ASTM D6097-2001a Standard Test Method for Relative Resistance to Vented Water-Tree Growth in Solid Dielectric Insulating Materials《固体介电绝缘材料中有通气孔的水柱提升的相对阻力测定的标准试验方法》.pdf
《ASTM D6097-2001a Standard Test Method for Relative Resistance to Vented Water-Tree Growth in Solid Dielectric Insulating Materials《固体介电绝缘材料中有通气孔的水柱提升的相对阻力测定的标准试验方法》.pdf》由会员分享,可在线阅读,更多相关《ASTM D6097-2001a Standard Test Method for Relative Resistance to Vented Water-Tree Growth in Solid Dielectric Insulating Materials《固体介电绝缘材料中有通气孔的水柱提升的相对阻力测定的标准试验方法》.pdf(8页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: D 6097 01aAn American National StandardStandard Test Method forRelative Resistance to Vented Water-Tree Growth in SolidDielectric Insulating Materials1This standard is issued under the fixed designation D 6097; the number immediately following the designation indicates the year oforigin
2、al adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers the relative resistance to ventedwater-t
3、ree growth in solid translucent thermoplastic or cross-linked electrical insulating materials. This test method isespecially applicable to extruded polymeric insulation materi-als used in medium-voltage cables.1.2 The values given in SI units are to be regarded as thestandard.1.3 This standard does
4、not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitation prior to use. For specific hazardstatements see 8.1.
5、1.4 There is no similar or equivalent IEC standard.2. Referenced Documents2.1 ASTM Standards:D 1898 Practice for Sampling of Plastics2D 1928 Practice for Preparation of Compression-MoldedPolyethylene Test Sheets and Test Specimens3D 2275 Test Method for Voltage Endurance of Solid Elec-trical Insulat
6、ing Materials Subjected to Partial Discharges(Corona) on the Surface4D 3756 Test Method for Evaluation of Resistance to Elec-trical Breakdown by Treeing in Solid Dielectric MaterialsUsing Diverging Fields53. Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 water tree length (WTL),
7、 nthe maximum length of astained tree-like micro-channel path in millimetres, measuredfrom the tip of the conical defect in the direction of the conicalaxis.3.1.2 resistance to water-tree growth (RWTG) a dimen-sionless value which is L divided by the WTL.3.1.3 thickness of point-to-plane specimen (L
8、), nthe ver-tical distance in millimetres from the tip of the conical defectto the opposite surface of the solid dielectric material.4. Summary of Test Method4.1 Ten compression-molded disk specimens, each contain-ing a conical-shaped defect, are subjected to an applied voltageof 5 kV at 1 kHz and 2
9、3 6 2C in an aqueous conductivesolution of 1.0 N NaCl for 30 days. This controlled conicaldefect is created by a sharp needle with an included angle of60 and a tip radius of 3 m. The electrical stress at the defecttip is enhanced and can be estimated by the Masons Hyper-bolic point-to-plane stress e
10、nhancement equation.6This en-hanced electrical stress initiates the formation of a ventedwater-tree grown from the defect tip. Each treed specimen isstained and sliced. The water-tree length and point-to-planespecimen thickness measured under microscope are used tocalculate a ratio that is defined a
11、s the resistance to water-treegrowth.5. Significance and Use5.1 This is a laboratory test designed to simulate the growthof vented water-trees in the solid dielectric insulating materialinitiated by a sharp protrusion at the insulating and conductiveinterface under a wet environment in a high electr
12、ical field.Water-treeing is the phenomenon which describes the appear-ance of tree-like growth in organic dielectrics under an ac fieldwhen exposed to moist environments. Two types of water-treesare formed. Bow tie trees (within the dielectric) and ventedwater-trees formed from conductive/insulating
13、 material inter-face into the insulating material. The water-trees referred to inthis test method are the vented type. The insulating material isthe solid dielectric organic material. The conductive material isthe salt solution. This salt solution is used on both sides of theinsulating material to s
14、imulate the same inner and outer1This test method is under the jurisdiction of ASTM Committee D09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.12 on Electrical Tests.Current edition approved Sept. 10, 2001. Published November 2001. Originallypu
15、blished as D 6097 97. Last previous edition D 6097 01.2Discontinued; see 1997 Annual Book of ASTM Standards, Vol 08.01.3Annual Book of ASTM Standards, Vol 08.01.4Annual Book of ASTM Standards, Vol 10.01.5Annual Book of ASTM Standards, Vol 10.02.6The sole source of supply of the base, Dow Corning 311
16、0RTV, the catalyst,Dow Corning RTV Catalyst S, and the sealant, Dow Corning Multipurpose SiliconeSealant 732, known to the committee at this time is Dow Corning, Inc., Midland, MI48686. If you are aware of alternative suppliers, please provide this information toASTM International Headquarters. Your
17、 comments will receive careful consider-ation at a meeting of the responsible technical committe, which you may attend.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.semiconductive shields saturated with moisture between theinsulati
18、on layer used in a medium-voltage underground powercable.5.2 This test method provides comparative data. The degreeof correlation with the performance in service has not beenestablished.5.3 The standard test conditions are designed to grow asufficient water-tree length for most solid dielectric insu
19、latingmaterials of interest before electrical breakdown occurs. Ma-terials with a very high resistance to water-tree growth mayrequire a longer time under test conditions (such as 180 days)or higher voltage (such as 10 or 15 kV) in order to differentiatetheir performance. For materials with a very l
20、ow resistance towater-tree growth, electrical breakdown may occur during the30-day testing time. A shorter testing time (such as one or tendays) is recommended to prevent electrical breakdown duringtesting for those low water-tree resistant materials.5.4 Other voltages, frequencies, temperatures, aq
21、ueous so-lutions, and defects can be used to evaluate specific materialsfor specific applications. Temperatures should not exceed thesoftening or melting point of the material or 10 to 15C belowthe boiling point of the salt solution. Any nonstandard condi-tions should be reported along with the resu
22、lts.5.5 Tree-growth rates generally increase with the test fre-quency. An acceleration factor due to frequency is given by(f/60)kwhere f is the test frequency and k is between 0.6 and0.7. The test frequency of 1 kHz is selected to accelerate thewater-tree growth. However, the chemical nature of oxid
23、izedproducts from water-treeing may be different at differentfrequency ranges.5.6 Two assumptions for this test method are: (1) all testedmaterials grow trees in the same power law kinetic manner and(2) the time under test conditions of 30 days is long enough toestablish the difference in water-tree
24、 growth. If there is a doubt,at least three different testing times (such as 30, 90, and 180days) should be used to verify their comparative performanceand disclose their kinetic nature of water-tree growth. Ofcourse, it is also assumed that all water-treed regions areoxidized regions that can be st
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