ASTM D3380-2010 Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《基于聚合物的高频电路基质的相对电容率(介电常数)和损.pdf

《ASTM D3380-2010 Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《基于聚合物的高频电路基质的相对电容率(介电常数)和损.pdf》由会员分享，可在线阅读，更多相关《ASTM D3380-2010 Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates《基于聚合物的高频电路基质的相对电容率(介电常数)和损.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、Designation: D3380 10An American National StandardStandard Test Method forRelative Permittivity (Dielectric Constant) and DissipationFactor of Polymer-Based Microwave Circuit Substrates1This standard is issued under the fixed designation D3380; the number immediately following the designation indica

2、tes the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope*1.1 This test method permits the rapid measurem

3、ent ofapparent relative permittivity and loss tangent (dissipationfactor) of metal-clad polymer-based circuit substrates in theX-band (8 to 12.4 GHz).1.2 This test method is suitable for testing PTFE (polytet-rafluorethylene) impregnated glass cloth or random-orientedfiber mats, glass fiber-reinforc

4、ed polystyrene, polyphenyle-neoxide, irradiated polyethylene, and similar materials havinga nominal specimen thickness of116 in. (1.6 mm). Thematerials listed in the preceding sentence have been used incommercial applications at nominal frequency of 9.6 GHz.NOTE 1See Appendix X1 for additional infor

5、mation about range ofpermittivity, thickness other than 1.6 mm, and tests at frequencies otherthan 9.6 GHz.1.3 The values stated in inch-pound units are to be regardedas standard. The values given in parentheses are mathematicalconversions to SI units that are provided for information onlyand are no

6、t considered standard.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior

7、to use.2. Referenced Documents2.1 ASTM Standards:2D150 Test Methods for AC Loss Characteristics and Per-mittivity (Dielectric Constant) of Solid Electrical Insula-tionD1711 Terminology Relating to Electrical InsulationD2520 Test Methods for Complex Permittivity (DielectricConstant) of Solid Electric

8、al Insulating Materials at Mi-crowave Frequencies and Temperatures to 1650C3D6054 Practice for Conditioning Electrical Insulating Ma-terials for Testing2.2 IPC Standards:4IPC-TM-650 Test Methods Manual Method 2.5.5.5.IPC-MF-4562 Metal Foil for Printed Wiring Applications.2.3 IEEE Standards:5Standard

9、 No. 488.1 Standard Digital Interface for Program-mable Instrumentation.Standard No. 488.2 Standards, Codes, Formats, Protocolsand Common Commands for use with ANSI and IEEEStandard 488.1.3. Terminology3.1 DefinitionsSee Terminology D1711 for the definitionsof terms used in this test method. See als

10、o Test MethodsD2520, D150, and IPC TM-650 for additional informationregarding the terminology.3.2 Definitions of Terms Specific to This Standard:3.2.1 Da symbol used in this test method for the dissipa-tion factor.3.2.2 DLa correction factor associated with length whichcorrects for the fringing capa

11、citance at the ends of the resonatorelement.3.2.3 k8symbol used in this test method to denote relativepermittivity.3.2.3.1 DiscussionThe preferred symbol for permittivityis Greek kappa prime but some persons use other symbols todenote this property such as DK, SIC,or8R.3.2.4 microstrip linea microwa

12、ve transmission line em-ploying a flat strip conductor bonded to one surface of adielectric board or sheet, the other surface of which is cladwith, or bonded to, a continuous conductive foil or plate whichis substantially wider than the strip.3.2.4.1 DiscussionMicrostrip provides easier accessibilit

13、ythan stripline for attaching components and devices to the stripcircuitry.1This test method is under the jurisdiction of ASTM Committee D09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.12 on Electrical Tests.Current edition approved Jan. 1, 20

14、10. Published February 2010. Originallyapproved in 1975. Last previous edition approved in 2003 as D338090(2003).DOI: 10.1520/D3380-10.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume inf

15、ormation, refer to the standards Document Summary page onthe ASTM website.3Withdrawn. The last approved version of this historical standard is referencedon www.astm.org.4Available from IPC, 3000 Lakeside Drive, Suite 309S, Bannockburn, IL60015.5Available from Institute of Electrical and Electronics

16、Engineers, Inc. (IEEE),445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 08854-1331, http:/www.ieee.org.1*A Summary of Changes section appears at the end of this standard.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.3.2.5 microwave subst

17、ratea board or sheet of low-lossdielectric material that is clad with metal foil either on one, orboth, surfaces, from which all metal is removed by etchingprior to testing.3.2.6 striplinemicrowave transmission line using a flatstrip conductor clamped, or bonded, between two substantiallywider diele

18、ctric boards.3.2.6.1 DiscussionThe outer surfaces of both boards arebonded to, or in intimate contact with, conducting foils orplates (ground planes). Picture a stripline as a flattened versionof cylindrical coaxial cable.3.2.7 stripline resonatora disconnected section of strip-line loosely coupled

19、at each end by capacitative gaps to feed orprobe lines.3.2.7.1 DiscussionThe strip becomes resonant at thosefrequencies at which the strip length, increased by an incre-ment due to the fringing fields at the ends, is equal to anintegral multiple of half-wavelengths in the dielectric. Asfrequency var

20、ies gradually, the power transmitted from theinput to the output feed lines becomes maximum at resonance,and falls off sharply to essentially zero at frequencies which area few parts per thousand above and below resonance.4. Summary of Test Method4.1 Substrate specimens, with metal cladding removed,

21、become the supporting dielectric spacers of a microwavestripline resonator when properly positioned and clamped inthe test fixture. The measured values of resonant frequency ofthe stripline resonator and the half-power frequencies are usedto compute the relative permittivity (dielectric constant or

22、k8)and the dissipation factor (D) of the test specimen. The testspecimen consists of one or more pairs of test cards.5. Significance and Use5.1 Permittivity and dissipation factor are fundamental de-sign parameters for design of microwave circuitry. Permittivityplays a principal role in determining

23、the wavelength and theimpedance of transmission lines. Dissipation factor (along withcopper losses) influence attenuation and power losses.5.2 This test method is suitable for polymeric materialshaving permittivity in the order of two to eleven. Suchmaterials are popular in applications of stripline

24、 and microstripconfigurations used in the 1 to 18 GHz range.5.3 This test method is suitable for design, development,acceptance specifications, and manufacturing quality control.NOTE 2See Appendix X1 for additional information regarding sig-nificance of this test method and the application of the re

25、sults.6. Apparatus6.1 The preferred assembly fixture shown in Fig. 1, Fig. 2,and Fig. 3 is hereby designated Fixture A. This design of testspecimen fixture provides advantages over the design ofFixture B shown in Fig. 4, Fig. 5, Fig. 6, and Fig. 7.6.1.1 The Fixture B design has been included since t

26、hisfixture has been, and still is, in service in numerous laborato-ries.6.1.2 The Fixture B design relies upon close control of theroom temperature in the laboratory for control of the testspecimen temperature.6.1.3 Changing of test pattern cards in the Fixture B designis less convenient than with t

27、he Fixture A design.6.1.4 For Fixture A the preferred assembly for ResonatorCard and Specimen uses a Lap Conductor Joint. See Fig. 3 fordetails.6.2 Fixture AThe elements of the fixture include thefollowing:6.2.1 Resonator Pattern Card (see Fig. 8),6.2.2 Base Stripline Board (see Fig. 9),FIG. 1 Face

28、View of Fixture AssemblyFIG. 2 Exploded Side View of AssemblyFIG. 3 Enlarged Exploded Side View Sectioned Through a ProbeLine Showing a Lap Conductor Joint for Fixture AD3380 1026.2.3 Base Cover Board (see Fig. 10),In. mm0.001 0.030.002 0.050.086 2.180.100 2.540.143 3.630.200 5.080.214 5.440.250 6.3

29、50.500 12.701.000 25.401.500 38.102.000 50.802.700 68.58NOTE 1Dimensions are in inches.NOTE 2Metric equivalents are given for general information only.FIG. 4 Generalized Resonator Pattern Card for Fixture B ShowingDimensions of Table 1 and Made of Laminate Matching theNominal Permittivity of Materia

30、l to be TestedFIG. 5 Test Fixture Construction, Older Design (Fixture B)FIG. 6 Test Fixture Construction, Older Design (Fixture B)FIG. 7 Test Fixture Construction, Older Design (Fixture B)D3380 1036.2.4 End-Launcher Bodies, adapted (see Fig. 11),6.2.5 Aluminum Base Plates (see Fig. 12),6.2.6 Aluminu

31、m Clamping Plates (see Fig. 13),6.2.7 Aluminum Blocks, for temperature control (see Fig.14).6.2.8 Sliders and Blocks (see Fig. 15), and6.3 Microwave Signal Source, capable of providing anaccurate signal. An accurate signal provides a leveled poweroutput that falls within a 0.1 dB range during the re

32、quired timeperiod and over the range of frequency needed to make apermittivity and loss measurement, and maintains outputwithin 5 MHz of the set value for the time required to make ameasurement when the signal source is set for a particularfrequency.6.4 Frequency Measuring Device, having a resolutio

33、n 5MHz or less.6.5 Power Level Detecting Device, having a resolution of0.1 dB or less and capable of comparing power levels within a3-dB range with an accuracy of 0.1 dB.6.6 Compression Force Gage,6capable of measuring to1100 lb (5000 N) with an accuracy of 61 % of full scale.6.7 Vise, or a press, f

34、or exerting a controlled force of 1000lb (4448 N) on the test fixture and having an opening of at least5 in. (130 mm) to accept the force gage and test fixture.6.8 Apparatus for Manual Test Setup:6.8.1 Sweep Frequency Generator.6,76.8.2 X-Band Frequency Plug-In Unit.6,86If you are aware of alternati

35、ve suppliers, please provide this information toASTM International Headquarters. Your comments will receive careful consider-ation at a meeting of the responsible technical committee,1which you may attend.7The sole source of supply of the Hewlett Packard (HP) 8350B or 8620Cgenerator known to the com

36、mittee at this time is Hewlett Packard. If you are awareof alternative suppliers, please provide this information to ASTM InternationalHeadquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee,1which you may attend.8The sole source of supply of

37、 the Hewlett Packard (HP) 83545A or 86251Aplug-in unit known to the committee at this time is Hewlett Packard. If you areaware of alternative suppliers, please provide this information to ASTM Interna-tional Headquarters. Your comments will receive careful consideration at a meetingof the responsibl

38、e technical committee,1which you may attend.FIG. 8 Generalized Resonator Pattern Card for Fixture A ShowingDimensions of and Made of Laminate Matching the NominalPermittivity of Materials to be TestedFIG. 9 Base Stripline Board with Copper Foil and DielectricMatching the Nominal Permittivity of the

39、Material to be TestedFIG. 10 Base Cover Board with Copper Foil Ground PlaneFIG. 11 Detail of the Supplied End Launcher Body Adapted byBoring Out the Tapped HolesFIG. 12 Aluminum Base Plate for Clamping the Base Cards andConnecting Launcher Bodies to the Base CardD3380 1046.8.3 Frequency Meter.6,96.8

40、.4 Crystal Detector,6,10two required.6.8.5 Matched Load Resistor,6,11for one of the crystaldetectors.6.8.6 Standing Wave Rectified (SWR) Meter,6,12two re-quired.6.8.7 Directional Coupler.6,136.8.8 Attenuator,6,14rated at 10 dB.6.8.9 Semi-Rigid Coaxial Cable and Connectors.6.8.10 Adapter,6,15for wave

41、guide to coaxial interconnec-tion.6.8.11 The assembly of this equipment is shown schemati-cally in Fig. 16.9The sole source of supply of the Hewlett Packard (HP) X532B meter known tothe committee at this time is Hewlett Packard. If you are aware of alternativesuppliers, please provide this informati

42、on to ASTM International Headquarters.Your comments will receive careful consideration at a meeting of the responsibletechnical committee,1which you may attend.10The sole source of supply of the Hewlett Packard 423B Neg. detector knownto the committee at this time is Hewlett Packard. If you are awar

43、e of alternativesuppliers, please provide this information to ASTM International Headquarters.Your comments will receive careful consideration at a meeting of the responsibletechnical committee,1which you may attend.11The sole source of supply of the Hewlett Packard 11523A option .001 resistorknown

44、to the committee at this time is Hewlett Packard. If you are aware ofalternative suppliers, please provide this information to ASTM InternationalHeadquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee,1which you may attend.12The sole source o

45、f supply of the Hewlett Packard 415E meter known to thecommittee at this time is Hewlett Packard. If you are aware of alternative suppliers,please provide this information to ASTM International Headquarters. Your com-ments will receive careful consideration at a meeting of the responsible technicalc

46、ommittee,1which you may attend.13The sole source of supply of the Hewlett Packard 779D coupler known to thecommittee at this time is Hewlett Packard. If you are aware of alternative suppliers,please provide this information to ASTM International Headquarters. Your com-ments will receive careful cons

47、ideration at a meeting of the responsible technicalcommittee,1which you may attend.14The sole source of supply of the Hewlett Packard attenuator 8491B known tothe committee at this time is Hewlett Packard. If you are aware of alternativesuppliers, please provide this information to ASTM Internationa

48、l Headquarters.Your comments will receive careful consideration at a meeting of the responsibletechnical committee,1which you may attend.15The sole source of supply of the Hewlett Packard adapter X281Aknown to thecommittee at this time is Hewlett Packard. If you are aware of alternative suppliers,pl

49、ease provide this information to ASTM International Headquarters. Your com-ments will receive careful consideration at a meeting of the responsible technicalcommittee,1which you may attend.FIG. 13 Aluminum Clamping Plate Provided with Tapped Holesfor the Pressure Block and a Thermocouple WellFIG. 14 Aluminum Block for Temperature Control and Transfer ofPressure to the Clamp Plates, Fitted with Tapped Holes for Slide,Embedded Steel Ball, and Tapped for Tubing Fittings forCirculating FluidFIG. 15 Slider and Block for Connecting Pressure Block andBase Plate with