IEEE C57 12 60 CORR 1-2013 en Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers Including Open-Wound .pdf

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1、 IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-Wound, Solid-Cast, and Resin- Encapsulated Transformers Corrigendum 1 Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEE

2、E Power and Energy Society IEEE Std C57.12.60-2009/Cor 1-2013 (Corrigendum to IEEE Std C57.12.60-2009) IEEE Std C57.12.60-2009/Cor 1-2013 (Corrigendum to IEEE Std C57.12.60-2009) IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformer

3、s, Including Open-Wound, Solid-Cast, and Resin- Encapsulated Transformers Corrigendum 1 Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 14 June 2013 IEEE-SA Standards Board Abstract: This corrigendum clarifies temperature control for aging experiments in 4.5.1 that was a

4、 result of the combination of the two previous test standards. This corrigendum selects the method from the two which should have been used in the combined test standard represented by the 2009 version. This document also makes one minor editorial change in 4.4. Keywords: IEEE C57.12.60, insulation

5、systems, model transformer coils, open-wound transformers, resin-encapsulated transformers, solid-cast transformers, thermal evaluation The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronic

6、s Engineers, Inc. All rights reserved. Published 14 June 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyri

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14、 to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of a

15、ny patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate w

16、hether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Copyright 2013 IEEE. All rig

17、hts reserved. v Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determinin

18、g whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk

19、 of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. vi Participants At the time this IEEE standard was completed, the Dry-Type Tranformers-Thermal Evaluation for Soli

20、d Cast and Resin Encapsulated Insulation Working Group had the following membership: Roger Wicks, Chair Carl Bush Dale Corel Derek Foster Geoffrey Gill Mark Gromlovits Michael Haas Charles Johnson Timothy Lewis Richard Marek Walter Morehart Martin Navarro Dhiru Patel David StankesThe following membe

21、rs of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. R. Casey Ballard Wallace Binder Thomas Blackburn William Bloethe Chris Brooks Carl Bush Paul Cardinal Stephen Conrad Jorge Fernandez Daher Glenn Davis Gary Donner Randa

22、ll Dotson Joseph Foldi Derek Foster Robert Ganser Frank Gerleve Jalal Gohari Randall Groves Bal Gupta Gary Heuston Timothy Holdway Jill Holmes Philip Hopkinson Mike Iman Charles Johnson Lars Juhlin Laszlo Kadar Sheldon Kennedy Yuri Khersonsky Thomas Koshy Jim Kulchisky Saumen Kundu John Lackey Chung

23、-Yiu Lam Aleksandr Levin Richard Marek J. Dennis Marlow Omar Mazzoni Tom Melle Daniel Mulkey Jerry Murphy Martin Navarro Michael S. Newman Raymond Nicholas Lorraine Padden Bansi Patel Wesley Patterson Brian Penny Alvaro Portillo Lewis Powell Paulette Payne Powell Tom Prevost Iulian Profir Moises Ram

24、os Daniel Leland Ransom Michael Roberts John Rossetti Thomas Rozek Bartien Sayogo James Smith Jerry Smith David Stankes Gary Stoedter John Sullivan John Vergis Yingli Wen Kenneth White Roger Wicks Jian Yu Matthew Zeedyk Copyright 2013 IEEE. All rights reserved. vii When the IEEE-SA Standards Board a

25、pproved this standard on 14 June 2013, it had the following membership: John Kulick, Chair David J. Law, Vice-chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Phillippe Faure Alexander Gel

26、man Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Peterson Gary Robinson Jon Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board l

27、iaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program Development Copyright 2013 IEEE. All rights reserved. viii Introduction This introduc

28、tion is not part of IEEE Std C57.12.60-2009/Cor 1-2013, IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-Wound, Solid-Cast, and Resin-Encapsulated TransformersCorrigendum 1. This corrigendum clarifies temperatu

29、re control for aging experiments that was a result of the combination of the two previous test standards. This corrigendum selects the method from the two which should have been used in the combined test standard represented by IEEE Std C57.12.60-2009. This corrigendum also made one editorial change

30、. Copyright 2013 IEEE. All rights reserved. ix Contents 4. Test procedures2 4.4 Test cycles2 4.5 Temperature aging2 Copyright 2013 IEEE. All rights reserved. 1 IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-W

31、ound, Solid-Cast, and Resin- Encapsulated Transformers Corrigendum 1 IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are

32、responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and di

33、sclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. NOTEThe edi

34、ting instructions contained in this corrigendum define how to merge the material contained therein into the existing base standard and its amendments to form the comprehensive standard. The editing instructions are shown in bold italic. Four editing instructions are used: change, delete, insert, and

35、 replace. Change is used to make corrections in existing text or tables. The editing instruction specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add new material). Delete removes existing material. Insert add

36、s new material without disturbing the existing material. Insertions may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is used to make changes in figures or equations by removing the existing figure or equation and replacing it with a new one. Edit

37、ing instructions, change markings, and this NOTE will not be carried over into future editions because the changes will be incorporated into the base standard.11Notes in text, tables, and figures of a standard are given for information only and do not contain requirements needed to implement this st

38、andard. IEEE Std C57.12.60-2009/Cor 1-2013 IEEE Standard Test Procedure for Thermal Evaluation of Insulation Systems for Dry-Type Power and Distribution Transformers, Including Open-Wound, Solid-Cast, and Resin-Encapsulated Transformers Copyright 2013 IEEE. All rights reserved. 2 4. Test procedures

39、4.4 Test cycles Change the first paragraph as shown below: The test procedure shall consist of subjecting the test samples to repeated test cycles following an initial screening test (see Clause 4.3). Each test cycle shall consist of the following parts and shall be performed in the following order:

40、 4.5 Temperature aging Change the fourth paragraph of 4.5.1 as shown below: 4.5.1 Aging by circulating electric current The temperatures in all samples shall be monitored by one or more thermometers or thermocouples located on each sample. The relative position of the thermometers or thermocouples s

41、hall be the same for all samples, including the control sample. The monitored temperatures on individual test and control samples shall have a degree of uniformity of 2 C at temperatures under 300C and 3 C for temperatures over 300 C, for the same monitored locations. The monitored temperatures on individual test samples shall not be more than 2 C below the control sample at temperatures under 300 C and not more than 3 C below the control sample for temperatures equal to or above 300 C for the same corresponding monitored locations.