procedure Considerations6.1 The purchaser and supplier shall mutually agree upon awritten procedure using the

22、applicable annex of supplementalrequirements and also consider the following general require-ments.6.1.1 Equipment QualificationsA listing of the systemfeatures that must be qualified to ensure that the system iscapable of performing the desired examination.6.1.2 Source ParameterA listing of all the

23、 radiationsource-related variables that can affect the examination resultsfor the selected system configuration such as: source energy,intensity, focal spot size, range of source to object distances,range of object to image plane distances, and source to imageplane distances.6.1.3 Image Processing P

24、arametersA listing of the imageprocessing variables, if any, necessary to enhance fine detaildetectability in the part and to achieve the required imagequality. These would include, but are not limited to, techniquessuch as noise reduction, contrast enhancement, and spatialfiltering. Great care shou

25、ld be exercised in the selection ofdirectional image processing parameters such as spatial filter-ing, which may emphasize features in certain orientations andsuppress them in others. The listing should indicate the meansfor qualifying image processing parameters.6.1.4 Image Display ParametersA list

26、ing of the tech-niques and the intervals at which they are to be applied forstandardizing the video image display as to brightness, con-trast, focus, and linearity.6.1.5 Accept-Reject CriteriaA listing of the expectedkinds of part imperfections and the rejection level for each.6.1.6 Performance Eval

27、uationA listing of the qualifica-tion tests and the intervals at which they are to be applied toensure the system is suitable for its intended purpose.6.1.7 Image Archiving RequirementsA listing of the re-quirements, if any, for preserving a historical record of theexamination results. The listing m

28、ay include examinationimages along with written or electronically recorded alphanu-meric or audio narrative information, or both, sufficient toallow subsequent reevaluation or repetition of the examination.6.1.8 QualificationsNondestructive testing (NDT) per-sonnel shall be qualified in accordance w

29、ith a nationallyrecognized NDT personnel qualification practice or a standardsuch as ANSI/ASNT-CP-189, SNT-TC-1A, NAS-410,orasimilar document.7. CR Examination System Performance Considerationsand Measurement7.1 Factors Affecting System PerformanceTotal examina-tion system performance is determined

30、by the combinedperformance of the system components that includes theradiation source, storage phosphor plate detector, plate reader,electronic image processing system, image display, and exami-nation record archiving system.7.1.1 Radiation SourcesExamination systems may utilizeeither radioisotope o

31、r X-ray sources. The energy spectrum ofthe X-radiation contains a blend of contrast enhancing longerwavelengths as well as the more penetrating, shorter wave-lengths. X-radiation is adjustable in energy and intensity tomeet the CR examination requirements and has the addedsafety feature of discontin

32、ued radiation production whenswitched off.Aradioisotope source has the advantages of smallphysical size, portability, simplicity, and uniformity of output.7.1.1.1 X-ray machines produce a more intense X-ray beamemanating from a smaller focal spot than do radioisotopesources. X-ray focal spot sizes r

33、ange from a few millimetersdown to a few micrometers. Reducing the source size reducesgeometric unsharpness, thereby enhancing detail sensitivity.X-ray sources may offer multiple or variable focal spot sizes.Smaller focal spots produce higher resolution with reducedX-ray beam intensity, while larger

34、 focal spots can providehigher X-ray intensity with lower resolution. Microfocus X-raytubes are available with focal spots that may be adjusted to assmall as a few micrometers in diameter while still producing anX-ray beam of sufficient intensity so as to be useful for the CRexamination of finely de

35、tailed parts.7.1.1.2 Conventional focal spots of 1.0 mm and larger areuseful at low geometric magnification values close to 13.Fractional focal spots ranging from 0.4 mm up to 1.0 mm areuseful at geometric magnifications up to approximately 23.Minifocus spots in the range from 0.1 mm up to 0.4 mm ar

36、eE 2033 99 (2006)2useful at geometric magnifications up to about 63. Greatermagnifications suggest the use of a microfocus spot size of lessthan 0.1 mm to minimize the effects of geometric unsharpness.Microfocus X-ray tubes are capable of focal spot sizes of lessthan 10 m (108m) and are useful for g

37、eometric magnifica-tions of more than 1003.7.1.2 SPIPThe storage phosphor imaging plate is a keyelement. It has the function of converting the radiation inputsignal containing part information into a corresponding opticalsignal while preserving the maximum amount of part informa-tion. The SPIP is a

38、two-dimensional area detector providing anarea field of view.7.1.3 SPIP ReaderThe SPIP reader has the function ofoptically scanning the imaging plate, collecting the emittedlight, converting the light to an electronic signal, then convert-ing this signal to a digital format.7.1.4 Electronic Imaging

39、Processing System:7.1.4.1 The function of the electronic imaging processingsystem is to take the output of the SPIP reader and present adigital file for image display and operator interpretation.7.1.4.2 The electronic imaging processing system includesall of the electronics and interfaces after the

40、SPIP reader,including image enhancement and image display.7.1.4.3 The digital image processing system warrants spe-cial attention because it is the means by which examinationinformation will be interpreted. Great care must be exercised indetermining which image processing techniques are mostbenefici

41、al for the particular application. Directional spatialfiltering operations, for example, must be given special atten-tion as certain feature orientations are emphasized while othersare suppressed.7.1.5 Image Display:7.1.5.1 The function of the image display is to conveyinformation about the part to

42、the system operator. The imagedisplay size, spatial resolution, magnification, and ambientlighting are important system considerations.7.1.6 Examination Record Archiving SystemMany appli-cations require an archival quality examination record of theexamination. The archiving system may take many form

43、s, afew of which are listed in 7.1.6.1 through 7.1.6.5. Eacharchiving system has its own peculiarities as to image quality,archival storage properties, equipment, and media cost. Theexamination record archiving system should be chosen on thebasis of these and other pertinent parameters, as agreed up

44、onby the provider and user of services. The reproduction qualityof the archival method should be sufficient to demonstrate thesame image quality as was used to qualify the examinationsystem.7.1.6.1 Film or paper radiographs of the part made under thesame conditions as the examination image.7.1.6.2 P

45、hotograph of the actual image display.7.1.6.3 CRT hard copy device used to create a paper copyimage from the CRT signal.7.1.6.4 Digital recording on magnetic disk or tape used tostore the image of the part digitally.7.1.6.5 Digital recording on optical disk used to store theimage of the part digital

46、ly.7.1.7 Examination Record DataThe examination recordshould contain sufficient information to allow the examinationto be reevaluated or duplicated. Examination record datashould be recorded contemporaneously with the CR examina-tion image. Examination record data should be in accordancewith Guide E

47、 1475 and may be in writing or a voice narrative,providing the following minimum data:7.1.7.1 Examination system designation, examination date,operator identification, operating turn or shift, and otherpertinent and customer data;7.1.7.2 Specific examination data as to part number, batch,serial numb

48、er, and so forth (as applicable);7.1.7.3 Part orientation and examination site information byreference to unique part features within the field of view; and7.1.7.4 System performance monitoring by recording theresults of the prescribed examination system performancemonitoring tests, as set forth in

49、Section 5, at the beginning andend of a series of examinations.7.2 Performance MeasurementSystem performance pa-rameters must be determined initially and monitored regularlyto ensure consistent results. The best measure of total CRexamination system performance can be made with the systemin operation, utilizing a representative quality indicator (RQI)similar to the part under actual operating conditions. Thisindicates the use of an actual or simulated part containingactual or simulated features that must be reliably detected.Such an RQI will provide a reliable indicat