ANSI IEEE 400.2-2013 Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF) (less than 1 Hz)《使用超低频(VLF)(低于1 Hz)的屏蔽电力电缆系统的现场试验指南》.pdf

《ANSI IEEE 400.2-2013 Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF) (less than 1 Hz)《使用超低频(VLF)(低于1 Hz)的屏蔽电力电缆系统的现场试验指南》.pdf》由会员分享，可在线阅读，更多相关《ANSI IEEE 400.2-2013 Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF) (less than 1 Hz)《使用超低频(VLF)(低于1 Hz)的屏蔽电力电缆系统的现场试验指南》.pdf（60页珍藏版）》请在麦多课文档分享上搜索。

1、g3g3g3IEEE Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF) (less than 1 Hz) Sponsored by the Insulated Conductors Committeeg3IEEE 3 Park Avenue New York, NY 10016-5997 USA 31 May 2013 IEEE Power and Energy SocietyIEEE Std 400.2-2013IEEE Std 400.2-2013 IEEE Guid

2、e for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF) (less than 1 Hz) Sponsor Insulated Conductors Committee of the IEEE Power and Energy Society Approved 6 March 2013 IEEE-SA Standards Board Recognized as an American National StandardAbstract: Very low frequency (VLF)

3、withstand and other diagnostic tests and measurements that are performed using VLF energization in the field on shielded power cable systems are described in this guide. Whenever possible, cable systems are treated in a similar manner to individual cables. Tables are included as an aid to identifyin

4、g the effectiveness of the VLF ac voltage test for various cable system insulation problems. Keywords: cable fault locating, cable system testing, cable testing, condition assessment, dielectric spectroscopy, grounding, hipot testing, IEEE 400.2, partial discharge testing, proof testing, safety, tan

5、gent delta testing, very low frequency testing, VLF ac voltage testing The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 31 May 2013. Pri

6、nted in the United States of America. IEEE, National Electrical Safety Code, and the NESC are all registered trademarks in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance C

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18、ensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement

19、of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. viParticipants At the time this IEEE guide was completed, the PE/IC/F03D Working Group had the following membership: John Densley,

20、Chair Tim Hayden, Vice Chair Kal Abdolall Martin Baur Kent Brown Jacques Cote Frank De Vries Jean-Francois Drapeau Mark Fenger Craig Goodwin Steve Graham Ed Gulski Nigel Hampton John Hans Leeman Hong Fred Koch Ben Lanz Henning Oetjien Ralph Patterson Joshua Perkel Frank Petzold Brienna Reed-Harmel R

21、ichard Vencus Martin Von Herrmann Mark Walton Yingli Wen Walter Zenger Dawn Zhao The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. John Ainscough Saleman Alibhay Senthil Kumar Asok Kumar Thomas Barnes E

22、arle Bascom, III Martin Baur Michael Bayer Kenneth Bow Jeffrey Britton Kent Brown William Byrd Thomas Campbell Weijen Chen John Densley Frank Di Guglielmo Gary Donner Randall Dotson Gary Engmann Dan Evans Michael Faulkenberry David Gilmer Craig Goodwin Steve Graham Randall Groves Richard Harp Wolfga

23、ng Haverkamp Tim Hayden Jeffrey Helzer Lauri Hiivala Werner Hoelzl David Horvath Edward Jankowich Michael Jensen Farris Jibril A. Jones Gael Kennedy Yuri Khersonsky Joseph L. Koepfinger Richard Kolich Robert Konnik Jim Kulchisky Chung-Yiu Lam Benjamin Lanz William Larzelere Michael Lauxman Greg Luri

24、 Arturo Maldonado John Mcalhaney, Jr William McBride William McDermid John Merando Andrew Morris Jerry Murphy Arthur Neubauer Michael S. Newman Joe Nims Lorraine Padden Serge Pelissou Johannes Rickmann Michael Roberts Bartien Sayogo Gil Shultz Jerry Smith Michael Smalley Gregory Stano Gary Stoedter

25、David Tepen Peter Tirinzoni John Vergis Martin Von Herrmann Mark Walton Yingli Wen Kenneth White Ron Widup Jonathan Woodworth Jian Yu Dawn Zhao Tiebin Zhao Copyright 2013 IEEE. All rights reserved. viiAcknowledgements Working Group F03W is grateful to NEETRAC, which made available the tangent delta

26、data collected as part of its Cable Diagnostics Focus Initiative (CDFI) and also for allowing the use of the data analysis to establish the assessment criteria. The Working Group would also like to thank EPRI for allowing the use of its data to expand the data base thus allowing greater precision in

27、 the data. When the IEEE-SA Standards Board approved this guide on 6 March 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephe

28、n Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the foll

29、owing nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE Standards Senior Program Manager, Document Development Malia Zaman IEEE Standards Program Manager, Technical Program Development Copyright 2013 IEEE. All

30、rights reserved. viiiIntroduction This introduction is not part of IEEE Std 400.2-2013, IEEE Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF) (less than 1 Hz). A significant investment with respect to electric power systems is underground cables. A high degree o

31、f reliability and reasonable life expectancy of cable systems are necessary. In order to get the optimum performance, standards and guidelines have been developed which address the specific testing requirements for new and service-aged extruded and laminated dielectric cable insulations. This Guide

32、is one part of a series of guides that discuss known diagnostic techniques for performing electrical tests in the field on shielded power cable systems. An omnibus guide (IEEE Std 400) provides a general overview of all technique classes. It is intended that the technique-specific guides provide the

33、 definitive information on voltages, times and criteria. Ideally, field withstand testing of cable systems would be done using the same power frequency as would normally applied to the cable under operating conditions, but at higher test voltage. However, because of the inherent capacitance of long

34、runs of medium-/high-voltage concentric shielded cable, the excessive charging current is beyond the limits of normally available power sources and test equipment found in the field, except costly ac resonant test systems. High-voltage dc testing would eliminate the charging current issue associated

35、 with ac tests, but would not subject the cable system to the voltage stress distribution that it is exposed to under normal operating conditions. Furthermore there are significant negative issues affecting the integrity of aged cross linked polyethylene (XLPE) cable after it is exposed to high-volt

36、age dc tests and then placed back into service. There is also the unknown influence of elevated dc voltage on other extruded cables such as mineral-filled EPR. In addition, dc is not effective in detecting many forms of gross defects that may be present in a cable system that will otherwise be detec

37、ted by VLF or at operating frequency. When required to perform field testing on long lengths of medium-/high-voltage cable with an alternating current source, an alternative to applying power frequency is very low frequency (VLF, 0.01 to 1 Hz). The charging current at a very low frequency of 0.1 Hz

38、is only 1/500 or 1/600 of that at 50 Hz or 60 Hz respectively so that significantly smaller and more portable VLF power sources have the capability to test cable systems of relatively long lengths. This guide provides a definition of VLF, a description of the wave-shapes and their magnitudes and fre

39、quencies that can be applied as a source for overvoltage field testing, the issues with different wave shapes, the duration of testing and what diagnostic information can be learned when these VLF voltages are applied. Copyright 2013 IEEE. All rights reserved. ixContents 1. Overview 1 1.1 Scope . 2

40、1.2 Purpose 2 2. Normative references 2 3. Definitions, acronyms, and abbreviations 3 3.1 Definitions . 3 3.2 Acronyms and abbreviations . 5 4. Safety 5 4.1 Safety practices 5 4.2 Grounding 6 5. Very low frequency (VLF) ac testing . 7 5.1 General VLF ac withstand voltage testing . 10 5.2 VLF ac with

41、stand voltage testing with cosine-rectangular/bipolar pulse waveform . 12 5.3 VLF ac withstand voltage testing with sinusoidal waveform 14 5.4 Tangent delta/differential tangent delta/tangent delta stability/leakage current/ harmonic loss current tests with VLF sinusoidal waveform . 15 5.5 Partial d

42、ischarge (PD) test with VLF sinusoidal waveform. 24 5.6 Dielectric spectroscopy with VLF sinusoidal waveform . 25 6. Conclusions 27 Annex A (informative) Bibliography . 29 Annex B (normative) Wave shapes of VLF ac voltage testing voltages 32 Annex C (informative) Typical defects in fluid-filled and

43、extruded cable systems . 33 Annex D (informative) Effect of initial increase in voltage (ramp up). 34 Annex E (informative) Figures of merit and range of available tangent delta and differential tangent delta (tip up) data 36 Annex F (informative) Comments on data interpretation and performance . 38

44、 Annex G (informative) Tan delta results of new cable systems . 40 Annex H (informative) Development of utility/application specific criteria 43 Annex I (informative) Tangent delta criteria used outside North America 48 Copyright 2013 IEEE. All rights reserved. 1IEEE Guide for Field Testing of Shiel

45、ded Power Cable Systems Using Very Low Frequency (VLF) (less than 1 Hz) IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents a

46、re responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and

47、 disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overv

48、iew This guide provides a description of the methods and practices to be used in the application of very low frequency (VLF) ac high-voltage excitation for field testing of shielded power cable systems (Bach B11and B2; Baur, Mohaupt, and Schlick B6; Gnerlich B11). VLF ac voltage testing is an altern

49、ative method of continuous ac voltage testing and is used for a broad range of accessory and cable types (Kobayashi, et al. B26, Steennis, Boone, and Montfoort B32) as well as testing of rotating machinery, see IEEE Std 433. It provides a method of evaluation, and helps to fill the need for more complete information on the cable system condition while minimizing or eliminating some potential adverse charging effects of the direct voltage high-potential test method (commonly known as the dc hi-pot test) (Srinivas and Bernstein B31; Eager, et al. B8; H