ASTM B497 - 00(2012) Standard Guide for Measuring Voltage Drop on Closed Arcing Contacts (Withdrawn 2017).pdf
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1、Designation: B497 00 (Reapproved 2012)Standard Guide forMeasuring Voltage Drop on Closed Arcing Contacts1This standard is issued under the fixed designation B497; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last rev
2、ision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This guide describes recommended procedures to accu-rately measure voltage drop across current carrying contactsand the parame
3、ters to be documented in order to effectivelyrecord the results. Such contacts normally carry current greaterthan 1 amp. The applicability of these procedures to contactscarrying smaller currents should be evaluated prior to applica-tion to such devices. Contacts carrying small current may alsobe ev
4、aluated using Test Method B539 to measure contactresistance.1.2 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to become familiarwith all hazards including those identified in the appropriateM
5、aterial Safety Data Sheet (MSDS) for this product/materialas provided by the manufacturer, to establish appropriatesafety and health practices, and determine the applicability ofregulatory limitations prior to use. For specific precautionarystatements, see Section 6.2. Referenced Documents2.1 ASTM S
6、tandards:2B539 Test Methods for Measuring Resistance of ElectricalConnections (Static Contacts)B542 Terminology Relating to Electrical Contacts and TheirUse3. Terminology3.1 Terms shall be defined in accordance with TerminologyB542.4. Instrument Selection4.1 Generally, a low-impedance instrument wil
7、l give greateraccuracy. Since, these instruments are subject to seriousdamage by over-voltage, such as may occur when contacts areaccidentally opened, due care should be taken in a properinstrument range selection. Many of the high-impedancemeters, such as some electronic voltmeters, are not damaged
8、 byovervoltage and when used with the precautions pointed out inthis recommended practice can be quite accurate. Instrumentsmay also be protected by using the voltage-limiting circuit atthe instrument input. Two types of meters are generally usedand can be classified as self-contained voltmeters, or
9、 voltme-ters that require an external power source.5. Significance and Use5.1 This guide covers the factors to be controlled, precau-tions and documentation necessary to measure and report thevoltage drop across closed current-carrying contacts. Thevoltage drop is an indication of the efficiency of
10、the contactinterfaces in carrying a specified current. This efficiency can beadversely effected by any insulating areas within the contactinterface. Circuits which involve substantial current and lowindependence can be influenced by this contact property.6. Instrumentation Precautions6.1 If a self-c
11、ontained instrument is used, the followingprecautions should be observed:6.1.1 The voltmeter leads should be connected as shown inFig. 1 as close to the test contacts as possible.6.1.2 The leads should be as short as possible, or calibratedwith the meter, and shielded to reduce the effect of straypi
12、ck-up voltages.6.1.3 The voltmeter input impedance should be 1000 orless. This will load the circuit sufficiently to reduce the effectsof stray-voltage pickup in the instrument leads. The inputimpedance of high-impedance meter can be reduced by placinga 1000-resistor, B, across its input terminals a
13、s shown in Fig.1.6.1.4 Before measurements are made, the voltmeter leadsshould be shorted together at point C. With the voltmeter leadsshorted in this position, the test current should be caused toflow in the circuit. If the voltmeter deflects, it may be causedby induction from the load circuit to t
14、he internal components ofthe meter. This may be minimized by orienting the meter, orrelocating the meter (that is, moving it away from the circuit)until minimum meter deflection is observed. If necessary, placeconductive shielding between the meter and the circuit.1This guide is under the jurisdicti
15、on of ASTM Committee B02 on NonferrousMetals and Alloys and is the direct responsibility of Subcommittee B02.11 onElectrical Contact Test Methods.Current edition approved May 1, 2012. Published May 2012. Originallyapproved in 1969. Last previous edition approved in 2006 as B497 00 (2006).DOI: 10.152
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