IEEE 1149 6-2015 en Boundary-Scan Testing of Advanced Digital Networks (IEEE Computer Society)《高级数字网络的边界扫描测试(IEEE计算机协会)》.pdf

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1、 IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks Sponsored by the Test Technology Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Computer Society IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003) IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-20

2、03) IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 5 December 2015 IEEE-SA Standards Board iiAbstract: IEEE Std 1149.1 is augmented by this standard to improve the ability for testing differential

3、 and/or ac-coupled interconnections between integrated circuits on circuit boards and systems. Keywords: ac-coupled signaling, boundary scan, circuit boards, differential signaling, IEEE 1149.6, integrated circuits, interconnect test, printed circuit boards, test The Institute of Electrical and Elec

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33、ormation may be obtained from the IEEE Standards Association. v Participants At the time this IEEE standard was completed, the Advanced I/O Working Group Working Group had the following membership: William Eklow, Chair Carl Barnhart, Vice Chair Kenneth P. Parker, Editor John Braden William Bruce Chr

34、istopher J. Clark Heiko Ehrenberg Peter Elias Josh Ferry Hongshin Jun Siva Kumar Vijaya Kumar Roland Latvala Phillippe Lebourg Adam W. Ley Skip Meyers Francisco Russi Craig Stephan Stephen Sunter Anthony Suto Brian Turmelle The following members of the individual balloting committee voted on this st

35、andard. Balloters may have voted for approval, disapproval, or abstention. Saman Adham Bailarico Balangue Jr. Carl Barnhart John Braden Susan Burgess Juan Carreon Keith Chow Christopher J. Clark Sourav Dutta Heiko Ehrenberg Peter Eijnden William Eklow Josh Ferry James Grealish Randall Groves Peter H

36、arrod Werner Hoelzl Noriyuki Ikeuchi James Langlois Roland Latvala Philippe Lebourg Adam W. Ley Jeffrey Moore Michael Newman Nick S.A. Nikjoo Kenneth Parker Ulrich Pohl Mike Ricchetti Francisco Russi Kapil Sood Thomas Starai Walter Struppler Stephen Sunter Anthony Suto David Thompson Oren YuenWhen t

37、he IEEE-SA Standards Board approved this standard on 5 December 2015, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffi

38、th Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Philip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus vi Copyright 2016 IEEE. All

39、rights reserved. Introduction This introduction is not part of IEEE Std 1149.6-2015, IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks. History of the development of this standard The development of this standard was started on 21 May 2001 by an ad hoc industry Working Group calle

40、d by Agilent Technologies1and Cisco Systems. This group formulated this standard with the intention of handing it over to the IEEE for formal standardization when the underlying technology became understood. The group adopted as its mission: To define, document, and promote a means for designing int

41、egrated circuits (ICs) that support robust boundary-scan testing of boards where signal pathways make use of differential signaling and/or ac-coupled technologies. This technology utilizes and is compatible with the existing IEEE Std 1149.12. The goal is to upgrade the capabilities of IEEE Std 1149.

42、1 to maintain the rapid and accurate detection and diagnosis of interconnection defects in boards and systems despite the fault-masking effects of differential signaling and the dc blocking effects of ac-coupled signaling. The group first referred to itself as the “AC EXTEST” Working Group, but has

43、since expanded its charter to consider topics now called “Advanced I/O.” Changes introduced by this revision A summary of the changes includes the following: Deletion of Annex E content Changes driven by the 2013 update to IEEE Std 1149.1 Added new level-detection behavior to the test receiver for a

44、c-coupled channels Documentation of driver and test receiver analog parameters, including documenting programmability of those parameters Programmability of coupling capacitor shunts Documentation of non-compliance of certain pins to EXTEST_PULSE performance Addition of Procedure Description Languag

45、e (PDL) routines for documenting the procedures to access programmable analog parameters IP Package support in Boundary-Scan Description Language (BSDL) New “AC” boundary register cell designs This revision affirms what has been required from the previous version, and products that conform to the pr

46、evious version are still compliant with this revision. There is one deletion: Annex E (informative) proposed an “Initialize” instruction. This topic has since been subsumed into IEEE Std 1149.1-2013. Many of the changes found in this revision are in response to the major revision of the underlying I

47、EEE 1149.1 standard that was released in 2013. This standard introduced new concepts, such as segmented data registers, the initialization data register, and register descriptions. These concepts, once adopted in new ICs, 1Now called Keysight Technologies. 2Information on references can be found in

48、Clause 2. vii Copyright 2016 IEEE. All rights reserved. will materially affect the design, and subsequent description in BSDL, for those devices that are to conform to this standard. There are also changes that come from industry commentary and usage practices developed over the past decade. A known

49、 problem exists in the 2003 version of this standard for level-sensitive behavior when using the EXTEST instruction defined in IEEE Std 1149.1. Simply, in some cases it is impossible to ensure compatible drive and receive voltage levels. When a channel is guaranteed to be ac-coupled, and the only use for the EXTEST instruction is to detect a shorted capacitor, there is a new behavior defined that essentially performs a simple but robust continuity check. See option 2) of rule a) in 6.2.2.1. A significant addition provided by this revision is the ability to pro